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Glenn A Clarke, 64113 Gillette St, Rochester, NY 14619

Glenn Clarke Phones & Addresses

113 Gillette St, Rochester, NY 14619   

Rohnert Park, CA   

51 Robert Quigley Dr, Scottsville, NY 14546   

31812 York St, Fraser, MI 48026   

Mentions for Glenn A Clarke

Career records & work history

License Records

Glenn J. Clarke

Licenses:
License #: 3429 - Expired
Issued Date: Feb 9, 1993
Expiration Date: Nov 30, 2010
Organization:
Firm Not Published

Glenn Clarke resumes & CV records

Resumes

Glenn Clarke Photo 45

Glenn Clarke

Glenn Clarke Photo 46

Glenn Clarke

Glenn Clarke Photo 47

Glenn Clarke

Work:
The Bedminster Group
Retired
Glenn Clarke Photo 48

Founder And President

Work:
Glc Financial
Founder and President
Glenn Clarke Photo 49

Glenn Clarke

Location:
United States
Glenn Clarke Photo 50

Glenn Clarke

Location:
United States

Publications & IP owners

Us Patents

Fabry-Perot Optical Switch

US Patent:
6490381, Dec 3, 2002
Filed:
Jun 1, 2000
Appl. No.:
09/585664
Inventors:
Robert W. Adair - Santa Rosa CA
Glenn A. Clarke - Rohnert Park CA
Bryant P. Hichwa - Santa Rosa CA
Christopher Iaconis - Santa Rosa CA
Douglas G. Jensen - San Rafael CA
Stephen C. Olson - Santa Rosa CA
James W. Seeser - Saint Louis MO
Basil L. Swaby - Santa Rosa CA
Assignee:
Optical Coating Laboratory, Inc. - Santa Rosa CA
International Classification:
G02B 642
US Classification:
385 16, 385 18, 385 22, 385 49
Abstract:
The absorption of a spacer material in a Fabry-Perot type structure is changed to achieve an optical switching function. In one embodiment, the spacer material is a semiconductor material and an electronic control signal changes the Fabry-Perot between a transmissive state and a reflective state. In the reflective state, the device operates as a switch can be modeled as a mirror on a substrate of quasi-infinite thickness. In a further embodiment, a wavelength-selective optical component is placed between the input of the switch and the Fabry-Perot structure to improve the spectral response of the switch.

Optical Filter And Fluorescence Spectroscopy System Incorporating The Same

US Patent:
6809859, Oct 26, 2004
Filed:
Nov 19, 2002
Appl. No.:
10/299208
Inventors:
Turan Erdogan - Spencerport NY
Ligang Wang - Rochester NY
Glenn Clarke - Scottsville NY
Assignee:
Semrock, Inc. - Rochester NY
International Classification:
F21V 904
US Classification:
359359, 359360, 359361, 359436
Abstract:
An optical filter including at least one substrate and first and second thin-film interference filters disposed directly on the substrate. The interference filters include a plurality of hard coating thin film layers of alternating high and low index of refraction. A fluorescence spectroscopy system and method of selecting a band of wavelengths from light in a fluorescence spectroscopy system are also provided.

Method Of Making Highly Discriminating Optical Edge Filters And Resulting Products

US Patent:
7068430, Jun 27, 2006
Filed:
May 6, 2004
Appl. No.:
10/840134
Inventors:
Glenn Clarke - Rochester NY, US
Turan Erdogan - Spencerport NY, US
Joseph T. Foss - Rochester NY, US
Ligang Wang - Rochester NY, US
Assignee:
Semrock, Inc. - Rochester NY
International Classification:
G02B 5/28
US Classification:
359589, 359587, 359588, 359580
Abstract:
Highly discriminating optical edge filters and methods of making the same are disclosed. The optical edge filters have an edge steepness greater than about 0. 8% as measured by dividing (a) the edge width from the 50% transmission wavelength to the optical density 6 (“OD6”) wavelength by (b) the 50% transmission wavelength. The optical filters also have an average transmission above about 95%. The methods for making such filters accurately determine when deposition of each layer of the filter should terminate. The methods include calculating theoretical transmission data for a layer of the filter and calculating an expected deposition duration for the layer. The methods also include measuring transmission through the layer during deposition for a period less than the expected deposition duration. When the measuring period elapses, a new deposition duration is calculated based upon the theoretical transmission data and the measured transmission data, thereby providing an accurate deposition duration for the layer.

Optical Filter And Fluorescence Spectroscopy System Incorporating The Same

US Patent:
7411679, Aug 12, 2008
Filed:
Sep 29, 2004
Appl. No.:
10/953483
Inventors:
Turan Erdogan - Spencerport NY, US
Ligang Wang - Rochester NY, US
Glenn Clarke - Rochester NY, US
Assignee:
Semrock, Inc. - Rochester NY
International Classification:
G01N 21/25
US Classification:
356417
Abstract:
An optical filter including at least one substrate and first and second thin-film interference filters disposed directly on the substrate. The interference filters include a plurality of hard coating thin film layers of alternating high and low index of refraction. A filter set capable of providing low image shift is also provided.

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