Robert M Conte, 573 Tasley Ct, Trenton, NJ 08691

6571187, May 27, 2003

Feb 9, 2000

09/500661

Robert A. Conte - Manalapan NJ

Avaya Technology Corp. - Basking Ridge NJ

G01D 1800

702 85, 324601

A calibration procedure for correcting two port frequency measurements. Calibration standards are initially connected to port one of a network analyzer and individually measured. This process is repeated with port two of the analyzer. A jumper which is used to bridge ports one and two is then connected to port one. At the far end of the jumper, three references are sequentially connected and the combination of the jumper and the terminations are measured. The raw data measured thus far is then processed to extract the two port electrical parameters of the jumper. The measured jumper is then bridged between ports one and two, and a series of measurements are made. Using the known electrical characteristics of the jumper, an intervening network is completely characterized and the measured S and actual S parameters of any device to be tested are relayed.

6647357, Nov 11, 2003

Feb 7, 2000

09/499208

Robert A. Conte - Manalapan NJ

Avaya Technology Corp. - Basking Ridge NJ

G06F 1900

702189, 702 85, 324638

A method for correcting reciprocity error in two port network measurements, in which an iterative algorithm is used to obtain an optimal symmetric matrix approximation to a measured 2Ã2 reciprocal network. The algorithm smooths measured data to obtain a low noise floor on measurements related to mode conversion in cables and connecting hardware. A geometric interpretation is used to approximate a measured data vector with the closest vector which satisfies the reciprocity constraint. An initial point in the constraint surface (reciprocity manifold) is located, and another point which is a better approximation of the measured data vector which satisfies the reciprocity constraint is generated. By repeating this process, the closest point in the manifold is quickly located. This closest point defines a reciprocal matrix which can be used to estimate the actual device under test (DUT) parameters.