Adam I Nadel, 402537 W Meredith Dr, Vienna, VA 22181

2007026, Nov 15, 2007

May 15, 2006

11/433939

Adam Nadel - Palm Bay FL, US
Garrett Quillia - White River Junction VT, US

A43B 5/04

036050500

Disclosed is an electro-mechanical apparatus for snugging a boot, especially a snow ski boot, around the calf of the user. The apparatus is essentially comprised of a reversible electric motor, a jackscrew, a switch, two brackets, a strap, and a power supply. The invention enables the user to achieve a desired snug fit by first placing a foot of the user into the boot, then operating the electric motor to turn the jackscrew, bringing the two brackets together and thereby tightening the strap around the boot to reach the desired fit. Once the desired snug fit is achieved, the electric motor is switched off, the user closes pre-existing latches on the boot to lock the boot parts into place, and the user removes the apparatus from around the boot by unbuckling a quick release buckle provided for this purpose. The apparatus may then be stored for later use. The reversible feature of the electric motor enables the operator to reverse the direction of travel of the jackscrew and thereby widen the gap between the brackets so that the apparatus is ready to be used again. Also disclosed is a method of tightening the parts of a boot onto the calf of a user utilizing a strap surrounding the parts of the boot and an electric motor to tighten the strap to reach the desired snug fit. Once the desired fit is achieved, the user removes the apparatus by releasing a quick release buckle.

2012031, Dec 20, 2012

Jun 14, 2011

13/159539

Adam Ian Nadel - Woodbridge VA, US
Adam Scott Ehrmantraut - Manassas Park VA, US

AURORA FLIGHT SCIENCES CORPORATION - Manassas VA

G01R 27/26

324679

The present disclosure endeavors to provide an SHM system and method using a conductive material (e.g., CNT) to measure changes in a layered structure. Change in capacitance of a layered structure may be measured over time thereby indicating a change in the structural integrity of the material. The SHM system may be embedded with, or within, the layered structure such that the system is effectively part of the material. Alternatively, it may be external to the layered structure such that the system is a separate device used to measure the capacitance. The SHM system may also localize any changes in a layered structure by using, for example, strips or panels of conductive material on opposite sides of the layered structure being measured. Damage within overlapping portions of the conductive material provides localization capability where varying the size of the strips or panels may be use to vary the sensitivity and resolution of both the locations and size of the defect.