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Daniel W Storaska, 5036 Decker Dr, Walden, NY 12586

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36 Decker Dr, Walden, NY 12586    845-7782408   

Blakeslee, PA   

5108 Princess Cir, Wappingers Falls, NY 12590    845-2980153   

50 Princess Cir, Wappingers Falls, NY 12590   

Wappinger, NY   

Richboro, PA   

Monroeton, PA   

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Daniel W Storaska

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Company: Marvell semiconductor Nov 2019 Position: Directory analog integrated circuit design

Education

Degree: Masters, Master of Engineering School / High School: Rensselaer Polytechnic Institute 1998 to 2002 Specialities: Electrical Engineering, Engineering

Skills

Cadence Virtuoso • Autocad • Sketchup • Vlsi Cad • Layout Tools • Code

Interests

Science and Technology • Environment • Education • Children

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Directory Analog Integrated Circuit Design

Location:
5108 Princess Cir, Wappingers Falls, NY 12590
Industry:
Information Technology And Services
Work:
Marvell Semiconductor
Directory Analog Integrated Circuit Design
Ibm Jan 2012 - Jul 2015
Manager, Hss Analog Circuit Design
Globalfoundries Jan 2012 - Jul 2015
Senior Engineering Manager
Ibm Jan 2008 - Jan 2012
Senior Engineer
Ibm Jan 2001 - Jan 2008
Advisory Engineer
Ibm Jan 1997 - Jan 2001
Staff Engineer
Education:
Rensselaer Polytechnic Institute 1998 - 2002
Masters, Master of Engineering, Electrical Engineering, Engineering
Columbia University In the City of New York 1995 - 1997
Bachelors, Bachelor of Science, Electrical Engineering
Miami University 1992 - 1995
Bachelors, Bachelor of Science, Physics
Skills:
Cadence Virtuoso, Autocad, Sketchup, Vlsi Cad, Layout Tools, Code
Interests:
Science and Technology
Environment
Education
Children

Publications & IP owners

Us Patents

Stabilized Direct Sensing Memory Architecture

US Patent:
6438051, Aug 20, 2002
Filed:
May 31, 2001
Appl. No.:
09/870559
Inventors:
John A. Fifield - Underhill VT
Wing K. Luk - Chappaqua NY
Daniel W. Storaska - Wappingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 704
US Classification:
365207, 365211, 327 51
Abstract:
A stabilized direct sensing memory architecture which provides Process, Voltage and Temperature (PVT) compensation in a memory array to a direct sense circuit to increase the manufacturing yield thereof, and to extend the operating voltage and temperature ranges thereof independent of manufacturing tolerances. A single-ended sense amplifier structure has a common source NFET amplifier with an adjustable current source load provided by a PFET. The PFET current source is automatically adjusted to place the NFET amplifier in an operating range to provide maximum amplification of a small signal superimposed on a bitline precharge voltage. A mimic bias generator circuit provides this operating point adjustment, and realizes a direct, single-ended sensing operation using a small number of transistors.

Method And Arrangement For Preconditioning In A Destructive Read Memory

US Patent:
6445611, Sep 3, 2002
Filed:
Sep 28, 2001
Appl. No.:
09/966142
Inventors:
John A. Fifield - Chittenden VT
Daniel W. Storaska - Walden NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1124
US Classification:
365149, 36518901, 36518904, 36523006
Abstract:
An arrangement and method is disclosed which works toward shortening the machine cycle of a DRAM. A data value is written to a storage capacitor of a memory cell of the DRAM, the data value being stored in the storage capacitor as one of low state and high state. During a first wordline activation cycle, a storage capacitor is preconditioned to a preconditioned voltage level. In a subsequent wordline activation cycle, a low state or a high state is written to the storage capacitor. In an aspect of the invention, the wordline is activated in a first wordline activation cycle to begin clearing any previously stored state of the storage capacitor. This cycle may include the reading of a stored data value from the storage capacitor. Then, immediately thereafter, while maintaining the wordline activated, the storage capacitor is preconditioned to a preconditioned voltage level, as by clamping the bitline through a bitline restore device. The wordline is then deactivated.

Dram Direct Sensing Scheme

US Patent:
6449202, Sep 10, 2002
Filed:
Aug 14, 2001
Appl. No.:
09/929593
Inventors:
Hiroyuki Akatsu - Yorktown Heights NY
Louis L. Hsu - Fishkill NY
Jeremy K. Stephens - New Windsor NY
Daniel W. Storaska - Walden NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 700
US Classification:
365205, 365203
Abstract:
A direct sensing circuit and method for reading data from a memory cell connected to a bitline, with open bitline sensing without using a reference bitline signal, onto a data line in a data read operation. Prior to the data read operation, both the bitline and the data line are precharged to precharge voltages and a sense node is precharged to ground. A pFET device has its gate coupled to a signal developed on the bitline from the memory cell to detect and amplify the signal level thereof, and has its source coupled to a voltage source and its drain coupled to a sense node, such that the signal developed on the bitline determines the degree of turn-on of the pFET device. An nFET device has its gate coupled to the sense node to detect and amplify the signal level thereof, and has its drain coupled to the data line. When sensing a low data signal, the signal developed on the bitline causes subthreshold voltage leakage current through the pFET device to charge the gate of the nFET device which is floating to amplify the signal developed on the bitline to pull down the precharged data line. When sensing a high data signal, the pFET device and the nFET device remain inactivated, and the data line remains at its precharge high voltage.

Single Bitline Direct Sensing Architecture For High Speed Memory Device

US Patent:
6552944, Apr 22, 2003
Filed:
May 31, 2001
Appl. No.:
09/870755
Inventors:
John A. Fifield - Underhill VT
Toshiaki Kirihata - Poughkeepsie NY
Wing K. Luk - Chappqua NY
Jeremy K. Stephens - New Windsor NY
Daniel W. Storaska - Wappingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 702
US Classification:
365208, 365203
Abstract:
A single bitline direct sensing architecture employs a 4 transistor sense amplifier circuit located in each memory array, wherein the transistors function to selectively transfer data bits from either a true bitline or a complement bitline of the bitline pair to a data line. The data line is preferably arranged over a plurality of memory arrays. The data line may or may not be shared for the read and write operations. One current source is additionally used to precharge the datalines in a read mode, performing the function of a digital sensing scheme by detecting a resistance ratio between the current source and the transistor driven by the bitline for the corresponding array. A simple inverter may be used for detecting a level of the data line determined by the resistance ratio. The bitline pair is sensed in a single ended fashion, eliminating the need for a cross-coupled pair of CMOS devices, and thus reducing the required layout area. By accessing the bitline pair individually, two sets of control signals for the pre-charge, EQ EQ are developed to allow for bitline shielding in the array.

Semiconductor Memory System Having A Data Clock System For Reliable High-Speed Data Transfers

US Patent:
6614714, Sep 2, 2003
Filed:
Jan 22, 2002
Appl. No.:
10/055149
Inventors:
Louis L. Hsu - Fish Kill NY
Jeremy K. Stephens - New Windsor NY
Daniel W. Storaska - Walden NY
Li-Kong Wang - Montvale NJ
Assignee:
IBM Corporation - Armonk NY
International Classification:
G11C 818
US Classification:
365233, 36523003, 365191, 365194, 36518905
Abstract:
A data clock system for a semiconductor memory system is provided for performing reliable high-speed data transfers. The semiconductor memory system includes a plurality of data banks configured for storing data, the plurality of data banks in operative communication with a plurality of first data paths, each first data path in operative communication with a second data path. The data clock system includes a first clock path receiving a clock signal during a data transfer operation for transferring data between one data bank of the plurality of data banks and the second data path via one of the plurality of first data paths; and a second clock path receiving the clock signal from the first clock path and propagating the clock signal along therethrough, the second clock path including at least one clock driver. The transfer of data between the one of the plurality of first data paths and the second data path occurs upon receipt of the clock signal by the at least one clock driver. A method for propagating a clock signal in a semiconductor memory system is also provided for performing reliable high-speed data transfers.

Writeback And Refresh Circuitry For Direct Sensed Dram Macro

US Patent:
6711078, Mar 23, 2004
Filed:
Jul 1, 2002
Appl. No.:
10/064306
Inventors:
Ciaran J. Brennan - Essex Junction VT
John A. Fifield - Underhill VT
Jeremy K. Stephens - New Windsor NY
Daniel W. Storaska - Walden NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
B11C 700
US Classification:
365205, 365 63, 365203, 365222
Abstract:
A writeback and refresh circuit for a direct sense architecture memory wherein a plurality of primary sense amps are connected to a global data line and also to bitlines, each of which is coupled to an array of memory storage cells which are selected for write and read operations by a plurality of wordlines. A single secondary sense amp receives analog level data from the primary sense amps over the global data line, and includes a restore/writeback circuit which digitizes the data and then returns the digitized data over the global data line to the primary sense amp and back into the memory. A 2-cycle read/writeback operation is used for each memory read cycle, a first cycle read operation, and a second cycle writeback operation. The 2-cycle destructive read architecture eliminates the need for a cache and complex caching algorithms.

Method And Configuration To Allow A Lower Wordline Boosted Voltage Operation While Increasing A Sensing Signal With Access Transistor Threshold Voltage

US Patent:
6751152, Jun 15, 2004
Filed:
Oct 31, 2001
Appl. No.:
09/999379
Inventors:
Louis L. Hsu - Fishkill NY
Toshiaki K. Kirihata - Poughkeepsie NY
Daniel W. Storaska - Walden NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 800
US Classification:
36523006, 365203
Abstract:
A memory array architecture employs a full Vdd bitline precharged voltage and a low wordline boost voltage, which is less than Vdd plus the threshold voltage of the access transistor. In a write mode, a first low level of a data bit is almost fully written to a storage element, however a second high level of the data bit is not fully written to the storage element. In a read mode, the first low level of the data bit is fully read out from the storage element, however the second high level of the data bit is not read out by utilizing the access transistor threshold voltage. This allows a sensing signal only with the first voltage level transfer to the Vdd precharged BL. A reference WL is preferably used for generating a reference bitline voltage for a differential Vdd sensing scheme. Alternatively, a single BL digital sensing scheme may be used. Lowering the wordline voltage results in a reduction in power consumption by saving power on Vpp generator and support circuits, and a reduction in the size of the Vpp generator and support circuits, and also eliminates high Vpp voltage related problems such as dielectric breakdown and other reliability concerns while avoiding a complex decoding scheme and saving cost.

Embedded Dram System Having Wide Data Bandwidth And Data Transfer Data Protocol

US Patent:
6775736, Aug 10, 2004
Filed:
Jan 31, 2002
Appl. No.:
10/062812
Inventors:
Louis L. Hsu - Fish Kill NY
Rajiv J. Joshi - Yorktown Heights NY
Jeremy K. Stephens - New Windsor NY
Daniel W. Storaska - Walden NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06F 1200
US Classification:
711104, 711105, 36518904, 36523003
Abstract:
A self-timed data communication system for a wide data width semiconductor memory system having a plurality of data paths. The data communication system includes a plurality of data banks configured for storing data, wherein a corresponding data bank of the plurality of data banks is connected to a respective one data path of the plurality of data paths. The data communication system further includes circuitry for controlling the respective one data path in accordance with receipt of a monitor signal indicating that a data transfer operation has been initiated for transfer of data to or from the respective one data path. The circuitry for controlling includes circuitry for generating a control signal for controlling resetting of the respective one data path after data is transferred for preparation of a subsequent data transfer operation.

Public records

Vehicle Records

Daniel Storaska

Address:
36 Decker Dr, Walden, NY 12586
Phone:
845-7782408
VIN:
5GZEV23768J142028
Make:
SATURN
Model:
OUTLOOK
Year:
2008

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