John A Boudry, 521109 Sunset Ridge Dr, West Bend, WI 53090

6404853, Jun 11, 2002

Nov 2, 2001

09/682961

Jibril Odogba - Waukesha WI
Kenneth Scott Kump - Waukesha WI
John Moore Boudry - Waukesha WI

GE Medical Systems Global Technology Company, LLC - Waukesha WI

H05G 164

378 988, 378207, 2502081

A method is provided to identify pixels in a digital x-ray detector that experience an amount of residual charge that is sufficient to cause an image artifact. A lag artifact threshold is obtained. The lag artifact threshold identifies an amount of residual charge that, when held by the pixels in the digital x-ray detector, will cause image artifacts. A pixel lag experienced by a pixel is determined. The pixel lag may be different for each pixel. Pixels that have a pixel lag exceeding the lag artifact threshold are identified and corrected.

6618604, Sep 9, 2003

Dec 28, 2000

09/752854

Scott William Petrick - Sussex WI
John Moore Boudry - Waukesha WI
Richard Gordon Cronce - New Berlin WI
Douglas I. Perry - Ottawa, CA

GE Medical Systems Global Technology Company, LLC. - Waukesha WI

A61B 5058

600407, 600425, 600473, 600476, 378 62, 382128, 2502081, 348308

A method and apparatus for correcting the offset induced by Field Effect Transistor (FET) photo-conductive effects in solid state x-ray detectors includes dedicating rows at the beginning and end of an x-ray detector scan. The dedicated rows may be used to measure the âsignalâ induced by the photo-conductivity of FET switches in solid state x-ray detectors. Since the signal induced by FET photo-conductivity decays over time, the measurements taken at the beginning and end of a detector scan may be used to predict by interpolation the amount of signal contributed by photo-conductive induced offset for each row of the detector scan on a column by column basis.

6919568, Jul 19, 2005

Apr 8, 2003

10/408853

Jibril Odogba - Wales WI, US
Ken Scott Kump - Waukesha WI, US
Ping Xue - Cottage Grove WI, US
Donald Fayette Langler - Brookfield WI, US
John C. French - Wauwatosa WI, US
John Moore Boudry - Waukesha WI, US

GE Medical Systems Global Technology Company LLC - Waukesha WI

G01T001/24
H05G001/64

25037009, 2503361, 25037001, 382130, 382131, 382132, 378 988

An apparatus for use with a detector system including a solid state flat panel detector and an image processor, the detector including a plurality of pixels, each pixel generating an initial intensity signal, the initial signals together defining an initial image, the processor storing an initial bad pixel map that includes a known bad pixel set, after signals are generated, the processor automatically using intensity signals corresponding to other than the bad pixel set to generate replacement intensity signals for each of the bad pixel set pixels thereby generating a corrected image, the apparatus for identifying additional bad pixels, the apparatus comprising a processor that, after the image data is collected, examines at least one of the initial image and the corrected image to identify a likely additional bad pixel set including pixels that have unexpected values and an interface for indicating the likely bad set to a system user.

8265227, Sep 11, 2012

Dec 23, 2009

12/646320

John Moore Boudry - Waukesha WI, US
Sergio Lemaitre - Whitefish Bay WI, US
Naveen Chandra - Kenosha WI, US

General Electric Company - Schenectady NY

H05G 1/34
H05G 1/50
H05G 1/08

378111, 378110, 378112, 378113

An apparatus and method for calibrating an x-ray tube include a computer programmed to acquire a starter voltage/current value corresponding to a width, a length, or a position of a target focal spot capable of being generated by the x-ray tube. The computer is programmed to generate an electron beam and to steer the electron beam based on the starter voltage/current value. The computer is also programmed to steer the electron beam based on a value adjusted from the starter voltage/current value. The computer is programmed to calculate a final voltage/current value that is configured to generate the width, length, or position of the target focal spot based on the starter voltage/current value and the adjusted starter voltage/current value.

2003019, Oct 9, 2003

Apr 8, 2003

10/409343

Scott Petrick - Sussex WI, US
John Boudry - Waukesha WI, US
Richard Cronce - New Berlin WI, US
Douglas Perry - Ottawa, CA

A61B005/05

600/425000

A method and apparatus for correcting the offset induced by Field Effect Transistor (FET) photo-conductive effects in solid state x-ray detectors includes dedicating rows at the beginning and end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by the photo-conductivity of FET switches in solid state x-ray detectors. Since the signal induced by FET photo-conductivity decays over time, the measurements taken at the beginning and end of a detector scan may be used to predict by interpolation the amount of signal contributed by photo-conductive induced offset for each row of the detector scan on a column by column basis.

6115451, Sep 5, 2000

Dec 22, 1998

9/218194

John Moore Boudry - Waukesha WI
Rowland Frederick Saunders - Hartland WI
Barry Fredric Belanger - Paris, FR

General Electric Company - Milwaukee WI

G01T 120

378 988

Described herein is a method of radiographic imaging providing low access time prior to the start of a user-requested X-ray exposure, while at the same time reducing or eliminating the imaging artifacts associated with short access times. The method includes the steps of exposing a radiographic detector for a time period t. sub. e ; reading the radiographic detector to obtain an exposure reading; reading the radiographic detector to obtain an offset reading, wherein the offset reading is obtained after a time period t. sub. w greater than t. sub. e ; and subtracting the offset reading from the exposure reading. Where the detector is subjected to readings lasting for periods t. sub. r prior to taking the exposure reading, detector readings lasting for t. sub. r are also taken during t. sub. w.

2023010, Apr 13, 2023

Oct 4, 2021

17/493005

- Wauwatosa WI, US
John Moore Boudry - Waukesha WI, US
Brandon Allan Smith - Waukesha WI, US

A61B 6/00
A61B 6/03
A61B 6/06

A method for verifying aperture positions of a pre-patient collimator of a computed tomography (CT) imaging system includes obtaining data collected by an X-ray measurement device having detector elements subjected to X-rays emitted from an X-ray source of the CT imaging system with the pre-patient collimator at an expected aperture position. The method also includes calculating a measured collimator aperture position for the pre-patient collimator based on the obtained data. The method further includes comparing the measured collimator aperture position to a system specification for the expected aperture position for the CT imaging system. The method even further includes generating an output based on the comparison of the measured collimator aperture position to the system specification.

2019032, Oct 24, 2019

Apr 19, 2019

16/388948

- Wauwatosa WI, US
John Boudry - Waukesha WI, US
Bradley Gabrielse - Waukesha WI, US
Ryan Lemminger - Milwaukee WI, US
Spencer Cutler - Waukesha WI, US

A61B 6/00
G01T 7/00
H01J 35/14
H05G 1/52
H05G 1/32

A system and method for calibrating an X-ray tube is provided in which the X-ray tube includes an electronic storage medium associated with the X-ray tube on which calibration information for the X-ray tube is stored. The calibration information includes operating parameters for the focusing elements of the X-ray tube for desired focal spots, tolerance limits for variations in the focal spots and a number of gradient coefficient values corresponding to certain modulation transfer functions (MTF) for the X-ray tube that the imaging system can employ in an iterative manner to correct the operating parameters of the focusing elements to achieve the desired focal spot. This automatic iterative process significantly reduces the time required for the calibration of the X-ray tube. The system and method also employs scan sequencing to minimize the heat generated enabling the scans to be completed in a shorter amount of time than prior calibration processes.