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David Vernon Blackham, 693716 Newbury Ct, Santa Rosa, CA 95404

Known as:
David V Blackham David L Blackham David L Silver David Silver Revoc Dave Blackham

David Blackham Phones & Addresses

3716 Newbury Ct, Santa Rosa, CA 95404    707-5681799    707-5667270   

4525 Byrne Ct, Santa Rosa, CA 95409   

Honolulu, HI   

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Us Patents

Method And Apparatus For Efficient Measurement Of Reciprocal Multiport Devices In Vector Network Analysis

US Patent:
6396285, May 28, 2002
Filed:
Aug 14, 2000
Appl. No.:
09/638278
Inventors:
David VerNon Blackham - Santa Rosa CA
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01R 3500
US Classification:
324601, 324638
Abstract:
Method and apparatus to determine scattering coefficients for a device under test (DUT) using a vector network analyzer (VNA) is disclosed. Traditionally, for a DUT having P ports, all combinations of reflective and transmission coefficients are measured and calculated. This is true even for reciprocal devices where S =S because, during the measurement, the source and load matches vary. However, the present invention teaches that, for reciprocal devices, only one of the two transmission coefficients between a first port and a second port need be measured. Under the inventive technique, error terms are removed from the measured scattering coefficients. Then, the source and the load matches may be normalized to a normalization match value. The normalization process removes the differences of the source and the load matches. Accordingly, for reciprocal devices, only one of two reciprocal transmission coefficients need be measured to determine the transmission coefficients for both directions between the first and the second port.

System And Method For Determining Measurement Errors Of A Testing Device

US Patent:
6823276, Nov 23, 2004
Filed:
Apr 4, 2003
Appl. No.:
10/407671
Inventors:
David V. Blackham - Santa Rosa CA
Kenneth H. Wong - Santa Rosa CA
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01D 1800
US Classification:
702 85
Abstract:
A system and method are disclosed which provide for flexible and accurate test apparatus error value calculation. Error value calculation of a testing apparatus requires at least one unique measurement for each unknown error value using the equation that relates the measured response, the predicted response and the error value. When more equations than unknowns can be acquired, the system of equations is over-determined and an improvement of accuracy is possible, but accuracy may be lost when the predicted responses are not trusted to the same degree. The disclosed system and method provide the increased accuracy of an over-determined system, while accounting for predicted responses of varying degrees of trust.

Compensating For Unequal Load And Source Match In Vector Network Analyzer Calibration

US Patent:
6836743, Dec 28, 2004
Filed:
Oct 15, 2002
Appl. No.:
10/273015
Inventors:
David V. Blackham - Santa Rosa CA
Douglas K. Rytting - Santa Rosa CA
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G06F 1900
US Classification:
702107, 324601
Abstract:
A method and a vector network analyzer compensate for unequal source match and load match of a test port of the vector network analyzer. The method characterizes the source match and the load match, computes a delta-match factor from the characterized source match and load match, and uses the delta-match factor to compensate for the difference. The method compensates S-parameter data for a device under test measured by the vector network analyzer. The vector network analyzer comprises a computer program that, when executed by a controller, implements a calibration compensation.

Vector Network Analyzer Mixer Calibration Using The Unknown Thru Calibration

US Patent:
6995571, Feb 7, 2006
Filed:
Jan 3, 2005
Appl. No.:
11/028161
Inventors:
James C. Liu - Santa Rosa CA, US
Kenneth H. Wong - Santa Rosa CA, US
David V. Blackham - Santa Rosa CA, US
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01R 35/00
US Classification:
324601, 324 7622
Abstract:
In one embodiment, a method comprises applying a stimulus signal to a reference frequency translation device (FTD) by a vector network analyzer during a calibration mode, wherein the reference FTD possesses equal conversion efficiency in forward and reverse directions and the reference FTD possesses unknown input and output reflection characteristics; measuring a response of the reference FTD; and determining forward and reverse transmission tracking error terms using data from the measured response and single-port error calibration terms.

Noise Measurement System And Method

US Patent:
7010443, Mar 7, 2006
Filed:
Oct 31, 2003
Appl. No.:
10/699526
Inventors:
Shigetsune Torin - Santa Rosa CA, US
Kenneth H. Wong - Santa Rosa CA, US
David VerNon Blackham - Santa Rosa CA, US
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01R 29/26
US Classification:
702 69, 324614
Abstract:
Noise power is measured within one or more designated frequency bands of an applied signal. The measurement includes frequency translating the applied signal by a set of equally spaced frequencies to form a corresponding set of intermediate frequency signals, measuring the noise in at least two measurement bands of each of the intermediate frequency signals that are separated by the frequency spacing of the equally spaced frequencies, and determining the noise power in the designated frequency band of the applied signal based on the noise measurements.

Multiport Calibration Simplification Using The “Unknown Thru” Method

US Patent:
7019536, Mar 28, 2006
Filed:
Jan 3, 2005
Appl. No.:
11/028032
Inventors:
Keith F. Anderson - Santa Rosa CA, US
David V. Blackham - Santa Rosa CA, US
Brad R. Hokkanen - Windsor CA, US
Kenneth H. Wong - Santa Rosa CA, US
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01R 35/00
US Classification:
324601, 324 7622
Abstract:
In one embodiment, a method of calibrating a multi-port vector network analyzer (VNA) includes (i) performing two-port calibrations on pairs of ports to determine forward and reverse systematic error terms associated with each pair of ports, wherein the pairs of ports are selected such that each port's systematic error terms (directivity, source match, reflection tracking, and load match) are determined, (ii) generating a switch error correction matrix using data from the two-port calibrations, and (iii) performing unknown thru calibration for at least one pair of ports that was not utilized in step (i), wherein the unknown thru calibration comprises applying the switch error correction matrix to measurement data and determining transmission tracking error terms using the corrected measurement data.

Network Analyzer Applying Loss Compensation Using Port Extensions And Method Of Operation

US Patent:
7054780, May 30, 2006
Filed:
Sep 13, 2004
Appl. No.:
10/939861
Inventors:
Joel Dunsmore - Sebastopol CA, US
Doug Bender - Santa Rosa CA, US
David Blackham - Santa Rosa CA, US
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G06F 19/00
US Classification:
702117, 324763, 714100
Abstract:
In one embodiment, a method of operating a network analyzer, comprises applying a stimulus signal on at least one port of the network analyzer for provision to a device under test (DUT) within a test fixture coupled to the network analyzer; generating measurement data from the DUT in response to the stimulus signal on at least one port of the network analyzer; and generating an amplitude response of the DUT across a frequency range, wherein a port extension module of the network analyzer automatically applies loss compensation to the amplitude response in a manner that is non-linearly related to frequency according to at least one controllable parameter.

Power Calibration For Multi-Port Vector Network Analyzer (Vna)

US Patent:
7061254, Jun 13, 2006
Filed:
May 12, 2005
Appl. No.:
11/127852
Inventors:
Robert Edward Shoulders - Santa Rosa CA, US
David VerNon Blackham - Santa Rosa CA, US
Kenneth H. Wong - Santa Rosa CA, US
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
G01R 35/00
US Classification:
324601, 324638
Abstract:
A power calibration method for a multi-port vector network analyzer (VNA) performs a two-port S-parameter calibration between a pair of ports of the multi-port VNA, and performs a power calibration of one of the ports in the pair of ports. From the two-port S-parameter calibration and the power calibration at the one port, power can be determined at one or more ports of a device under test (DUT) coupled to the ports of the multi-port VNA.

Possible Relatives

Dale G Blackham  Aaron K Blackham  Fred D Blackham  James P Blackham  Jeffrey S Blackham  Kevin H Blackham  Matthew I Blackham  David Last  David W Johnson  David Stamps 

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