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Ali J Mahmud, 493395 Heartleaf Rd, Cedar Rapids, IA 52411

Ali Mahmud Phones & Addresses

3395 Heartleaf Rd, Cedar Rapids, IA 52411   

2011 Buckingham Dr NW APT 7, Cedar Rapids, IA 52405   

Marion, IA   

Amherst, NY   

Milpitas, CA   

San Jose, CA   

Gainesville, FL   

Buffalo, NY   

Mentions for Ali J Mahmud

Ali Mahmud resumes & CV records

Resumes

Ali Mahmud Photo 29

Principal Design Engineer

Location:
Cedar Rapids, IA
Industry:
Semiconductors
Work:
Skyworks Solutions, Inc.
Principal Design Engineer
Skyworks Solutions, Inc. Mar 2014 - Feb 2019
Staff Design Engineer
Skyworks Solutions, Inc. Aug 2009 - Feb 2014
Senior Design Engineer
Micrel May 2006 - Jan 2009
Senior Design Engineer
Semquest May 2005 - May 2006
Full Custom Analog and Mixed Signal Design Engineer
Dept of Ece University of Colorado Aug 2002 - May 2005
Research Assistant
Education:
University of Colorado Colorado Springs 2002 - 2006
Doctorates, Doctor of Philosophy, Electrical Engineering
University of Florida 2000 - 2001
Master of Science, Masters, Electrical Engineering
Bangladesh University of Engineering and Technology 1994 - 1999
Bachelors, Bachelor of Science, Electrical Engineering
Skills:
Semiconductors, Engineering
Ali Mahmud Photo 30

Ali Mahmud

Ali Mahmud Photo 31

Center At .Ixd

Position:
center at .IXD
Location:
Bucharest, Romania
Industry:
Consumer Electronics
Work:
.IXD
center

Publications & IP owners

Us Patents

Overstress Indicator

US Patent:
2017018, Jun 29, 2017
Filed:
Dec 22, 2016
Appl. No.:
15/388273
Inventors:
- Woburn MA, US
Matthew Lee Banowetz - Marion IA, US
Leo John Wilz - Cedar Rapids IA, US
Ali J. Mahmud - Cedar Rapids IA, US
International Classification:
H04M 1/24
G01R 31/28
H03F 1/52
H03F 3/21
H03F 3/19
Abstract:
According to one aspect, embodiments of the invention provide an overstress indicator circuit comprising a sense circuit configured to monitor a parameter of a device and generate a sense signal corresponding to the parameter, a detection circuit coupled to the sense circuit and configured to receive the sense signal from the sense circuit and generate a detection signal at a first level in response to a determination that the sense signal is indicative of an overstress condition in the device, an interface circuit, and a memory circuit coupled to the detection circuit and the interface circuit and configured to store an overstress condition indication for access via the interface circuit in response to receiving the detection signal at the first level.

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