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Emmanuel O Ayorinde, 7728939 Lake Park Dr, Farmington, MI 48331

Emmanuel Ayorinde Phones & Addresses

28939 Lake Park Dr, Farmington Hills, MI 48331    248-3243733    248-3243737   

Livonia, MI   

Southfield, MI   

33006 Akron St, Westland, MI 48186    734-3265843   

Detroit, MI   

28939 Lake Park Dr, Farmington Hills, MI 48331    248-7625351   

Work

Position: Professional/Technical

Education

Degree: Associate degree or higher

Mentions for Emmanuel O Ayorinde

Resumes & CV records

Resumes

Emmanuel Ayorinde Photo 21

College Professor

Location:
Farmington, MI
Work:

College Professor
Emmanuel Ayorinde Photo 22

Professor

Work:
Wsu
Professor
Emmanuel Ayorinde Photo 23

Emmanuel Ayorinde

Publications & IP owners

Us Patents

Method And Apparatus For Non-Destructive Measurement Of Elastic Properties Of Structural Materials

US Patent:
5533399, Jul 9, 1996
Filed:
Sep 13, 1994
Appl. No.:
8/305402
Inventors:
Ronald F. Gibson - Southfield MI
Emmanuel O. Ayorinde - Southfield MI
Assignee:
Wayne State University - Detroit MI
International Classification:
G01H 1300
US Classification:
73579
Abstract:
Method and apparatus for deriving four independent elastic constants (longitudinal and transverse Young's moduli, in-plane shear modulus and major Poisson's ratio) of composite materials from the modal resonance data of a freely-supported rectangular thin plate made from the material. The method includes the steps of: suspending a panel of the material from a rigid support by a plurality of filaments having a low support stiffness which has minimal effect on motion of the panel; providing a vibration sensor to detect a vibration response in the panel; imparting an impulse to the panel; generating a response signal proportionate to the response in the panel to the impulse imparted; generating an excitation signal in proportion to the impulse; communicating the signals to an analyzer for transforming the signals into a frequency domain; deriving resonance frequencies and associated mode shape indices of the panel; communicating the resonance frequencies and the mode shape indices to a computing device; and predicting and displaying the elastic constants using the computing device.

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