Yu Miao, 476909 High Field Trl, Plano, TX 75023

2008009, Apr 17, 2008

Oct 13, 2006

11/580761

Yu Miao - Plano TX, US
Elizabeth Vigrass - Allen TX, US
Shawn C. Smith - Allen TX, US

Texas Instruments Incorporated - Dallas TX

G01R 31/28

714724

In a method and system for testing, a tester () is operable to communicate test signals () at a tester clock speed, and a device () to be tested is operable to communicate the test signals () at a device clock speed, the device clock speed being greater than the tester clock speed. A test module () is interposed between the tester () and the device () to enable data transfer between the tester () and the device () at their respective clock speeds. The test module () includes a memory module () capable of storing N samples of the test signals () at a selectable one of the tester clock speed and the device clock speed. The memory module () is operable to provide the N samples at a selectable one of the tester clock speed and the device clock speed.