David Heidel resumes & CV records
Resumes
David Heidel
David Heidel
David Heidel
Location:
United States
David Jonathan Heidel, 72Sandy, OR
David Heidel Phones & Addresses
Sandy, OR
Gresham, OR
Battle Ground, WA
Portland, OR
Hillsboro, OR
Wilsonville, OR
Gresham, OR
Greenville, SC
Dundee, OR
Mentions for David Jonathan Heidel
Publications & IP owners
Us Patents
System And Method For Accelerated Detection Of Transient Particle Induced Soft Error Rates In Integrated Circuits
US Patent:
7084660, Aug 1, 2006
Filed:
Apr 4, 2005
Appl. No.:
11/098104
Inventors:
Jerry D. Ackaret - Beaverton OR, US
Richard B. Bhend - Rochester MN, US
David F. Heidel - Mahopac NY, US
Naoko Pia Sanda - Chappaqua NY, US
Scott B. Swaney - Catskill NY, US
Jane Jones, legal representative - Yorktown Heights NY, US
Richard B. Bhend - Rochester MN, US
David F. Heidel - Mahopac NY, US
Naoko Pia Sanda - Chappaqua NY, US
Scott B. Swaney - Catskill NY, US
Jane Jones, legal representative - Yorktown Heights NY, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01R 31/27
H01L 23/58
H01L 21/00
H01L 23/58
H01L 21/00
US Classification:
324765, 257 48, 438 17
Abstract:
A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.
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