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Thomas Walter Hagler, 6042 Stagecoach Trl, San Antonito, NM 87047

Known as:
Thomas W Hagler Thomas Penny Hagler Thomas P Hagler Tom A Hagler
Related to:
Joseph Hagler 46

Thomas Hagler Phones & Addresses

42 Stagecoach Trl, Sandia Park, NM 87047   

Albuquerque, NM   

San Marcos, CA   

12982 Lodestar Dr, Grass Valley, CA 95949    530-2686738   

2712 Sunnywood Ave, Woodland Park, CO 80863    719-6869003   

Pleasanton, CA   

San Diego, CA   

Los Alamos, NM   

646 Edgewater Dr, San Marcos, CA 92078   

Work

Position: Clerical/White Collar

Education

Degree: High school graduate or higher
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Mentions for Thomas Walter Hagler

Career records & work history

Lawyers & Attorneys

Thomas Hagler Photo 1

Thomas Hagler - Lawyer

Specialties:
Accidents, Personal Injury, Labor and Employment Discrimination, Probate, Criminal Defense
ISLN:
906783878
Admitted:
1975
University:
Gonzaga University, B.A., 1969
Law School:
Southwestern University, J.D., 1975
Thomas Hagler Photo 2

Thomas Hagler - Lawyer

Specialties:
Environmental Law, Employment & Labor
ISLN:
906783861
Admitted:
1983
University:
University of California, M.L.S., 1979; University of Virginia, B.A., 1975
Law School:
Stanford University, J.D., 1983

License Records

Thomas K Hagler Sr

Licenses:
License #: 2701034757 - Expired
Category: Contractor
Issued Date: Jul 6, 1989
Expiration Date: Jul 31, 1999
Type: Class A

Thomas Hagler resumes & CV records

Resumes

Thomas Hagler Photo 27

R And D Manager, Multidomain Sensing And Effects

Location:
42 Stagecoach Trl, Sandia Park, NM 87047
Industry:
Defense & Space
Work:
Defense Contractor since Mar 2007
SA Program Manager / Chief Scientist 2020 Photometrics since Jan 2006
Professional Consultant Aspectrics, Inc. 2000 - 2006
Founder / Chairman / Chief Technology Officer Andros 1996 - 1999
Sr. Optical Physicist LLNL 1994 - 1996
Physicist LANL 1992 - 1994
Director’s Appointed Post Doctoral Fellow
Education:
University of California, Santa Barbara 1987 - 1992
Ph.D., Physics Oregon State University 1984 - 1987
BS, Physics
Skills:
Sensors, Systems Engineering, Simulations, Engineering Management, Optics, Dod, R&D, Program Management, Radar, Integration, Aerospace, Requirements Management, Physics, Proposal Writing, Security Clearance, Signal Processing, System Architecture, Defense, Embedded Systems, Analysis, Electronic Warfare, System Design, Optical Engineering, Interferometry, Ir, Spectroscopy, Photonics, C4Isr, Flight Test, Systems Design, Patent Drafting, Simulation, Algorithms, Laser, Space Systems, Earned Value Management, Configuration Management, Electro Optics, Government Contracting, Optical Design, Chemometrics, Imaging, Modeling, Survivability, Satellite, Sigint, Image Processing
Interests:
Bass Guitar
West
Fly Fishing
Lee
Photography
Mountain Biking
Pastorius
Thomas Hagler Photo 28

Thomas Hagler

Location:
United States

Publications & IP owners

Us Patents

Method And Apparatus For Spectrum Analysis And Encoder

US Patent:
6897952, May 24, 2005
Filed:
Jun 25, 1999
Appl. No.:
09/869371
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Advanced Photometrics, Inc. - Grass Valley CA
International Classification:
G01J003/04
G01J003/433
US Classification:
356310, 356323, 356326
Abstract:
A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin(mθ+pπ/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by corresponding filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

Method And Apparatus For Radiation Encoding And Analysis

US Patent:
6995840, Feb 7, 2006
Filed:
Mar 6, 2003
Appl. No.:
10/384374
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/06
US Classification:
356310
Abstract:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Method And Apparatus For Radiation Analysis And Encoder

US Patent:
6999165, Feb 14, 2006
Filed:
May 3, 2001
Appl. No.:
09/848614
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/04
G02B 26/02
US Classification:
356310, 359236
Abstract:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Method And Apparatus For Radiation Analysis And Encoder

US Patent:
7330253, Feb 12, 2008
Filed:
Nov 30, 2005
Appl. No.:
11/291179
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/04
G02B 26/02
US Classification:
356310, 356323, 356326, 359236, 359238
Abstract:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.

Spatial Radiation Modulator Pattern Generation

US Patent:
7420673, Sep 2, 2008
Filed:
Oct 26, 2007
Appl. No.:
11/925102
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/04
US Classification:
356310, 356330
Abstract:
A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.

Encoder Spectrograph And Modulator For Use Therewith

US Patent:
7423748, Sep 9, 2008
Filed:
Aug 3, 2007
Appl. No.:
11/833886
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/06
G01J 3/18
G01J 3/28
US Classification:
356310, 356328, 356330
Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.

Encoded Photometric Infrared Spectroscopy Analyzer With Orthogonal-Encoded Components

US Patent:
7423749, Sep 9, 2008
Filed:
Aug 3, 2007
Appl. No.:
11/833897
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/06
G01J 3/18
G01J 3/28
US Classification:
356310, 356328, 25033907
Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoded photometric infrared spectroscopy (“EPIR”) analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.

Calibration Training For Spectrometer

US Patent:
7426446, Sep 16, 2008
Filed:
Aug 3, 2007
Appl. No.:
11/833900
Inventors:
Thomas W. Hagler - Grass Valley CA, US
Assignee:
Aspectrics, Inc. - Pleasanton CA
International Classification:
G01J 3/00
G06F 17/40
US Classification:
702 85, 702 32, 702 30, 356303
Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.

Possible Relatives

Darrell W Hagler  Daryl Hagler  Diane L Hagler  Donald P Hagler  Donna J Hagler  Elizabeth C Hagler  Ellen C Hagler  Thomas D Johnson  Thomas Stamps  Thomas W Stancil 

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