Aaron Couture resumes & CV records
Resumes
Aaron Couture
Skills:
Couture
Aaron Couture
Skills:
Couture
Aaron J Couture, 46Boston, MA
Aaron Couture Phones & Addresses
Allston, MA
Waltham, MA
Everett, MA
312 Wall St, Kalamazoo, MI 49001
Mentions for Aaron J Couture
Publications & IP owners
Us Patents
Spectral Discrimination Using Wavelength-Shifting Fiber-Coupled Scintillation Detectors
US Patent:
2019038, Dec 19, 2019
Filed:
Jan 8, 2019
Appl. No.:
16/242163
Inventors:
- Billerica MA, US
Joseph Callerame - Lexington MA, US
Dan-Cristian Dinca - Chelmsford MA, US
Rajen Sud - Burlington MA, US
Lee Grodzins - Lexington MA, US
Martin Rommel - Lexington MA, US
Peter Rothschild - Newton MA, US
Jeffrey Schubert - Somerville MA, US
Aaron Couture - Reading MA, US
Jeffrey M. Denker - Woburn MA, US
Jonathan Edward Everett - Lexington MA, US
Joseph Callerame - Lexington MA, US
Dan-Cristian Dinca - Chelmsford MA, US
Rajen Sud - Burlington MA, US
Lee Grodzins - Lexington MA, US
Martin Rommel - Lexington MA, US
Peter Rothschild - Newton MA, US
Jeffrey Schubert - Somerville MA, US
Aaron Couture - Reading MA, US
Jeffrey M. Denker - Woburn MA, US
Jonathan Edward Everett - Lexington MA, US
International Classification:
G01T 1/20
H01L 27/146
H01L 27/146
Abstract:
Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.
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