Inventors:
Steven Altschuler - Redmond WA
David V. Ingerman - Princeton NJ
Lani Wu - Redmond WA
Lei Zhao - Bellevue WA
Assignee:
Microsoft Corporation - Redmond WA
International Classification:
G06F 1700
US Classification:
706 55, 706 11, 706 20, 706 21
Abstract:
A pattern lattice data space as a framework for analyzing data, in which both schema-based and statistical analysis are accommodated, is defined. Ways to manage the size of the lattice structures in the pattern lattice data space are described. Utilities to classify or cluster, search (find similar data), or relate data using lattice fragments in the pattern lattice data space are also described. Superpattern cone or lattice generation function, which may be used by the classification and clustering functions, is also described. In addition, a subpattern cone or lattice generation process, which may be used by the search (find similar data) and data relating functions, is also described. Finally, a function to label, in readily understandable âpidginâ, categories which classify information, is also described.