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David R Nackashi Deceased8001 Haymarket Ln, Raleigh, NC 27615

Known as:
David Raymond Nackashi David P Nackashi Dave R Nackashi Raymond D Nackashi
Related to:
James R Pruitt 58

David Nackashi Phones & Addresses

8001 Haymarket Ln, Raleigh, NC 27615    919-8459303   

Winter Springs, FL   

Jacksonville, FL   

Macon, GA   

Social networks

David R Nackashi

Linkedin

Work

Company: Protochips, inc Position: Ceo

Education

Degree: Doctorates, Doctor of Philosophy School / High School: North Carolina State University 1999 to 2004 Specialities: Electrical Engineering, Philosophy

Skills

Characterization • Materials Science • Mems • Electron Microscopy • Integration • Semiconductors • Nanomaterials • Business Development • Startup Development • Debt and Equity Financing • Product Marketing • Product Development • Intellectual Property

Emails

d***[email protected]

Industries

Nanotechnology
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David Nackashi resumes & CV records

Resumes

David Nackashi Photo 16

Chief Executive Officer And Cofounder

Location:
Raleigh, NC
Industry:
Nanotechnology
Work:
Protochips, Inc
CEO
Education:
North Carolina State University 1999 - 2004
Doctorates, Doctor of Philosophy, Electrical Engineering, Philosophy North Carolina State University 1997 - 1999
Masters, Electrical Engineering Georgia Institute of Technology 1989 - 1993
Bachelors, Electrical Engineering
Skills:
Characterization, Materials Science, Mems, Electron Microscopy, Integration, Semiconductors, Nanomaterials, Business Development, Startup Development, Debt and Equity Financing, Product Marketing, Product Development, Intellectual Property

Publications & IP owners

Us Patents

Sample Holder Providing Interface To Semiconductor Device With High Density Connections

US Patent:
8466432, Jun 18, 2013
Filed:
Apr 12, 2011
Appl. No.:
13/085273
Inventors:
John Damiano, Jr. - Apex NC, US
Stephen E. Mick - Apex NC, US
David P. Nackashi - Raleigh NC, US
Montie Roland - Apex NC, US
Paul A. Hakenewerth - Raleigh NC, US
Assignee:
Protochips, Inc. - Raleigh NC
International Classification:
G02B 21/34
H01J 37/20
G01N 1/28
US Classification:
25044111, 25044011, 25044211
Abstract:
A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

Specimen Holder Used For Mounting

US Patent:
8513621, Aug 20, 2013
Filed:
Mar 17, 2009
Appl. No.:
12/933213
Inventors:
David P. Nackashi - Raleigh NC, US
John Damiano, Jr. - Apex NC, US
Stephen E. Mick - Apex NC, US
Thomas G. Schmelzer - Cranberry Township PA, US
Michael Zapata, III - Cary NC, US
Assignee:
Protochips, Inc. - Raleigh NC
International Classification:
G21K 5/08
US Classification:
25044011, 25044211, 250311
Abstract:
A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.

Reusable Template For Creation Of Thin Films; Method Of Making And Using Template; And Thin Films Produced From Template

US Patent:
2006027, Dec 14, 2006
Filed:
Jun 10, 2005
Appl. No.:
11/150382
Inventors:
Stephen Mick - Apex NC, US
John Damiano - Raleigh NC, US
David Nackashi - Raleigh NC, US
International Classification:
G01B 3/14
US Classification:
033562000
Abstract:
The present invention is directed generally to templates used in the creation of thin-film replicas, for example, the creation of thin films, such as carbon films, for use as specimen support in electron-beam specimen analysis. More specifically, the present invention is directed to novel reusable patterned templates, the methodology of making these reusable templates, the templates made from such methodologies, the use and reuse of these templates to make thin films of any type for any purpose, and the thin films made from these templates. A feature of the novel template of the present invention is in its employment of one or more zones of discontinuity, or undercuts, associated with the patterns transferred into the template to allow for the removal of the thin film from the template without sacrificing the structural integrity of the template to prevent at least one re-use of the template.

Self-Assembly Of Molecular Devices

US Patent:
2007029, Dec 27, 2007
Filed:
Apr 25, 2007
Appl. No.:
11/740170
Inventors:
James Tour - Bellaire TX, US
Jiping Yang - Houston TX, US
Philipp Harder - Hauenstein, DE
David Allara - State College PA, US
Paul Weiss - State College PA, US
Long Cheng - Sunnyvale CA, US
Paul Franzon - Holly Springs NC, US
David Nackashi - Raleigh NC, US
Assignee:
William Marsh Rice University - Houston TX
International Classification:
G11C 11/56
B05D 1/04
C25D 5/00
H01L 45/00
H01L 21/62
C25D 5/10
US Classification:
365151000, 205170000, 205080000, 257004000, 427472000, 438139000, 977750000, 977709000
Abstract:
A method for selectively assembling a molecular device on a substrate comprises contacting the first substrate with a solution containing molecular devices; impeding bonding of the molecular devices to the substrate such that application of a voltage potential to the substrate results in assembly of the molecular device on the substrate at a rate that is at least 1.5 times the rate of assembly of the molecular device on a voltage-neutral substrate; and applying a voltage potential to the substrate so as to cause the molecular devices to assemble on the substrate. A nanoscale computing device is described that includes a substrate, a pair of conductive input/output electrodes carried on this substrate and disposed in spaced-apart relationship and a substantially disordered assembly of nanowires formed on the substrate in a region between the electrodes, thereby forming at least one programmable conductive pathway between the pair of electrodes.

Membrane Supports With Reinforcement Features

US Patent:
2010014, Jun 10, 2010
Filed:
Feb 29, 2008
Appl. No.:
12/529429
Inventors:
John Damiano, JR. - Apex NC, US
Stephen E. Mick - Apex NC, US
David P. Nackashi - Raleigh NC, US
Assignee:
PROTOCHIPS, INC. - Raleigh NC
International Classification:
H01J 37/20
B05D 1/36
US Classification:
25044011, 427209
Abstract:
A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.

Sample Support Structure And Methods

US Patent:
2010014, Jun 10, 2010
Filed:
Nov 16, 2007
Appl. No.:
12/515131
Inventors:
John Damiano, JR. - Apex NC, US
Stephen E. Mick - Apex NC, US
David P. Nackashi - Raleigh NC, US
Assignee:
PROTOCHIPS, INC. - Raleigh NC
International Classification:
B01L 3/00
G01N 23/00
C23F 1/00
B44C 1/22
US Classification:
422104, 216 2
Abstract:
A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.

Reusable Template For Creation Of Thin Films; Method Of Making And Using Template; And Thin Films Produced From Template

US Patent:
2010022, Sep 2, 2010
Filed:
May 11, 2010
Appl. No.:
12/777623
Inventors:
Stephen E. Mick - Apex NC, US
John Damiano, JR. - Apex NC, US
David P. Nackashi - Raleigh NC, US
Assignee:
PROTOCHIPS, INC. - Raleigh NC
International Classification:
B32B 3/10
B29C 59/02
US Classification:
428138, 428131, 264241
Abstract:
The present invention is directed generally to templates used in the creation of thin-film replicas, for example, the creation of thin films, such as carbon films, for use as specimen support in electron-beam specimen analysis. More specifically, the present invention is directed to novel reusable patterned templates, the methodology of making these reusable templates, the templates made from such methodologies, the use and reuse of these templates to make thin films of any type for any purpose, and the thin films made from these templates. A feature of the novel template of the present invention is in its employment of one or more zones of discontinuity, or undercuts, associated with the patterns transferred into the template to allow for the removal of the thin film from the template without sacrificing the structural integrity of the template to prevent at least one re-use of the template.

Specimen Mount For Microscopy

US Patent:
2011003, Feb 10, 2011
Filed:
Dec 22, 2008
Appl. No.:
12/809717
Inventors:
Stephen E. Mick - Apex NC, US
John Damiano - Apex NC, US
David P. Nackashi - Raleigh NC, US
Assignee:
PROTOCHIPS, INC. - Raleigh NC
International Classification:
G02B 21/30
G02B 21/26
US Classification:
359395, 359391
Abstract:
Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.

Possible Relatives

Faye R Nackashi  David Last  David W Johnson  David Stamps  David L Stanard  David M Stanbery  David A Stanchfield  David J Stanciel  David Stancil  David A Stanczak 

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