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Bei Li, 53284 Kenyon Ave, Berkeley, CA 94708

Known as:
Li B Bei
Related to:
Yongyuan Li 37 Jing Jing Li 53

Bei Li Phones & Addresses

284 Kenyon Ave, Berkeley, CA 94708    510-8981005   

43 Rock Ln, Berkeley, CA 94708   

Kensington, CA   

Beaverton, OR   

Oakland, CA   

Eugene, OR   

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Resumes & CV records

Resumes

Bei Li Photo 41

Accountant At Sd Gold International Mining Co.,Ltd

Position:
Accountant at SD GOLD International Mining Co.,LTD
Location:
Jinan, Shandong, China
Industry:
Mining & Metals
Work:
SD GOLD International Mining Co.,LTD since May 2012
Accountant
Education:
University of Minnesota - Carlson School of Management 2010 - 2011
Master of Accounting, Accounting Xiamen University 2005 - 2009
Bachelor of Business Administration (BBA), Accounting
Bei Li Photo 42

Senior Global Transportation Manager - Business To Consumer

Location:
701 south Santa Fe St, Pauls Valley, OK 73075
Industry:
Internet
Work:
Google
Senior Global Transportation Manager - Business To Consumer Google Sep 2010 - Mar 2017
Logistics Program Manager at Google Ge Jul 2007 - Aug 2010
Logistics Operatiions Manager Ge Jul 2005 - Jun 2007
Six Sigma Black Belt - Supply Chain Ge Jul 2002 - Jun 2005
Transportation Manager Bystronic Group Jul 1998 - Jun 2000
Assistant Beijing Chief Representative
Education:
Haslam College of Business at the University of Tennessee 2000 - 2002
Master of Business Administration, Masters, Logistics, Marketing, Finance University of Tennessee, Knoxville 2000 - 2002
Master of Business Administration, Masters, Logistics, Marketing, Finance Nankai University 1990 - 1994
Bachelors, Economics, Commerce, International Business University of Tennessee
Master of Business Administration, Masters, Logistics, Marketing, Finance
Skills:
Supply Chain, Supply Chain Management, Operations Management, Logistics, Logistics Management, Cross Functional Team Leadership, Six Sigma, Supply Management, Transportation, Inventory Management, Supply Chain Optimization, Program Management
Certifications:
Six Sigma Black Belt Certification – Level Iii
Bei Li Photo 43

General Manager

Industry:
Pharmaceuticals
Work:
Easy Health
General Manager Gsk Jul 2014 - Mar 2015
Cns Sales Leader Gsk Nov 1, 2012 - Jul 2014
Bu General Manager Gsk Feb 2009 - Nov 2012
National Sales Director Novartis 1998 - 2008
Reginal Sales Manager
Education:
Peking University 2007 - 2008
Shaghai Railway Medical College 1986 - 1991
Bachelors, Dentistry
Skills:
Product Launch, Sales Effectiveness, Biotechnology, Pharmaceutical Industry, Oncology, Pharmaceutical Sales, Market Access, Medical Devices, Cardiology, Key Account Management, Market Analysis, Sales Management, Sales, Market Development
Languages:
English
Bei Li Photo 44

Bei Li

Location:
Berkeley, CA
Industry:
Fine Art
Work:
Self Employed
Fine Art Artist
Bei Li Photo 45

Bei Li

Bei Li Photo 46

Bei Li

Bei Li Photo 47

Financial Services Professional

Location:
San Francisco Bay Area
Industry:
Financial Services

Publications & IP owners

Us Patents

Measurement Of Blurring In Video Sequences

US Patent:
7099518, Aug 29, 2006
Filed:
Jul 18, 2002
Appl. No.:
10/198944
Inventors:
Bei Li - Beaverton OR, US
Wilfried M. Osberger - Portland OR, US
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
G06K 9/40
G06K 9/48
US Classification:
382255, 382199, 382266, 382263
Abstract:
A method for determine blurring in a test video sequence due to video processing includes detecting blocks within each frame of the test video sequence that have valid image edges. An edge point within each valid image edge block is selected and a series of points defining an edge profile in the block along a line normal to the valid image edge at each edge point is defined from an enhanced edge map in which video processing blockiness artifacts have been removed. From the edge profile a blurring value is estimated for each frame or group of frames within the test video sequence. Additionally a reference blurring value may be derived from a reference video sequence corresponding to the test video sequence, which reference blurring value may be generated at a source of the reference video sequence and transmitted with the test video sequence to a receiver or may be generated at the receiver. The reference blurring value is then compared with the blurring value from the test video sequence to produce a relative blurring value for the test video sequence.

Process To Remove Ni And Pt Residues For Niptsi Applications

US Patent:
8513117, Aug 20, 2013
Filed:
Nov 15, 2011
Appl. No.:
13/296444
Inventors:
Anh Duong - Fremont CA, US
Sean Barstow - San Jose CA, US
Clemens Fitz - Dresden, DE
John Foster - Mountain View CA, US
Olov Karlsson - San Jose CA, US
Bei Li - Fremont CA, US
James Mavrinac - San Jose CA, US
Assignee:
Intermolecular, Inc. - San Jose CA
International Classification:
H01L 21/44
US Classification:
438655, 438660, 438682, 438686
Abstract:
The invention discloses a method for cleaning residues from a semiconductor substrate during a nickel platinum silicidation process. Embodiments of the invention provide a multi-step cleaning process, comprising exposing the substrate to a nitric acid solution after a first anneal, followed by an aqua regia solution after a second anneal. The substrate can be optionally exposed to a hydrochloric acid solution afterward to completely remove any remaining platinum residues.

Enhancement Of Hematopoietic Stem Cell Survival

US Patent:
2005020, Sep 22, 2005
Filed:
Apr 15, 2003
Appl. No.:
10/511233
Inventors:
William Fleming - Portland OR, US
Bei Li - Lake Oswego OR, US
International Classification:
A61K048/00
C12N005/08
US Classification:
424093700, 435372000
Abstract:
A composition is disclosed that includes lin cells that are characterized as expressing CD31, CD34 and CD105, and not expressing c-kit, wherein the composition comprises fewer than 20% of lineage committed cells. Methods are disclosed for isolating CD31CD34CD45CD105c-kit cells. Methods for reconstituting hematopoiesis using compositions including CD31CD34CD105CD45kit cells are also disclosed.

High Productivity Combinatorial Workflow For Photoresist Strip Applications

US Patent:
2013013, May 23, 2013
Filed:
Nov 17, 2011
Appl. No.:
13/298524
Inventors:
Bei Li - Fremont CA, US
Sean Barstow - San Jose CA, US
Anh Duong - Fremont CA, US
Zhendong Hong - San Jose CA, US
Ashley Lacey - Dublin CA, US
Assignee:
Intermolecular, Inc. - San Jose CA
International Classification:
H01L 21/66
US Classification:
438 17, 257E21531
Abstract:
Electrical testing of metal oxide semiconductor (MOS) high-k capacitor structures is used to evaluate photoresist strip or cleaning chemicals using a combinatorial workflow. The electrical testing can be able to identify the damages on the high-k dielectrics, permitting a selection of photoresist strip chemicals to optimize the process conditions in the fabrication of semiconductor devices. The high productivity combinatorial technique can provide a compatibility evaluation of photoresist strip chemicals with high-k devices.

High Productivity Combinatorial Oxide Terracing And Pvd/Ald Metal Deposition Combined With Lithography For Gate Work Function Extraction

US Patent:
2013031, Nov 28, 2013
Filed:
May 24, 2012
Appl. No.:
13/480023
Inventors:
Amol Joshi - Sunnyvale CA, US
John Foster - Mountain View CA, US
Zhendong Hong - San Jose CA, US
Olov Karlsson - San Jose CA, US
Bei Li - Fremont CA, US
Usha Raghuram - Saratoga CA, US
Assignee:
Intermolecular, Inc. - San Jose CA
International Classification:
H01L 21/66
US Classification:
438 17, 257E21531
Abstract:
Metal gate high-k capacitor structures with lithography patterning are used to extract gate work function using a combinatorial workflow. Oxide terracing, together with high productivity combinatorial process flow for metal deposition can provide optimum high-k gate dielectric and metal gate solutions for high performance logic transistors. The high productivity combinatorial technique can provide an evaluation of effective work function for given high-k dielectric metal gate stacks for PMOS and NMOS transistors, which is critical in identifying and selecting the right materials.

Circular Transmission Line Methods Compatible With Combinatorial Processing Of Semiconductors

US Patent:
2014005, Feb 27, 2014
Filed:
Aug 24, 2012
Appl. No.:
13/594292
Inventors:
Amol Joshi - Sunnyvale CA, US
Charlene Chen - San Jose CA, US
John Foster - Mountain View CA, US
Zhendong Hong - San Jose CA, US
Olov Karlsson - San Jose CA, US
Bei Li - Fremont CA, US
Dipankar Pramanik - Saratoga CA, US
Usha Raghuram - Saratoga CA, US
Mark Victor Raymond - Schenectady NY, US
Jingang Su - Cupertino CA, US
Bin Yang - San Carlos CA, US
Assignee:
Globalfoundries, Inc. - Grand Cayman KY
Intermolecular, Inc. - San Jose CA
International Classification:
G01R 27/08
US Classification:
324720, 324691
Abstract:
Methods and structures are described for determining contact resistivities and Schottky barrier heights for conductors deposited on semiconductor wafers that can be combined with combinatorial processing, allowing thereby numerous processing conditions and materials to be tested concurrently. Methods for using multi-ring as well as single-ring CTLM structures to cancel parasitic resistance are also described, as well as structures and processes for inline monitoring of properties.

Detection Of Gaussian Noise In Video Signals

US Patent:
6433819, Aug 13, 2002
Filed:
Dec 7, 1999
Appl. No.:
09/457411
Inventors:
Bei Li - Beaverton OR
Bozidar Janko - Portland OR
Assignee:
Tektronix, Inc. - Beaverton OR
International Classification:
H04N 1700
US Classification:
348180, 348192
Abstract:
A method and apparatus for the detection of Gaussian noise in a video signal decomposes an image from the video signal to obtain best qualified blocks having a relatively uniform luminance. From the best qualified blocks an average standard deviation is calculated, and then smoothed by temporal filtering. The filtered average standard deviation is finally calibrated against a scale of corresponding input noise levels to obtain the Gaussian noise in the video signal.

Dynamically Assigning A Search Head To Process A Query

US Patent:
2022038, Dec 1, 2022
Filed:
Feb 25, 2022
Appl. No.:
17/652620
Inventors:
- San Francisco CA, US
Scott Calvert - El Cerrito CA, US
Alexander Douglas James - Sammamish WA, US
Bei Li - Redwood City CA, US
Ashish Mathew - Daly City CA, US
James Monschke - San Francisco CA, US
Sogol Moshtaghi - San Francisco CA, US
Christopher Madden Pride - Oakland CA, US
Xiaowei Wang - Santa Clara CA, US
International Classification:
G06F 16/2453
G06F 16/13
Abstract:
Systems and methods are disclosed for mapping search nodes to a search head in a data intake and query system based on a tenant identifier in order to execute a query received by the data intake and query system. The mapping may allow same or similar search nodes to be used to execute queries that are associated with a particular tenant identifier, in order to take advantage of caching and local data stored with those search nodes. In some cases, search nodes can be mapped based on the tenant identifier using a hashing algorithm, such as a consistent hashing algorithm.

Possible Relatives

Cynthia M Li  David Li  Dawei Li  Dayu W Li  De Li  Dean Li  Bei Lin  Bei Liu  Bei Xie 

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