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Eric M Walstra Deceased2612 Fruitwood Ct, Waterford, MI 48329

Related to:
Javonie Barnes 24 Shaun R Williams 36 Welisa Williams 63

Eric Walstra Phones & Addresses

2612 Fruitwood Ct, Waterford, MI 48329    248-6181313   

2612 Fruitwood Ct APT 165, Waterford, MI 48329    248-7391153   

Waterford Township, MI   

5581 Parview Dr, Clarkston, MI 48346    248-6255796   

146 River St, Elk Rapids, MI 49629    231-2648640   

Oakland, MI   

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Publications & IP owners

Us Patents

Method For Precisely Measuring Position Of A Part To Be Inspected At A Part Inspection Station

US Patent:
7796278, Sep 14, 2010
Filed:
Sep 19, 2008
Appl. No.:
12/233821
Inventors:
John D. Spalding - Ann Arbor MI, US
Eric M. Walstra - Clarkston MI, US
Assignee:
GII Acquisition, LLC - Davisburg MI
International Classification:
G01B 11/04
G01B 11/08
G01M 1/00
US Classification:
356639, 356638, 356608, 356 513, 3562431, 250216, 2502081, 2502221
Abstract:
A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is within the acceptable range of geometric values.

Method And System For Optically Inspecting Parts

US Patent:
8390826, Mar 5, 2013
Filed:
Apr 20, 2011
Appl. No.:
13/090314
Inventors:
Eric M. Walstra - Waterford MI, US
Assignee:
GII Acquisition, LLC - Davisburg MI
International Classification:
G01B 11/14
G01B 11/08
US Classification:
356625, 356638, 356639, 356640
Abstract:
A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance.

Possible Relatives

Dan Walstra  Robert R Walstra  Eric N Johnson  Eric Stamps  Eric P Stander  Eric E Standifer  Eric Johnston  Eric A Standridge  Eric Stanek  Eric B Stanfield 

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