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Eric Y Jiang, 615759 Longwood Ln, Madison, WI 53711

Known as:
Eric Yinghu Jiang Yinghu Y Jiang Yinghu H Jiang Yinghu Jiang Ma Hu Jiang Yinghu

Eric Jiang Phones & Addresses

Fitchburg, WI   

Middleton, WI   

Cambridge, MA   

Woburn, MA   

Pullman, WA   

Andover, MA   

5759 Longwood Ln, Fitchburg, WI 53711    608-2887860   

Work

Position: Medical Professional

Education

School / High School: York University Osgoode Hall Law School

Ranks

Licence: New York - Currently registered Date: 2002
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Mentions for Eric Y Jiang

Career records & work history

Lawyers & Attorneys

Eric Jiang Photo 1

Eric Jiaxi Jiang - Lawyer

Address:
Jurisino Law Group
105-9336116 (Office)
Licenses:
New York - Currently registered 2002
Education:
York University Osgoode Hall Law School
Eric Jiang Photo 2

Eric Jiang - Lawyer

Specialties:
Antitrust & Trade Law, International Law, Mergers & Acquisitions, Arbitration, Corporate & Incorporation
ISLN:
923929402
Admitted:
2002
Law School:
Osgoode Hall Law School, J.D., 2002

Eric Jiang resumes & CV records

Resumes

Eric Jiang Photo 39

Managing Director

Location:
Madison, WI
Industry:
Biotechnology
Work:
Ddening
Managing Director Thermo Fisher Scientific 1999 - 2008
Product Manager, Principal Scientist Bio-Rad Laboratories 1995 - 1999
Senior Scientist, Asia Business Development
Education:
Duke University 1991 - 1995
Doctorates, Doctor of Philosophy, Chemistry New Jersey Institute of Technology 1990 - 1991
Master of Science, Masters, Chemistry Wuhan University of Technology 1979 - 1986
Master of Science, Masters, Bachelors, Bachelor of Science, Materials Science, Engineering
Skills:
Ftir, Process Engineering, Components, Spectroscopy, Analytical Chemistry, Chemistry, Optical Materials, Materials Science, R&D, Uv/Vis, Ir, Optics, Polymers, Laser, Instrumentation, Technology Transfer, Photonics, Coatings, Organic Chemistry, Chemometrics, Science, Manufacturing, Gmp, Thin Films, Semiconductors, Physics, Physical Chemistry, Design of Experiments, Commercialization, Nanotechnology, Ir Spectroscopy, Materials, Mass Spectrometry, Uv, Product Development, Lifesciences, Sensors, Patents, Chromatography, Characterization, Validation, Fluorescence, Biotechnology, Laboratory, Drug Discovery, Gas Chromatography, Hplc, Lc Ms, Fda, Biochemistry
Languages:
English
Mandarin
Eric Jiang Photo 40

Eric Jiang

Publications & IP owners

Us Patents

Vibrational Circular Dichroism Spectrometer Using Reflective Optics

US Patent:
2007022, Sep 27, 2007
Filed:
Nov 17, 2006
Appl. No.:
11/601344
Inventors:
Eric Jiang - Fitchburg WI, US
Francis J. Deck - Madison WI, US
International Classification:
G01J 4/00
G01J 3/42
US Classification:
356367, 356319
Abstract:
A spectrometer generates Vibrational Circular Dichroism (VCD) measurements having an exceedingly high signal-to-noise ratio, as well as a greater wavelength range over which measurements may be accurately provided. This is achieved by utilizing reflective optics (preferably solely reflective optics, i.e., no refractive elements) to supply a concentrated and collimated input light beam to a sample within a sample cell, and similarly collecting the light output from the sample cell via reflective optics for supply to a detector.

Multi-Layer Thickness Detection Using Correction Factors For Photoacoustic Spectroscopy

US Patent:
2020023, Jul 23, 2020
Filed:
Dec 30, 2019
Appl. No.:
16/729652
Inventors:
- Bergen op Zoom, NL
Eric JIANG - Madison WI, US
International Classification:
G01B 11/06
G01N 21/17
Abstract:
Methods and systems are described for determining layer thickness for layers in a multi-layer sample. Reference transmission spectral data may be determined for a first layer and a second layer. The first layer may comprise a first material associated with a first spectral band and the second layer may comprise a second material associated with a second spectral band. The first spectral band may at least partially overlap the second spectral band. The reference spectral data may be used to determine correction factors. Spectral data may be measured for the multi-layer sample. The correction factors may be used to correct the spectral data by removing the contribution of the second layer from spectral data associated with first layer.

Possible Relatives

Cynthia Jiang  David Q Jiang  Daniel X Jiang  Danny P Jiang  Dennis Jiang  Dian Jiang  Dongyan Jiang  Eric N Johnson  Eric Stamps  Eric P Stander 

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