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Bin Li, 39Newton Highlands, MA

Related to:
Chunhua Li 48 Mingsang Li 66 Lu L Li 60

Bin Li Phones & Addresses

Newton Highlands, MA   

Riverside, RI   

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Mentions for Bin Li

Career records & work history

Lawyers & Attorneys

Bin Li Photo 1

Bin Li - Lawyer

Office:
Law Offices of Bin Li & Associates
Specialties:
Business
ISLN:
921007447
Admitted:
2002
University:
Southwestern Univ SOL; Southwestern Univ SOL; Los Angeles CA; Los Angeles CA; Foreign School; Foreign School
Bin Li Photo 2

Bin Li - Lawyer

ISLN:
1001005050
Admitted:
2021

Resumes & CV records

Resumes

Bin Li Photo 42

Bin Li - Salt Lake City, UT

Work:
Monsanto Company - Chesterfield, MO May 2012 to Aug 2012
Summer Intern ILLINOIS STATISTICS OFFICE - Champaign, IL Aug 2011 to May 2012
Student Consultant Publication 2012 to 2012 MILLENNIUM PHARMACEUTICALS, Biostatistics Department - Cambridge, MA Jun 2011 to Aug 2011
Summer Intern MICROSOFT RESEARCH ASIA, Web Search and Data Mining Group Jul 2007 to Aug 2007
Summer Intern
Education:
University of Illinois at Urbana - Urbana-Champaign, IL May 2010
Master in Statistics University of Science and Technology of China Jul 2008
Bachelor in Statistics University of Illinois at Urbana - Urbana-Champaign, IL Apr 2000
Ph.D. in Statistics
Bin Li Photo 43

Bin Li

Work:
a division of GOLDEN APPLEXX CO Jun 2013 to 2000
Graphic Designer REMODEL2 SYMPOSIUM 2010 to 2000
FREELANCE WSDEN HOME TEXTILE - Changsha, CN Feb 2011 to Jan 2012
Commercial advertising design for marketing CHENGWEI ANIMATION - Changsha, CN 2010 to 2011
Graphic Designer / 3D Modeling Tutor
Education:
Claremont Graduate University 2014
M.F.A in Fine Art Qing Dao University 2009
B.A in Graphic design
Skills:
Adobe Suite (InDesign, Illustrator, Photoshop) Maya Cinema 4D After Effects Microsoft Office Suite

Publications & IP owners

Us Patents

Furo[3,2-]Pyrimidine Compounds

US Patent:
8551981, Oct 8, 2013
Filed:
Oct 7, 2011
Appl. No.:
13/268387
Inventors:
David J. Calderwood - Framingham MA, US
Noel S. Wilson - Kenosha WI, US
Philip Cox - Grayslake IL, US
Michael Z. Hoemann - Marlborough MA, US
Bruce Clapham - Lindenhurst IL, US
Anil Vasudevan - Union Grove WI, US
Clara I. Villamil - Glenview IL, US
Bin Li - Ashland MA, US
Gagandeep Somal - Framingham MA, US
Kelly D. Mullen - Charlton MA, US
Assignee:
AbbVie Inc. - North Chicago IL
International Classification:
A61K 31/519
A61K 31/5375
A61K 31/55
A61K 31/497
A61K 31/496
A61K 31/397
A61K 31/505
C07D 491/048
C07D 239/00
C07D 265/36
C07D 241/02
C07D 403/14
C07D 205/04
US Classification:
51421021, 51421115, 5142305, 51425211, 51425216, 51425505, 5142601, 540600, 544 70, 544105, 544230, 544278
Abstract:
The present invention is directed to novel compounds of Formula (I).

Method For Wafer-Level Chip Scale Package Testing

US Patent:
2017011, Apr 27, 2017
Filed:
Apr 27, 2016
Appl. No.:
15/140452
Inventors:
- Wuxi, CN
Piu Francis Man - Andover MA, US
Leyue Jiang - Wuxi, CN
Haidong Liu - Wuxi, CN
Bin Li - Andover MA, US
International Classification:
B81C 1/00
B81C 99/00
H01L 21/683
H01L 23/31
H01L 21/78
H01L 21/66
Abstract:
The present disclosure discloses a method for wafer-level chip scale packaged wafer testing. The method comprises: dicing a wafer-level chip scale packaged wafer into a plurality of wafer strips each comprising a plurality of un-diced chip scale packaged devices; fixing the wafer strips onto a plurality of corresponding strip carriers respectively; testing the chip scale packaged devices of the wafer strips fixed onto the strip carriers by a testing equipment; and dicing the tested wafer strips into a plurality of individual chip scale packaged devices. Since the proposed method does not involve loading a multitude of diced chips into sockets one by one, but that a limited number of wafer strips are loaded onto corresponding strip carriers, flow jam is avoided.

Magnetic Field Sensor With Integrated Self-Test Reset Wire

US Patent:
2017011, Apr 27, 2017
Filed:
Oct 20, 2016
Appl. No.:
15/299283
Inventors:
- Wuxi, CN
Bin Li - Andover MA, US
International Classification:
G01R 33/00
G01R 33/09
Abstract:
A magnetic field sensor with an integrated self-test reset wire is provided. The magnetic field sensor includes at least one sensing unit having a magnetic easy axis and a magneto-sensitive axis perpendicular to the magnetic easy axis, and at least one self-test reset wire disposed above or below the at least one sensing unit. A predetermined angle between the self-test reset wire and the magneto-sensitive axis of the corresponding sensing unit is greater than 0 degrees and less than 45 degrees. The self-test reset wire is configured to realize a set-reset function and a self-test function for the magnetic field sensor.

Biomarkers And Methods To Predict Response To Inhibitors And Uses Thereof

US Patent:
2015024, Aug 27, 2015
Filed:
Oct 1, 2013
Appl. No.:
14/432587
Inventors:
- Cambridge MA, US
Bin Li - Belmont MA, US
Hyunjin Shin - Brookline MA, US
William L. Trepicchio - Andover MA, US
International Classification:
C12Q 1/68
G06F 19/12
G06F 17/18
A61K 31/519
Abstract:
Disclosed herein are markers associated with sensitivity to treatment with therapeutic agents. Methods to identify markers for predicting outcome to treatment with a therapeutic agent are disclosed as well as methods to predict outcome of treatment using markers. Compositions and methods are provided to predict response to NAE inhibition or EGFR inhibition treatment.

Biomarkers Of Response To Nae Inhibitors

US Patent:
2015010, Apr 16, 2015
Filed:
Oct 26, 2012
Appl. No.:
14/354149
Inventors:
- Cambridge MA, US
Bin Li - Belmont MA, US
George J. Mulligan - Lexington MA, US
Matthew C. Schu - Somerville MA, US
Peter G. Smith - Arlington MA, US
Assignee:
Millennium Pharmaceuticals, Inc. - Cambridge MA
International Classification:
C12Q 1/68
G01N 33/574
G06F 19/00
A61K 31/519
US Classification:
5142651, 435 611, 536 2433, 506 9, 506 16, 506 2, 435 71, 435 792, 705 2
Abstract:
Disclosed herein are markers whose mutational status is associated with sensitivity to treatment with NAE inhibitors. Mutational status is determined by measurement of characteristics of markers associated with the marker genes. Compositions and methods are provided to assess markers of marker genes to predict response to NAE inhibition treatment.

Isbn (Books And Publications)

Chinese Cultural Laws, Regulations And Institutions

Author:
Bin Li
ISBN #:
7503918349

Possible Relatives

Cynthia M Li  David Li  Dawei Li  Dayu W Li  De Li  Dean Li  Bin J Le  Bin Lin  Bin B Liu 

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