BackgroundCheck.run
Search For

Eric W Prince, 39Rochester, NY

Eric Prince Phones & Addresses

Rochester, NY   

Glen Allen, VA   

Los Angeles, CA   

3401 Floyd Ave, Richmond, VA 23221   

Henrico, VA   

Washington, DC   

Fairport, NY   

Penfield, NY   

Languages

English

Mentions for Eric W Prince

Career records & work history

Medicine Doctors

Eric Prince Photo 1

Eric F Prince, Altadena CA

Specialties:
Physical Medicine & Rehabilitation
Rehabilitation
Address:
2933 El Nido Dr, Altadena, CA 91001
626-3957100 (Phone)
Languages:
English
Eric Prince Photo 2

Eric Prince

Specialties:
Internal Medicine

License Records

Eric Thompson Prince Jr.

Licenses:
License #: EI.0019618 - Expired
Category: Civil Engineer
Issued Date: Nov 28, 2000
Expiration Date: Mar 31, 2009

Publications & IP owners

Us Patents

Temperature Control Apparatus For Thin Film Deposition System

US Patent:
4811687, Mar 14, 1989
Filed:
Dec 14, 1987
Appl. No.:
7/133113
Inventors:
Eric T. Prince - Fairport NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
C23C 1400
US Classification:
118666
Abstract:
Apparatus adapted for use in high vacuum, thin-film deposition system for controlling the temperature of moving substrate holder. Preferably, such temperature control apparatus comprises a fixed, temperature-controlled, thermally conductive member, and liquid heat transfer medium (preferably liquid gallium) for thermally coupling such member to the substrate holder as it moves through a vacuum chamber.

Quasi-Phase Matching Optical Waveguide

US Patent:
5058970, Oct 22, 1991
Filed:
Sep 17, 1990
Appl. No.:
7/583118
Inventors:
Jay S. Schildkraut - Rochester NY
Joseph F. Revelli - Rochester NY
Eric T. Prince - Fairport NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
G02F 137
US Classification:
359328
Abstract:
A quasi-phase matching optical waveguide for producing a second harmonic of an internally propagated polarized laser beam having a wavelength in the range of from 700 to 1300 nm is disclosed. The waveguide is comprised of at least one array of laterally spaced transparent electrodes in direct contact with a transmission medium containing similarly polar aligned organic molecular dipoles in overlying areas. The transparent electrodes and overlying areas of the transmission medium are each of the same width and spacing.

Planar Waveguide Liquid Crystal Variable Retarder

US Patent:
5347377, Sep 13, 1994
Filed:
Jun 17, 1992
Appl. No.:
7/899961
Inventors:
Joseph F. Revelli - Rochester NY
Eric T. Prince - Fairport NY
Steven C. Switalski - Rochester NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
G02F 11335
G02F 1137
G02F 101
US Classification:
359 42
Abstract:
A waveguide optical device having a guide member for propagation of light in a longitudinal direction. The guide member has upper and lower boundaries. A mass of birefringent material is disposed proximal to the guide member. The birefringent material has molecular dipoles subject to alignment by an imposed electrical field. The birefringent mass is overlapped by the optical field of the propagated light. An upper electrode is disposed in spaced relation to the birefringent mass. A lower electrode is disposed in spaced relation to the guide member. The electrodes have the capability of imposing an alternating current voltage across the birefringent mass to rotate the molecular dipoles of the birefringent mass in a plane defined by the normal to the guide member and the propagation vector of the light. The boundaries and the electrodes define an upper isolation zone between the upper electrode and the upper boundary, a guide path between the boundaries, and a lower isolation zone between the lower boundary and the lower electrode. The guide path has an effective index of refraction greater than the effective indexes of refraction of the isolation zones.

Method Of Forming Optical Light Guides Through Silicon

US Patent:
5431775, Jul 11, 1995
Filed:
Jul 29, 1994
Appl. No.:
8/282677
Inventors:
Eric T. Prince - Fairport NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
H01L 21302
US Classification:
216 24
Abstract:
A method of forming optical light guides through silicon is disclosed wherein such light guides extend from a first (or front) surface along a preferred crystallographic direction to a second (or back) surface.

Method Of Forming And Aligning Patterns In Deposted Overlaying On Gaas

US Patent:
5185293, Feb 9, 1993
Filed:
Apr 10, 1992
Appl. No.:
7/866716
Inventors:
Hans G. Franke - Hilton NY
Eric T. Prince - Fairport NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
H01L 21283
H01L 2131
US Classification:
437184
Abstract:
A method is described for forming patterns in deposited overlayers on GaAs and for aligning the formed patterns with etch features produced through dry processing. The deposited overlayers on GaAs are protected during pattern formation and subsequent processing by a durable, process integrable mask of hydrogenated amorphous carbon.

High Durability Mask For Dry Etch Processing Of Gaas

US Patent:
5378316, Jan 3, 1995
Filed:
Jan 7, 1993
Appl. No.:
8/001432
Inventors:
Eric T. Prince - Fairport NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
H01L 2100
US Classification:
1566591
Abstract:
A mask is described which enables the fabrication of features in GaAs such as waveguides, channels, facets, mesas, and mirrors by dry etch processing in chlorine containing ambients. The mask consists of an amorphous form of carbon which may contain incorporated hydrogen. The mask can be applied, patterned and removed through dry processing techniques.

Method To Reduce Light Propagation Losses In Optical Glasses And Optical Waveguide Fabricated By Same

US Patent:
5235662, Aug 10, 1993
Filed:
Jan 2, 1992
Appl. No.:
7/815779
Inventors:
Eric T. Prince - Fairport NY
Sebastian F. Prospero - Byron NY
Mark M. Romach - Rochester NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
G02B 600
C03B 2500
C03C 300
US Classification:
385129
Abstract:
The present invention provides a method of annealing optical glass layers, said method comprising the step of heating glass layers having an area greater than 0. 01 cm. sup. 2 to a temperature of between about 350 deg. C. and 1000 deg. C. in less than 10 minutes. The upper limit of the glass area that can be treated is limited only by the size of the quartz chamber. Current state-of-the-art chambers can accomodate glass areas of about 0. 01 cm. sup. 2 to about 324 cm. sup. 2. According to another aspect of the invention, there is also provided an optical waveguide glass layer, treated according to the method of this invention, disposed on an integrated optical device.

Method For Patterning Multilayer Dielectric Color Filter

US Patent:
5510215, Apr 23, 1996
Filed:
Jan 25, 1995
Appl. No.:
8/378211
Inventors:
Eric T. Prince - Fairport NY
Michael J. Hanrahan - Hilton NY
Sharlene A. Wilson - Seneca Falls NY
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
G03F 900
US Classification:
430 7
Abstract:
A method of patterning a multilayer, dielectric color filter is described. The method includes depositing a multilayer, dielectric color filter on a substrate having top, bottom and multiple intermediate layers; and applying a patternable mask onto the top layer to provide selected openings through the mask. The method further includes removing the top layer through the selected openings in the patterned mask using a first dry etch, the patterned mask and the multiple intermediate layers of the filter being resistant to this first dry etch, to provide openings to the multiple intermediate layers of the filter. It is a feature of the invention to remove the patterned mask using a second dry etch, the top layer and multiple intermediate layers of the filter being resistant to this second dry etch; and to remove through the openings in the top layer the multiple intermediate layers of the filter, down to the bottom layer, using a third dry etch, the top layer and bottom layer being resistant to this third dry etch.

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.