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Ajay B Bhandari, 50Mc Donald, PA

Known as:
Ajay S Bhandari
Related to:
Madhu Bhandari Pratishtha Bhandari Mahesh Bhandari 63

Ajay Bhandari Phones & Addresses

Mc Donald, PA   

Pittsburgh, PA   

140 Bonaventure Blvd, Fort Lauderdale, FL 33326    952-8352913   

Weston, FL   

7360 Gallagher Dr #B237, Minneapolis, MN 55435    952-8352913   

34500 Fremont Blvd, Fremont, CA 94555   

34500 Fremont Blvd #127, Fremont, CA 94555   

Edina, MN   

Pleasant Hill, CA   

Lisle, IL   

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Medicine Doctors

Ajay Bhandari

Specialties:
Psychiatry, Psychiatry, Geriatric
Work:
Behavioral Health Services
11116 Medical Campus Rd STE 2989, Hagerstown, MD 21742
301-7667600 (phone) 301-7974976 (fax)
Education:
Medical School
Cebu Inst of Med, Cebu City, Cebu, Philippines
Graduated: 2003
Procedures:
Psychiatric Diagnosis or Evaluation
Conditions:
Anxiety Dissociative and Somatoform Disorders, Anxiety Phobic Disorders, Anorexia Nervosa, Attention Deficit Disorder (ADD), Autism, Bipolar Disorder, Bulimia Nervosa, Dementia, Depressive Disorders, Eating Disorders, Obsessive-Compulsive Disorder (OCD), Post Traumatic Stress Disorder (PTSD), Schizophrenia
Languages:
English
Description:
Dr. Bhandari graduated from the Cebu Inst of Med, Cebu City, Cebu, Philippines in 2003. He works in Hagerstown, MD and specializes in Psychiatry and Psychiatry, Geriatric. Dr. Bhandari is affiliated with Meritus Medical Center.

License Records

Ajay Bhandari

Licenses:
License #: 202159 - Expired
Category: MEDICINE
Issued Date: Jan 7, 2011
Expiration Date: Jun 30, 2012
Type: POSTGRADUATE PHYSICIAN TRAINEE

Ajay Bhandari

Licenses:
License #: 202159 - Expired
Category: MEDICINE
Issued Date: Jan 7, 2011
Expiration Date: Jun 30, 2012
Type: POSTGRADUATE PHYSICIAN TRAINEE

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Resumes

Ajay Bhandari Photo 26

Ajay Bhandari

Location:
United States

Publications & IP owners

Us Patents

Timing Variation Measurement System And Method

US Patent:
7184936, Feb 27, 2007
Filed:
Jul 12, 2004
Appl. No.:
10/890072
Inventors:
Ajay Bhandari - Cupertino CA, US
Assignee:
Cisco Technology, Inc. - San Jose CA
International Classification:
G01R 23/175
US Classification:
702189, 702 69, 702 78, 702 79, 702104, 327158, 327250, 324 7654
Abstract:
The present invention is a system and method that facilitates measurement of timing variations (e. g. , timing delays) in a semiconductor chip. The timing variations are measured and presented as digital values without extensive off chip measurement and analysis equipment. The timing variation measurements provides insight into timing variations (e. g. , delays) inside a semiconductor chip and across different chips, including timing impacts experienced in end use after manufacturing. A timing variation measurement system includes a variation test signal generator for passing a signal through a portion of a circuit and generating a variation test signal. A variation test signal tracking component digitally counts cycles in a variation test signal and a control component controls the counting (e. g. , the length of time the cycles are counted). Timing variation information, including a digital value associated with the variation test signal cycle count, can be communicated via pins and/or a processor interface.

Possible Relatives

Karen L Bhandari  Pooja R Bhandari  Ajay M Joseph  Ajay K More  Ajay Morgan  Ajay Nair  Ajay Singh  Ajay S Patel  Ajay K Das  Ajay K Arora 

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