Inventors:
Kent B. Pfeifer - Los Lunas NM, US
William G. Yelton - Sandia Park NM, US
Dayle R. Kerr - Sandia Park NM, US
Francis A. Bouchier - Albuquerque NM, US
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01N 31/00
G01N 30/02
Abstract:
A method of multi-dimensional moment analysis for the characterization of signal peaks can be used to optimize the operation of an analytical system. With a two-dimensional Péclet analysis, the quality and signal fidelity of peaks in a two-dimensional experimental space can be analyzed and scored. This method is particularly useful in determining optimum operational parameters for an analytical system which requires the automated analysis of large numbers of analyte data peaks. For example, the method can be used to optimize analytical systems including an ion mobility spectrometer that uses a temperature stepped desorption technique for the detection of explosive mixtures.
