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Deborah M Leek, 52Happy Valley, OR

Known as:
Deborah A Leek Debbie A Leek Deborah Monique Armstrong Deborah M Armstrong Debbie Armstrong
Related to:
Courtney J Samsel 53

Deborah Leek Phones & Addresses

Gresham, OR   

830 A St, Washougal, WA 98671    360-8352752   

Stevenson, WA   

Vancouver, WA   

Corvallis, OR   

Gresham, OR   

Murphy, TX   

Rockwall, TX   

Social networks

Deborah M Leek

Linkedin

Work

Position: Executive, Administrative, and Managerial Occupations

Education

Degree: Graduate or professional degree

Industries

Insurance
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Deborah Leek resumes & CV records

Resumes

Deborah Leek Photo 16

Owner At Debbie Leek Agency - Insurance & Financial Services

Location:
Portland, Oregon Area
Industry:
Insurance
Experience:
Debbie Leek Agency - Insurance & Financial Services (Insurance industry): Owner,  (April 2006-Present) Offering multiple lines of insurance carriers for personal lines and commercial including: Farmers Insurance, Foremost, Bristol West, Aflac, and many other commercial carri...

Publications & IP owners

Us Patents

Method Of Qualifying A Process Tool With Wafer Defect Maps

US Patent:
2005006, Mar 24, 2005
Filed:
Sep 8, 2003
Appl. No.:
10/658168
Inventors:
John Knoch - Portland OR, US
Deborah Leek - Washougal WA, US
Nathan Strader - Portland OR, US
International Classification:
G01N031/00
US Classification:
702030000
Abstract:
A method of qualifying a process tool includes steps of: (a) finding a plurality of pre-scan defect locations on a surface of a semiconductor wafer; (b) subjecting the semiconductor wafer to processing by the process tool; (c) finding a plurality of post-scan defect locations on the surface of the semiconductor wafer; and (d) calculating a plurality of defect locations added by the process tool from the pre-scan defect locations and the post-scan defect locations.

Defect Monitoring System

US Patent:
2006006, Mar 30, 2006
Filed:
Sep 28, 2004
Appl. No.:
10/951647
Inventors:
Michael Gatov - Gresham OR, US
Deborah Leek - Washougal WA, US
Bruce Whitefield - Camas WA, US
International Classification:
G06F 17/00
US Classification:
705400000
Abstract:
A method of determining a cost effective number of corrective tests to perform on a process experiencing process excursions. A test cost for each corrective test is determined, and a total test cost for each of an incremental number of corrective tests is calculated. An effect of each corrective test on a reduction in the process excursions is determined, as is also the lost revenue for each process excursion. A reduction in the lost revenue for each of the incremental number of corrective tests is calculated, based at least in part on the effect of each corrective test on the reduction in process excursions and the revenue lost for each process excursion. An overall cost for each of the incremental number of corrective tests is calculated, based at least in part on a sum of the total test cost and the reduction in the lost revenue for each of the incremental number of corrective tests. A minimum value of the overall costs is found, and that incremental number of corrective tests that is associated with the minimum value of the overall costs is selected as the cost effective number of corrective tests to perform.

Possible Relatives

Debbie J Leek  Aaron J Leek  Danny Leek  Dennis S Leek  Donna M Leek  Edwin O Leek  Eric C Leek  Deborah L Johnson  Deborah A Stamps  Deborah L Stanbery 

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