David L Donovan, 65240 Palmer Pl, Columbia, MO 65202

8422968, Apr 16, 2013

Jun 3, 2009

12/477862

David A. Donovan - Oakland CA, US
Justin Gregg - San Francisco CA, US

Apple Inc. - Cupertino CA

H01Q 11/12
H04B 1/04
H04M 1/00

4551272, 455126, 4551274, 4551143, 4551151, 4555531

Wireless circuitry in an electronic device may contain radio-frequency transceiver circuitry and power amplifier circuitry that transmits radio-frequency signals through an antenna. A tap and power detector that are interposed in the radio-frequency signal path between the power amplifier circuitry and the antenna may be used to make output power measurements. Control circuitry may control the wireless circuitry in an open-loop control regime in which output power adjustments are based on a requested power without using the output power measurements. The control circuitry may also control the wireless circuitry in a closed-loop control regime in which the output power measurements serve as a source of real time feedback to determine whether to increase or decrease the output power. The output power may be controlled using linear transition zone power control curves in a transition zone between the open-loop regime and the closed-loop regime.

8437793, May 7, 2013

Nov 24, 2009

12/625534

David A. Donovan - Oakland CA, US
Justin Gregg - San Francisco CA, US

Apple Inc. - Cupertino CA

H04Q 7/32

455522, 455 69, 455423, 455425, 455517, 455 6711, 370241, 370328, 370329, 370338, 370343

Test systems are provided for performing testing and calibration operations on wireless circuitry in electronic devices. The electronic devices may include cellular telephones and other portable electronic devices. Wireless circuitry in a device may include a radio-frequency transceiver that is controlled based on radio-frequency transceiver control signals. The wireless circuitry may also include power amplifier circuitry. The power amplifier circuitry may receive radio-frequency signals from the transceiver and may produce correspondingly amplified radio-frequency output signals for wireless transmission with an antenna. The power amplifier circuitry may be powered by a bias voltage. The test systems may provide the electronic device with a transmit power request that directs the electronic device to produce a desired output power. The test systems may measure the actual resulting power. After sufficient measurements have been made, the test systems may calibrate the transceiver and power amplifier settings.

8583062, Nov 12, 2013

Apr 15, 2010

12/761219

David A. Donovan - Oakland CA, US
Justin Gregg - San Francisco CA, US
Vishwanath Venkataraman - San Francisco CA, US

Apple Inc. - Cupertino CA

H04B 1/04

4551271, 4551275

Electronic devices with wireless communications capabilities are provided. The electronic device may include storage and processing circuitry, power amplifier circuitry, power supply circuitry, etc. The storage and processing circuitry may direct the power amplifier circuitry to operate using a desired gain mode, in a particular radio channel, and at a given output power level. The power supply circuitry may bias the power amplifier circuitry with a power supply voltage. The performance of the power amplifier circuitry may be characterized by an adjacent channel leakage ratio (ACLR) margin. The power consumption of the power amplifier circuitry may be characterized by a current savings ratio. A cost function may be calculated by taking the product of the ACLR margin and current savings ratio. A minimum point for each cost function curve may be determined.

2012005, Mar 1, 2012

Aug 31, 2010

12/872963

Thomas W. Chang - Sunnyvale CA, US
Adil Syed - Santa Clara CA, US
David A. Donovan - Oakland CA, US

H04W 24/00

455 6712

A method for testing wireless devices under test (DUTs) in a wireless test station is provided. Each test station may include a test unit, a test chamber with an antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference DUTs may be used to calibrate each test station to compute a corrected linear equation based on a nominal path loss value. Over-the-air (OTA) path loss of each test station may not be directly measured. Once calibrated, the test chambers may be used during product testing to test factory DUTs to determine whether a particular factory DUT satisfies pass/fail criteria. During product testing, measured output power levels may be compared with expected output power levels computed using the corrected linear equation. The amount of error between the measured and expected output power levels will determine whether a production DUT satisfies the pass/fail criteria.

2012022, Aug 30, 2012

Feb 25, 2011

13/035026

Justin Gregg - San Francisco CA, US
Tomoki Takeya - Santa Clara CA, US
David A. Donovan - Oakland CA, US

G06F 19/00

702106

Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate uplink and downlink path loss (e.g., OTA path loss, RF cable path loss, and variations of the test unit) associated with each test station. The reference DUTs may calibrate each test station at desired frequencies to generate a path loss table. Once calibrated, the test chambers may be used during production testing to test factory DUTs. During production testing, the transmit/receive power efficiency of each factory DUT may be calculated based on values in the path loss table to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria.

2013033, Dec 19, 2013

Jun 14, 2012

13/523699

Gary Lang Do - San Jose CA, US
David A. Donovan - Oakland CA, US

H04B 17/00

375227

A calibration system may be provided for calibrating wireless communications circuitry in an electronic device during manufacturing. The calibration system may include data acquisition equipment and calibration computing equipment for receiving and processing test and calibration signals from wireless communications circuitry to be calibrated. During testing and calibration operations, a device may be provided with initial pre-distortion calibration values. The initial pre-distortion calibration values may be generated at least in part based on calibration operations performed for other wireless electronic devices. The device may generate a test signal using the initial pre-distortion calibration values. The calibration system may determine whether the test signal is within an acceptable range of a known reference signal. If the test signal is outside of the acceptable range, the calibration system may generate a set of corrected pre-distortion calibration values to be used in generating wireless communications signals during normal operation of the device.

2014007, Mar 13, 2014

Sep 7, 2012

13/606588

Wassim El-Hassan - Cupertino CA, US
David A. Donovan - Oakland CA, US

H04B 17/00

4551153

A calibration system for calibrating wireless circuitry in an electronic device is provided. The test system may include test equipment, a computer, and a device under test (DUT). The test equipment may measure the output power of the DUT. The DUT may include power amplifier circuitry that is provided with a power supply voltage supplied by power supply circuitry. A list mode sequence of commands may be provided to the DUT and the test equipment to calibrate the power amplifier circuitry. The list of commands may be processed by the DUT to produce radio-frequency signals. The list of commands may be simultaneously processed by the test equipment to perform measurements on the radio-frequency signals. The computer may retrieve measurement data from the test equipment after testing is complete. The computer may subsequently determine calibrated control settings for the DUT that reduce power consumption while ensuring satisfactory adjacent channel leakage performance.

2021039, Dec 23, 2021

Sep 1, 2021

17/446700

- Newark CA, US
David Darrow - Pleasanton CA, US
David Donovan - Newark CA, US

Kateeva, Inc. - Newark CA

B41J 2/21
H04N 1/00

A printing system includes a substrate support, a printhead assembly positioned facing the substrate support, and an imager. The printhead assembly includes a plurality of dispensing nozzles extending in an ejection direction towards the substrate support and a plurality of marks. The imager is movable relative to the printhead assembly and oriented in a direction opposite to the ejection direction for capturing at least one image including the plurality of marks indicating positions of the plurality of dispensing nozzles in the printhead assembly.