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Hoon Sook Lee, 66North Sudbury, MA

Hoon Lee Phones & Addresses

Sudbury, MA   

Irvine, CA   

Chicago, IL   

Santa Ana, CA   

Sachse, TX   

Euless, TX   

Colton, TX   

Work

Company: Corning Incorporated Address:

Languages

English

Mentions for Hoon Sook Lee

Career records & work history

Lawyers & Attorneys

Hoon Lee Photo 1

Hoon Lee - Lawyer

Address:
Kim & Chang
Licenses:
New York - Currently registered 2001
Education:
University of Michigan Law School
Hoon Lee Photo 2

Hoon Lee - Lawyer

Address:
Jipyong Jisung
262-001851x (Office)
Licenses:
New York - Currently registered 1998
Education:
Syracuse
Hoon Lee Photo 3

Hoon Lee - Lawyer

Office:
Corning Incorporated
Specialties:
Banking & Finance, Private Equity, Real Estate & Hotels, Tax, Mergers & Acquisitions, Funds, Real Estate Tax, Securitization & Structured Finance, Supply Chain Tax Planning, Tax for M&A and Reorganizations
ISLN:
915191602
Admitted:
2001
University:
Harvard University, B.A., 1996; Harvard University, A.B., 1996
Law School:
University of Michigan, J.D., 2000

Medicine Doctors

Hoon Lee Photo 4

Hoon B Lee, Wilmette IL

Specialties:
Acupuncture
Address:
3207 Lake Ave Suite 9B, Wilmette, IL 60091
847-9209815 (Phone)
Languages:
English

Hoon K. Lee

Specialties:
Radiation Oncology
Work:
Regional Radiology
360 Bard Ave, Staten Island, NY 10310
718-8762000 (phone) 718-8762012 (fax)
Site
Education:
Medical School
George Washington University School of Medicine and Health Science
Graduated: 1999
Conditions:
Breast Neoplasm, Malignant, Fractures, Dislocations, Derangement, and Sprains, Hyperthyroidism, Malignant Neoplasm of Female Breast, Melanoma, Skin Cancer, Thyroid Cancer
Languages:
English, Spanish
Description:
Dr. Lee graduated from the George Washington University School of Medicine and Health Science in 1999. He works in Staten Island, NY and specializes in Radiation Oncology. Dr. Lee is affiliated with Richmond University Medical Center.

Hoon Lee resumes & CV records

Resumes

Hoon Lee Photo 51

Experienced Semiconductor Design And Development Engineer And Manager In Rf/Mixed/Analog/Power Semiconductors.

Position:
Chief Design Engineer at Semicoa
Location:
Orange County, California Area
Industry:
Electrical/Electronic Manufacturing
Work:
Semicoa - Orange County, California Area since Oct 2009
Chief Design Engineer
Hoon Lee Photo 52

Owner, Jinza Teriyaki

Position:
Owner at Jinza Teriyaki
Location:
Pomona, California
Industry:
Restaurants
Work:
Jinza Teriyaki since Aug 2006
Owner
Education:
California State University-Fullerton 1999 - 2003
Bachelor of Science, Biology
Languages:
English
Korean
Hoon Lee Photo 53

Hoon Lee

Location:
United States
Hoon Lee Photo 54

Hoon Lee

Location:
Estados Unidos
Hoon Lee Photo 55

Senior Debt Consultant At Debtmerica Llc

Position:
Senior Debt Consultant at Debtmerica LLC
Location:
Greater Los Angeles Area
Industry:
Financial Services
Work:
Debtmerica LLC
Senior Debt Consultant
Hoon Lee Photo 56

Hoon Lee

Location:
United States

Publications & IP owners

Us Patents

Direct Modulator For Shift Keying Modulation

US Patent:
7109805, Sep 19, 2006
Filed:
Jul 29, 2004
Appl. No.:
10/902746
Inventors:
Hoon Lee - Irvine CA, US
Akbar Ali - Garden Grove CA, US
Assignee:
Skyworks Solutions, Inc. - Irvine CA
International Classification:
H03L 7/00
H03C 3/06
H03M 3/00
US Classification:
331 23, 332128, 341143
Abstract:
A system for direct modulation is disclosed. Embodiments of the direct modulator for shift-keying modulation include impressing baseband data on a radio frequency (RF) signal at an oscillator by controlling a digital divider using a sigma-delta modulator.

Circuit And Method For Digital Phase-Frequency Error Detection

US Patent:
7332973, Feb 19, 2008
Filed:
Nov 2, 2005
Appl. No.:
11/265442
Inventors:
Hoon Lee - Irvine CA, US
Tirdad Sowlati - Irvine CA, US
Assignee:
Skyworks Solutions, Inc. - Woburn MA
International Classification:
H03L 7/089
H03L 7/097
US Classification:
331 25, 327 12, 327156
Abstract:
A time-to-digital converter comprises a ring oscillator, a counter, an encoder, and a multi-bit latch. The ring oscillator comprises a first input and a clock input, as well as, a first output responsive to a single cycle of the ring oscillator and a second output responsive to a signal applied at the first input. A counter coupled to the first output generates a first binary word. An encoder coupled to the second output generates a second binary word. The multi-bit latch receives the first and second binary words and generates a composite representation of a phase-frequency error signal. The time-to-digital converter is well suited for digital phase-locked loops used in communications applications and digital phase-locked loops in electromechanical control systems that require high-precision phase-frequency error detection.

Voltage-Controlled Oscillator Gain Calibration For Two-Point Modulation In A Phase-Locked Loop

US Patent:
7612617, Nov 3, 2009
Filed:
Mar 1, 2008
Appl. No.:
12/040875
Inventors:
Rajasekhar Pullela - Colton CA, US
Morten Damgaard - Laguna Hills CA, US
Shahrzad Tadjpour - Irvine CA, US
John E. Vasa - Irvine CA, US
Hoon Lee - Irvine CA, US
Assignee:
Skyworks Solutions, Inc. - Woburn MA
International Classification:
H03L 7/099
H03L 7/18
US Classification:
331 16, 331 17, 331 25, 331 44, 375376
Abstract:
A phase-locked loop (PLL) is arranged to receive high-pass data at a first input and low-pass data at a second input. A first digital input is coupled to a primary path through a digital-to-analog converter (DAC) and a second digital input is coupled to a feedback path of the PLL. The controller provides the first input and the second input during a calibration procedure. The controller adjusts first and second control inputs in an attempt to keep the input voltage to a voltage-controlled oscillator (VCO) in the PLL constant while determining the gain of the VCO in Hz/LSB.

Metal Dendrite-Free Solar Cell

US Patent:
2013024, Sep 19, 2013
Filed:
Mar 18, 2012
Appl. No.:
13/423231
Inventors:
Xiaobo Zhang - Arcadia CA, US
Vincent A. Lim - Los Angeles CA, US
Hoon H. Lee - Valencia CA, US
John P. Serra - Camarillo CA, US
Uming T. Jeng - Rosemead CA, US
Steven M. Bunyan - Porter Ranch CA, US
Julie J. Hoskin - Santa Monica CA, US
Kent E. Barbour - Simi Valley CA, US
Dimitri D. Krut - Encino CA, US
Assignee:
The Boeing Company - Chicago IL
International Classification:
H01L 31/05
H01L 31/0224
US Classification:
136244, 136256
Abstract:
A solar cell assembly including a semiconductor wafer having a solar cell portion and a wing portion, wherein the wing portion is electrically isolated from the solar cell portion, and an electrical contact material positioned on the solar cell portion, wherein the wing portion is substantially free of the electrical contact material.

Metal Dendrite-Free Solar Cell

US Patent:
2019014, May 16, 2019
Filed:
Jan 16, 2019
Appl. No.:
16/249015
Inventors:
- Chicago IL, US
Vincent A. Lim - Los Angeles CA, US
Hoon H. Lee - Valencia CA, US
John P. Serra - Camarillo CA, US
Uming T. Jeng - Rosemead CA, US
Steven M. Bunyan - Northridge CA, US
Julie J. Hoskin - Santa Monica CA, US
Kent E. Barbour - Simi Valley CA, US
Dimitri D. Krut - Encino CA, US
Assignee:
The Boeing Company - Chicago IL
International Classification:
H01L 31/0224
H01L 31/068
H01L 31/05
H01L 31/0475
H01L 31/18
Abstract:
A method for forming a solar cell including steps of (1) providing a semiconductor wafer having an upper surface; (2) applying an electrical contact material to the upper surface, the electrical contact material forming an electrically conductive grid that includes grid lines extending from a bus bar; (3) forming an isolation channel in the semiconductor wafer to define a solar cell portion and a wing portion, wherein the wing portion is electrically isolated from the solar cell portion, and wherein the wing portion is substantially free of the electrical contact material; (4) submerging the semiconductor wafer in a solvent, wherein formation of metal dendrites on the grid lines of the electrically conductive grid is inhibited; and (5) separating the solar cell portion from the wing portion.

Metal Dendrite-Free Solar Cell

US Patent:
2017022, Aug 3, 2017
Filed:
Apr 17, 2017
Appl. No.:
15/488618
Inventors:
- Chicago IL, US
Vincent A. Lim - Los Angeles CA, US
Hoon H. Lee - Valencia CA, US
John P. Serra - Camarillo CA, US
Uming T. Jeng - Rosemead CA, US
Steven M. Bunyan - Northridge CA, US
Julie J. Hoskin - Santa Monica CA, US
Kent E. Barbour - Simi Valley CA, US
Dimitri D. Krut - Encino CA, US
Assignee:
The Boeing Company - Chicago IL
International Classification:
H01L 31/0224
H01L 31/05
H01L 31/18
H01L 31/068
H01L 31/0475
Abstract:
A method for forming a solar cell including steps of (1) providing a semiconductor wafer having an upper surface; (2) applying an electrical contact material to the upper surface, the electrical contact material forming an electrically conductive grid that includes grid lines extending from a bus bar; (3) forming an isolation channel in the semiconductor wafer to define a solar cell portion and a wing portion, wherein the wing portion is electrically isolated from the solar cell portion, and wherein the wing portion is substantially free of the electrical contact material; (4) submerging the semiconductor wafer in a solvent, wherein formation of metal dendrites on the grid lines of the electrically conductive grid is inhibited; and (5) separating the solar cell portion from the wing portion.

Dynamic Frequency Selection Channel Scan Optimizations

US Patent:
2017009, Mar 30, 2017
Filed:
Sep 25, 2015
Appl. No.:
14/866595
Inventors:
- San Diego CA, US
Michael Richard Green - Needham MA, US
Alireza Raissinia - Monte Sereno CA, US
Srinivas Katar - Fremont CA, US
Hoon Ki Lee - San Jose CA, US
International Classification:
H04W 28/06
H04L 12/801
Abstract:
Methods, systems, and apparatuses are described for adaptive dwell time for scan procedures. A wireless station (STA) may identify a scan period during which a passive scan procedure is performed on a first channel. The STA may analyze a channel congestion metric during at least a portion of the scan period. The STA may transition from the passive scan procedure to an active scan procedure on the first channel during the scan period based at least in part on the analyzed channel congestion metric.

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