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Thanh T Ha, 512041 Bikini Ave, San Jose, CA 95122

Thanh Ha Phones & Addresses

2041 Bikini Ave, San Jose, CA 95122   

Sacramento, CA   

San Francisco, CA   

Bartlett, IL   

Seattle, WA   

Mentions for Thanh T Ha

Career records & work history

Medicine Doctors

Thanh Ha Photo 1

Thanh T Ha

Specialties:
Anatomic Pathology & Clinical Pathology

License Records

Thanh P Ha

Licenses:
License #: 3086941 - Expired
Issued Date: Aug 22, 2013
Expiration Date: Mar 3, 2017
Type: Manicurist Type 3

Thanh Ha resumes & CV records

Resumes

Thanh Ha Photo 47

Web Master

Location:
Sacramento, CA
Industry:
Public Safety
Work:
State of California
Web Master
Education:
California State University - Sacramento 2009 - 2011
Masters, Master of International Studies, Business
California State University - Sacramento 2009 - 2011
Bachelors, Management
Skills:
Information Systems Analyst, Systems Analyst, Web Development, Project Manager, Specialist, Management Systems Consultant, Support Analyst, Information Systems Specialist, Database Administrator, Html, End User Consultant, Administrator, Software Specialist, E Commerce Systems Developer, Business Analyst, Developer, It Specialist, Web Developer, Designer, Communications Analyst, Css, Business Applications Programmer, Databases
Languages:
Vietnamese
Certifications:
Sharepoint 2010 Developer
Thanh Ha Photo 48

Senior Consultant And Founder

Industry:
Management Consulting
Work:
Th Consulting
Senior Consultant and Founder
Thanh Ha Photo 49

Thanh H Ha

Location:
12333 west Sheridan St, Avondale, AZ 85392
Industry:
Aviation & Aerospace
Work:
Suntron Corporation
Test Engineer
Interests:
Music
Kids
Movies
Electronics
Languages:
Vietnamese
Thanh Ha Photo 50

Senior Accountant And Stock Plan Administrator

Location:
San Francisco, CA
Industry:
Accounting
Work:
Integrated Silicon Solution
Senior Accountant and Stock Plan Administrator
Thanh Ha Photo 51

Loan Originator

Location:
San Francisco, CA
Industry:
Financial Services
Work:
Kaplan 2004 - 2005
Instructor
University of Pittsburgh 2000 - 2004
Student Researcher
World Leadership Group 2000 - 2004
Loan Originator
Thanh Ha Photo 52

Associate

Location:
San Francisco, CA
Industry:
Real Estate
Work:
World Leadership Group
Associate
Thanh Ha Photo 53

Senior Ai Engineer

Location:
San Francisco, CA
Industry:
Electrical/Electronic Manufacturing
Work:
Midea
Senior Ai Engineer
Kla-Tencor 2010 - 2018
Staff Computer Vision Algorithm Engineer
Qualcomm Jul 2010 - Oct 2010
Internship
Purdue University Jan 2006 - Jul 2010
Research Assistant
Education:
Purdue University 2005 - 2010
Doctorates, Doctor of Philosophy, Computer Engineering
Skills:
Image Processing, C++, Pattern Recognition, Algorithms, Computer Vision, Color Management, Signal Processing, Matlab, Machine Learning, 3D Imaging, Defect Detection, Semiconductors, Python, Linux, Deep Learning, Tensorflow
Thanh Ha Photo 54

Thanh Ha

Location:
San Jose, CA
Industry:
Hospital & Health Care
Education:
Carrington College California 2010 - 2011
Monterey Peninsula College 2006 - 2009
Seaside High School 2002 - 2006
Skills:
Answering Phone Calls, Data Entry, Cpr Certified, Injection, Medical Terminology, Electrocardiogram, Vital Signs, Human Anatomy, Patient Education, Microsoft Office, Phlebotomy, Editing, Handled Incoming, Customer Service, Scheduled Appointments, Obtaining Patient Intake, Handled New, Typing 55+ Words Per, Prime Clinical, Ekg, Maintaining Medical, Setting Up Injection
Languages:
English
Vietnamese

Publications & IP owners

Us Patents

Magnetic Recording Medium With Protective Barrier Layer

US Patent:
6340521, Jan 22, 2002
Filed:
Nov 9, 1999
Appl. No.:
09/436495
Inventors:
Phuong Nguyen - Milpitas CA
Thanh Ha - San Jose CA
Elsie Yang Chuang - Cupertino CA
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
G11B 572
US Classification:
428336, 428408, 428694 TC, 428694 TP, 428689, 428702, 428900, 427131, 20419215, 20419216
Abstract:
A magnetic medium is formed with a barrier layer between the magnetic layer and protective overcoat to prevent degradation of magnetic properties during deposition of the protective overcoat due to poisoning effects by reactive gases on the magnetic layer. Embodiments include sputter depositing a Cr or Cr alloy barrier layer, having a thickness of about 5 to about 25 , on a magnetic layer and sputter depositing a protective overcoat containing carbon and nitrogen on the barrier layer in a nitrogen-containing environment.

Magnetic Recording Media Having Five Element Alloy Deposited Using Pulsed Direct Current Sputtering

US Patent:
7504166, Mar 17, 2009
Filed:
May 27, 2004
Appl. No.:
10/856209
Inventors:
Charles Changqing Chen - Milpitas CA, US
Thanh Thien Ha - San Jose CA, US
Abebe Hailu - San Jose CA, US
Taesun Ernest Kim - San Jose CA, US
Mariana Rodica Munteanu - Santa Clara CA, US
Steve Kuo-Hsing Hwang - San Jose CA, US
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
G11B 5/66
US Classification:
428827
Abstract:
CoCrPtB is a conventional material used in some of the layers of a thin film magnetic media structure used for recording data in data storage devices such as hard drives. Typically the CoCrPtB layers used for magnetic media have high Cr and low B in bottom magnetic layers and low Cr and high B in top magnetic layers. In accordance with one embodiment of this invention and to improve media electrical performance, fifth elements, such as Ta, Nb and Hf, etc. were added to the CoCrPtB materials, resulting in CoCrPtB—X, to enhance the grain segregation. The five element CoCrPtB—X layers were deposited using a pulsed direct current sputter technique instead of conventional direct current sputtering techniques. The resulting magnetic media structure having CoCrPtB—X alloy layers exhibits an increase in coercivity Hc and improvement in recording performance.

Magnetic Recording Media Having Five Element Alloy Deposited Using Pulsed Direct Current Sputtering

US Patent:
2009021, Aug 27, 2009
Filed:
Feb 24, 2009
Appl. No.:
12/391938
Inventors:
Charles Changqing Chen - Milpitas CA, US
Thanh Thien Ha - San Jose CA, US
Abebe Hailu - San Jose CA, US
Taesun Ernest Kim - San Jose CA, US
Mariana Rodica Munteanu - Santa Clara CA, US
Steve Kuo-Hsing Hwang - San Jose CA, US
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
C23C 14/34
US Classification:
20419215
Abstract:
CoCrPtB is a conventional material used in some of the layers of a thin film magnetic media structure used for recording data in data storage devices such as hard drives. Typically the CoCrPtB layers used for magnetic media have high Cr and low B in bottom magnetic layers and low Cr and high B in top magnetic layers. In accordance with one embodiment of this invention and to improve media electrical performance, fifth elements, such as Ta, Nb and Hf, etc. were added to the CoCrPtB materials, resulting in CoCrPtB-X, to enhance the grain segregation. The five element CoCrPtB-X layers were deposited using a pulsed direct current sputter technique instead of conventional direct current sputtering techniques. The resulting magnetic media structure having CoCrPtB-X alloy layers exhibits an increase in coercivity Hc and improvement in recording performance.

Inline Interlayer Heater Apparatus

US Patent:
2010000, Jan 14, 2010
Filed:
Jul 8, 2008
Appl. No.:
12/169154
Inventors:
Thomas Larson Greenberg - Berkeley CA, US
Thanh Thien Ha - San Jose CA, US
Larry Douglas Monroe - Hollister CA, US
Sam Vi Luong - San Jose CA, US
Chinh Thien Dao - San Jose CA, US
Hung Tuan Nguyen - San Jose CA, US
Assignee:
Seagate Technology LLC - Scotts Valley CA
International Classification:
C23C 14/00
US Classification:
20419212, 20429809
Abstract:
An apparatus for making a magnetic recording medium, including a quartz lamp within a sputtering chamber to heat the medium between the application of layers and without disruption to the vacuum integrity of the sputtering system. A process using the apparatus for manufacturing the magnetic recording medium is also claimed.

Magnetic Thin Film Medium With Adhesion Enhancement Layer

US Patent:
6139981, Oct 31, 2000
Filed:
Sep 14, 1998
Appl. No.:
9/152324
Inventors:
Elsie Yang Chuang - Saratoga CA
Phuong Nguyen - Milpitas CA
Qixu David Chen - Milpitas CA
Xing Song - Fremont CA
Charles Leu - Fremont CA
Thanh Thien Ha - San Jose CA
Assignee:
Seagate Technology, Inc. - Scotts Valley CA
International Classification:
G11B 566
US Classification:
428694T
Abstract:
Adhesion between a deposited seed layer, e. g. , a sputter-deposited NiP seed layer, on an alternate substrate, such as a glass, ceramic or glass-ceramic substrate, is significantly enhanced by depositing a chromium or chromium-alloy adhesion enhancement film between the substrate and seed layer. Magnetic recording media comprising a surface-oxidized NiP seed layer and chromium adhesion enhancement film exhibit low media noise and are suitable for high density longitudinal magnetic recording.

Method And System For Controlling Machines Based On Object Recognition

US Patent:
2021014, May 13, 2021
Filed:
Nov 11, 2019
Appl. No.:
16/680347
Inventors:
- Foshan, CN
Thanh Huy Ha - Milpitas CA, US
Zhicai Ou - San Jose CA, US
International Classification:
G06K 9/62
G06K 9/46
G06N 3/08
G06N 3/04
Abstract:
A method includes: capturing one or more images of an unorganized collection of items inside a first machine; determining one or more item types of the unorganized collection of items from the one or more images, comprising: dividing a respective image in the one or more images into a respective plurality of sub-regions; performing feature detection on the respective plurality of sub-regions to obtain a respective plurality of regional feature vectors, wherein a regional feature vector for a sub-region indicates characteristics for a plurality of predefined local item features for the sub-region; generating an integrated feature vector by combining the respective plurality of regional feature vectors; and applying a plurality of binary classifiers to the integrated feature vector; and selecting a machine setting for the first machine based on the determined one or more clothes type in the unorganized collection of items.

Automated Pattern Fidelity Measurement Plan Generation

US Patent:
2019020, Jul 4, 2019
Filed:
Mar 7, 2019
Appl. No.:
16/296132
Inventors:
- Milpitas CA, US
Ajay Gupta - Cupertino CA, US
Thanh Huy Ha - Milpitas CA, US
International Classification:
G01N 21/88
G01N 23/00
G03F 7/20
G01N 21/95
Abstract:
Methods and systems for determining parameter(s) of a metrology process to be performed on a specimen are provided. One system includes one or more computer subsystems configured for automatically generating regions of interest (Rats) to be measured during a metrology process performed for the specimen with the measurement subsystem based on a design for the specimen. The computer subsystem(s) are also configured for automatically determining parameter(s) of measurement(s) performed in first and second subsets of the ROIs during the metrology process with the measurement subsystem based on portions of the design for the specimen located in the first and second subsets of the ROIs, respectively. The parameter(s) of the measurement(s) performed in the first subset are determined separately and independently of the parameter(s) of the measurement(s) performed in the second subset.

Scanning Electron Microscope Objective Lens Calibration

US Patent:
2019000, Jan 3, 2019
Filed:
Aug 9, 2017
Appl. No.:
15/672797
Inventors:
- Milpitas CA, US
Christopher Sears - San Jose CA, US
Hedong Yang - Santa Clara CA, US
Thanh Ha - Milpitas CA, US
Jianwei Wang - San Jose CA, US
Huina Xu - San Jose CA, US
International Classification:
G02B 21/00
H01J 37/22
H01J 37/30
G06N 3/08
Abstract:
Objective lens alignment of a scanning electron microscope review tool with fewer image acquisitions can be obtained using the disclosed techniques and systems. Two different X-Y voltage pairs for the scanning electron microscope can be determined based on images. A second image based on the first X-Y voltage pair can be used to determine a second X-Y voltage pair. The X-Y voltage pairs can be applied at the Q4 lens or other optical components of the scanning electron microscope.

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