BackgroundCheck.run
Search For

Frederick S Chang, 443965 Tynebourne Cir, San Diego, CA 92130

Known as:
Frederick Sung Chang
Related to:
Chea Yo Chang 55 Ronald Chang 39

Frederick Chang Phones & Addresses

San Diego, CA   

Cambridge, MA   

155 Summer St APT 12, Somerville, MA 02143   

New Haven, CT   

Orange, CA   

Berkeley, CA   

Work

Company: Bayside community church Address: 1401 Beach Park Blvd, San Mateo, CA 94404 Phones: 650-3458992 Position: Religious leader Industries: Religious Organizations
Get Report
Control this profile

Mentions for Frederick S Chang

Career records & work history

Lawyers & Attorneys

Frederick Chang Photo 1

Frederick Chang - Lawyer

Address:
Fenxun Partners
380-1204100 (Office)
Licenses:
New York - Due to reregister within 30 days of birthday 1987
Education:
Columbia University School of Law
Specialties:
Insurance - 34%
Corporate / Incorporation - 33%
Securities / Investment Fraud - 33%
Frederick Chang Photo 2

Frederick L Chang, Aliso Viejo CA - Lawyer

Address:
45 Enterprise, Aliso Viejo, CA 92656
949-4207332 (Office)
Licenses:
California - Active 2001
Education:
University of California at Los Angeles School of Law
University of Southern California Law School
Frederick Chang Photo 3

Frederick Chang - Lawyer

Specialties:
General Practice, Taxation
ISLN:
1000633342
Admitted:
2010
Frederick Chang Photo 4

Frederick Chang - Lawyer

ISLN:
1000343606
Admitted:
2018

Frederick Chang resumes & CV records

Resumes

Frederick Chang Photo 34

Senior Data Scientist

Location:
San Diego, CA
Industry:
Pharmaceuticals
Work:
Janssen Inc.
Senior Data Scientist Harvard University
Graduate Research Assistant - Nancy Kleckner Laboratory Harvard Medical School Sep 2008 - Jul 2010
Research Assistant - Jeremy Gunawardena Laboratory Uc Berkeley College of Engineering Aug 2007 - Jul 2008
Research Assistant - Jhih-Wei Chu Laboratory
Education:
Harvard University 2012 - 2018
Doctorates, Doctor of Philosophy, Biology, Engineering, Philosophy Harvard University 2010 - 2012
Master of Science, Masters, Biology, Engineering University of California, Berkeley 2008
Bachelors, Bachelor of Science, Electrical Engineering, Electrical Engineering and Computer Science, Computer Science
Skills:
Statistics, Fluorescence Microscopy, Data Analysis, Cell Biology, Data Visualization, Molecular Biology, Super Resolution, Matlab, Signal Processing, Biological Systems Modeling, Optics, Instrumentation, Microfluidics, Mathematica, Processing, Lisp, C, Assembly, Java, Micromanager, Molecular Dynamics, Mixed Circuit Pcb Design, Microcontrollers, Dna Cloning, Dna Design, Dna Transformation, Pcr, Dna Purification, Rna Purification, Protein Purification, Tissue Culture, Western Blot, Southern Blot, Phospho Transfer Profiling, Life Sciences, Research, Science, Cell Culture, Biochemistry, Image Processing, Latex, Teaching, Microscopy, Confocal Microscopy, Molecular Cloning, Genetics, Biotechnology, Bioinformatics
Frederick Chang Photo 35

Owner

Location:
10021 Ky Lime Dr, Venice, FL
Industry:
Professional Training & Coaching
Work:
Tallyho International
Owner

Publications & IP owners

Us Patents

Pattern Detection At Low Signal-To-Noise Ratio

US Patent:
2018032, Nov 15, 2018
Filed:
Aug 31, 2016
Appl. No.:
15/757883
Inventors:
- Cambridge MA, US
Frederick S. Chang - Cambridge MA, US
International Classification:
G02B 27/58
G02B 21/16
G06K 9/00
G06K 9/62
G06T 5/00
G01N 21/64
Abstract:
Methods and systems for detecting and characterizing a pattern (or patterns) of interest in a low signal-to-noise ratio (SNR) data set are disclosed. One method is a two-stage Likelihood pipeline analysis that takes advantage of the benefits of a full Likelihood analysis while providing computational tractability. The two-stage pipeline may include a first stage including the application of approximate Likelihood functions in which one or more of the following assumptions or modifications may be applied: (i) the pattern of interest and background are at a specified position in a segment of the data set under examination; (ii) the SNR is low; and (iii) measurement noise can be represented in such a form that all non-position parameters of the representation are linear with respect to the derivative of the Log Likelihood versus lambda. The second stage may include a full Likelihood analysis.

Possible Relatives

Cynthia L Chang  David Chang  Dean A Chang  Deanna T Chang  Deborah Chang  Dana M Chang  Frederick C Last  Frederick W Johnson  Frederick L Stancil 

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.