Abu Hassan resumes & CV records
Resumes
Abu Hassan
Hse Manager At Sime Darby Engineering (M) Sdn Bhd
Location:
United States
Industry:
Oil & Energy
Abu S Hassan, 64Muttontown, NY
Abu Hassan Phones & Addresses
Oyster Bay, NY
East Meadow, NY
3323 Falls Creek Ct, San Jose, CA 95135 408-2701035
3585 Sandpebble Dr, San Jose, CA 95136 408-2645255
15770 82Nd Ave, Portland, OR 97224 503-6206980
Tigard, OR
Tualatin, OR
Mentions for Abu S Hassan
Publications & IP owners
Wikipedia
Abu Hassan
…Fatima returns with the presents from Zobeide. Abu Hassan now goes to visit the Caliph, intending to try a similar story about his wife and get money from him. While he is out, Omar reappears and demands a kiss from Fatima, but Abu Hassan returns. Omar hides in an adjoining room, and the hus...
Us Patents
Method And Apparatus For At-Speed Testing Of Digital Circuits
US Patent:
7437636, Oct 14, 2008
Filed:
Nov 1, 2005
Appl. No.:
11/265488
Inventors:
Janusz Rajski - West Linn OR, US
Abu Hassan - San Jose CA, US
Robert Thompson - Tualatin OR, US
Nagesh Tamarapalli - Wilsonville OR, US
Abu Hassan - San Jose CA, US
Robert Thompson - Tualatin OR, US
Nagesh Tamarapalli - Wilsonville OR, US
International Classification:
G01R 31/28
G06F 11/00
G06F 1/04
G06F 11/00
G06F 1/04
US Classification:
714726, 714 30, 713503
Abstract:
Exemplary schemes for multi-frequency at-speed logic Built-In Self Test (BIST) are provided. For example, certain schemes allow at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. Some of the disclosed schemes are also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. In particular embodiments, the loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. In certain embodiments, only the capture cycle is performed at the corresponding system timing. In some embodiments, a programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
Method And Apparatus For At-Speed Testing Of Digital Circuits
US Patent:
2003009, May 22, 2003
Filed:
Nov 20, 2002
Appl. No.:
10/301127
Inventors:
Janusz Rajski - West Linn OR, US
Abu Hassan - San Jose CA, US
Robert Thompson - Tualatin OR, US
Nagesh Tamarapalli - Wilsonville OR, US
Abu Hassan - San Jose CA, US
Robert Thompson - Tualatin OR, US
Nagesh Tamarapalli - Wilsonville OR, US
Assignee:
Mentor Graphics Corporation
International Classification:
H02H003/05
US Classification:
714/030000
Abstract:
A scheme for multi-frequency at-speed logic Built-In Self Test (BIST) is provided. This scheme allows at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. The scheme is also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-Random Pattern Generator (PRPG) and Multi-input Signature Register (MISR) work at slower frequency than the fastest clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and skew constraints on scan enable signal design. Only the capture cycle is performed at the corresponding system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.