Ali I Sadigh, 636 Coromande, Irvine, CA 92614

2007020, Aug 30, 2007

Feb 27, 2006

11/307894

Timothy Lehner - Hopewell Junction NY, US
Richard Kimmel - Wappingers Falls NY, US
Ali Sadigh - Irvine CA, US
Emrah Acar - Montvale NJ, US
Ying Liu - Austin TX, US
Ivan Wemple - Shelburne VT, US

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY

G06F 17/50

716005000, 703016000

A method and a system for validating initial conditions (ICs) generally provided by a user when simulating a VLSI circuit are described. Inconsistent ICs sets are detected and replaced by consistent subsets thereof. The method selects the resistance and source values in a Norton or Thevenin circuit used to enforce the IC, and detects when specified ICs are inconsistent while preserving critical or fragile ICs when a two DC-pass approach is used. It further correlates the set of consistent ICs thus obtained with an equivalent circuit and simultaneously provides an input for future use. This allows a user to be notified and given a measure of how bad the inconsistencies are. Detecting inconsistencies is achieved either by measuring the holding current or by measuring the voltage drift if the two DC-pass approach is used.

2011022, Sep 15, 2011

Mar 10, 2010

12/721227

David J. Hathaway - Underhill Center VT, US
Vasant Rao - Fishkill NY, US
Ronald D. Rose - Essex Junction VT, US
Ali Sadigh - Irvine CA, US
Jeffrey P. Soreff - Poughkeepsie NY, US
David W. Winston - Asheville NC, US

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY

G06F 17/50

703 16, 703 19, 716108

A system, method and program product for modeling load effects of a load CCC (channel connected component) in a transistor network. A system is disclosed that includes an analysis system that determines allowable logical state and transition functions for nets in a load CCC for a transition or state of a driving CCC for which a load condition is being determined; a trace system that traverses paths in the load CCC from a set of input terminals; and an element replacement system that replaces circuit elements in the load CCC to create a modeled CCC, wherein a circuit element replacement is based on a type of circuit element encountered along a trace, and state and transition functions of nets connected to an encountered circuit element.

2013011, May 9, 2013

Nov 4, 2011

13/289589

Calvin J. BITTNER - Saint Albans VT, US
Peter FELDMANN - New York NY, US
Richard D. KIMMEL - Wappingers Falls NY, US
Tong LI - Austin TX, US
Ali SADIGH - Irvine CA, US
David W. WINSTON - Asheville NC, US

INTERNATIONAL BUSINESS MACHINES CORPORATION - Armonk NY

G06F 17/50
G06F 17/10

703 2, 703 13

An on-demand table model for semiconductor device evaluation is provided. A method of providing on-demand table models for semiconductor device evaluation, includes measuring one or more measurement values of an instance of a semiconductor device. The method further includes providing, by a processor, a table model of the instance for the semiconductor device evaluation upon receiving a request for the semiconductor device evaluation. The method further includes generating a table entry in the table model for the one or more measurement values, the table entry including one or more evaluation values of an evaluation function for the instance.