Inventors:
Reinhold Ludwig - Worcester MA
John A. McNeill - Stow MA
Jennifer A. Stander - Boylston MA
Assignee:
Worcester Polytechnic Institute - Worcester MA
International Classification:
G01R 2700
Abstract:
An innovative multi-dimensional, low frequency, impedance measurement probe array, measurement system, and method are disclosed for detecting flaws in conductive articles. The device and method provide for contacting a conductive article with an multi-probe array of current and voltage probes, injecting current sequentially through a plurality of current probe pairs and measuring absolute or relative voltages with a plurality of voltage probes and voltage probe pairs across the surface of an article for each current flow condition. The device and method further provide for constructing a voltage profile across the surface of an article where disruptions in the voltage profile enable detection of the presence, location and orientation of flaws for flaw sizes as low as 20 um. The innovative probe array and method provide for rapidly detecting cracks, inclusions, defects and other flaws in conductive articles and can be adapted and deployed as either a two-dimensional, planar array or three-dimensional shaped array for a variety of sample configurations and surfaces. By utilizing a plurality of current and voltage probes in an array format, the device and method overcomes existing limitations of conventional linear probes and traditional methods by enabling flaw detection over larger areas in a single probe placement while achieving a high degree of sensitivity and precision in determining flaw location and orientation.
