BackgroundCheck.run
Search For

Chun W Chan, 5210201 S Foothill Blvd, Cupertino, CA 95014

Chun Chan Phones & Addresses

10201 S Foothill Blvd, Cupertino, CA 95014    408-3292526   

Santa Clara, CA   

Sunnyvale, CA   

Austin, TX   

Madison, WI   

San Jose, CA   

Baytown, TX   

Mentions for Chun W Chan

Career records & work history

Lawyers & Attorneys

Chun Chan Photo 1

Chun Chan - Lawyer

Office:
Lam S.k., Alfred Chan & Co.
ISLN:
919749106
Admitted:
1993
Chun Chan Photo 2

Chun Chan - Lawyer

Office:
Mak Winnie, Chan & Yeung
Specialties:
Corporate Commercial Law, Corporate Finance, Mergers and Acquisitions
ISLN:
919756678
Admitted:
1992
Chun Chan Photo 3

Chun Chan - Lawyer

Office:
C.O. Chan & Co.
ISLN:
919733235
Admitted:
2000

Medicine Doctors

Chun K. Chan

Specialties:
Anesthesiology
Work:
Medical Anesthesia GroupMedical Anesthesia Group PA
1755 Kirby Pkwy STE 330, Memphis, TN 38120
901-7255846 (phone) 901-7264827 (fax)
Site
Education:
Medical School
University of Tennessee College of Medicine at Memphis
Graduated: 2007
Languages:
English
Description:
Dr. Chan graduated from the University of Tennessee College of Medicine at Memphis in 2007. He works in Memphis, TN and specializes in Anesthesiology. Dr. Chan is affiliated with Methodist Hospital South and Methodist University Hospital.

Chun Chan resumes & CV records

Resumes

Chun Chan Photo 44

Financial Advisor

Location:
Cupertino, CA
Industry:
Financial Services
Chun Chan Photo 45

Chun Chan

Chun Chan Photo 46

Chun Yan Chan

Chun Chan Photo 47

Chun Kit Chan

Publications & IP owners

Us Patents

Systematic Skew Reduction Through Buffer Resizing

US Patent:
6425114, Jul 23, 2002
Filed:
Jan 31, 2000
Appl. No.:
09/494605
Inventors:
Chun Chan - Sunnyvale CA
Bing Yi - Sunnyvale CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
G06F 1750
US Classification:
716 6, 716 5
Abstract:
Skew is reduced in a tree-shaped distribution network having plural levels and plural nodes at each level, where a node at one level connects to plural nodes at the next lower level. Initially, the current level is set to the bottom level of the network. Delay ranges are then obtained corresponding to nodes at the current level and the delay ranges are shifted in an attempt to align delay ranges corresponding to nodes at the current level that connect to the same node at the next higher level. These steps are then repeated for all levels in order from the bottom level to the top level.

Integrated Circuit Design Incorporating A Power Mesh

US Patent:
6480989, Nov 12, 2002
Filed:
Jun 29, 1998
Appl. No.:
09/106890
Inventors:
Chun Chan - San Jose CA
Tammy Huang - Fremont CA
Mike Liang - Milpitas CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
G06F 1750
US Classification:
716 8, 257211, 716 11, 716 14
Abstract:
Provided is a technique for designing an integrated circuit die which includes a semiconductor layer, a primary metal layer, a horizontal metal layer and a vertical metal layer. Electronic components are laid out on the semiconductor layer, and a primary power distribution network for distributing power to the electronic components is laid out on the primary metal layer. Then, a uniform trunk width is calculated for all trunks in a power mesh based on a desired maximum voltage drop for the generated electronic component layout. Finally, horizontal power trunks are laid out on the horizontal metal layer and vertical power trunks are laid out on the vertical metal layer using the calculated uniform trunk width, so as to form the power mesh, and an electrical connection is specified between the power mesh and the primary power distribution network.

Power Mesh Bridge

US Patent:
6492736, Dec 10, 2002
Filed:
Mar 14, 2001
Appl. No.:
09/808441
Inventors:
Chun Chan - Sunnyvale CA
Bo Shen - Fremont CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2348
US Classification:
257773, 257750, 257758, 257920
Abstract:
A multiple layer mesh design that provides that a bridge associated with a second layer connects a rail on a first layer to a trunk on a fourth layer. If the trunk on the third layer shadows a plurality of rails on the first layer, preferably the bridge is at least as wide as a sum of the widths of the rails on the first layer which are shadowed by the trunk on the third layer. If the trunk on the third layer shadows a single rail on the first layer, preferably the bridge is at least as wide as twice the width of the rail on the first layer.

Method For Estimating A Frequency-Based Ramptime Limit

US Patent:
7207021, Apr 17, 2007
Filed:
Jan 14, 2005
Appl. No.:
11/036822
Inventors:
Qian Cui - San Jose CA, US
Chun Chan - Sunnyvale CA, US
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
G06F 17/50
US Classification:
716 6, 703 14, 716 1
Abstract:
A method is provided for selecting a frequency-based ramptime limit for a technology. The method includes creating a logic chain with cells from the technology and applying a sequence of signals to the logic chain. Each signal has a different ramptime relative to a clock period. At least one signal quality characteristic is measured along the logic chain for each of the signals. The frequency-based ramptime limit is selected based on a comparison of the measured signal quality characteristics measured to at least one predefined signal quality value.

Hexagonal Arrangements Of Bump Pads In Flip-Chip Integrated Circuits

US Patent:
6323559, Nov 27, 2001
Filed:
Jun 23, 1998
Appl. No.:
9/103654
Inventors:
Chun Chan - San Jose CA
Mike Liang - Milpitas CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2348
US Classification:
257778
Abstract:
A flip-chip integrated circuit die includes a semiconductor substrate, electronic components implemented on the semiconductor substrate, several plural metal layers, wires routed between the electronic components on the metal layers, a top layer, and bump pads arranged in a hexagonal array on the top layer. According to another aspect, the invention is directed to flip-chip integrated circuit design, in which a circuit description is input and standardized cells which correspond to electronic components in the circuit description are obtained. The standardized cells are laid out on the surface of the die using a rectangular-based layout technique, and bump pads are laid out in a hexagonal array.

Equivalence Checking Of Analog Models

US Patent:
2017008, Mar 23, 2017
Filed:
Sep 16, 2016
Appl. No.:
15/268475
Inventors:
- Mountain View CA, US
Chun Chan - Cupertino CA, US
Che-Hua Shih - Zhubei City, TW
Chia-Chih Yen - Taipei City, TW
International Classification:
G06F 17/50
Abstract:
Techniques for equivalence checking of analog models are disclosed. The models include transistor level representations. The representations are used for simulation and verification of the circuit and are required to give similar output results in response to a given input stimulus. A common input stimulus is created for a first representation and a second representation of a semiconductor circuit. Output waveforms are generated for the first representation and the second representation using the common input stimulus. The first output waveforms and the second output waveforms are checked for equivalence. Signals from the first output waveforms are mapped to the second output waveforms.

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.