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Tony S Huang, 737044 Falling Water Ln, Plano, TX 75024

Tony Huang Phones & Addresses

7044 Falling Water Ln, Plano, TX 75024    214-4692260    972-4077763   

4204 Mildenhall Dr, Plano, TX 75093    972-3983122    972-6125691    972-6127310   

Richardson, TX   

Garland, TX   

6618 La Manga Dr, Dallas, TX 75248    972-2506655   

Rockwall, TX   

Washington, DC   

Selinsgrove, PA   

Allentown, PA   

San Jose, CA   

Mentions for Tony S Huang

Career records & work history

Medicine Doctors

Tony T. Huang

Specialties:
Obstetrics & Gynecology, Dermatology
Work:
Tony T Huang MD
40 W Palisade Ave STE 208, Englewood, NJ 07631
201-5688888 (phone) 201-5683888 (fax)
Education:
Medical School
Mount Sinai School of Medicine
Graduated: 1987
Conditions:
Abnormal Vaginal Bleeding, Breast Disorders, Conditions of Pregnancy and Delivery, Herpes Genitalis, Menopausal and Postmenopausal Disorders
Languages:
Chinese, English, Spanish
Description:
Dr. Huang graduated from the Mount Sinai School of Medicine in 1987. He works in Englewood, NJ and specializes in Obstetrics & Gynecology and Dermatology. Dr. Huang is affiliated with Hackensack University Medical Center.

Publications & IP owners

Us Patents

Trench Devices Having Improved Breakdown Voltages And Method For Manufacturing Same

US Patent:
8314471, Nov 20, 2012
Filed:
Nov 17, 2009
Appl. No.:
12/620473
Inventors:
Chiao-Shun Chuang - Kaohsiung, TW
Tony Huang - Plano TX, US
Assignee:
Diodes Incorporated - Plano TX
International Classification:
H01L 29/02
US Classification:
257488, 257496, 257E29009, 257E29011, 257330, 257334, 257E2141, 257E29262, 257E21655, 438270, 438259
Abstract:
In one embodiment, the present invention includes a semiconductor power device. The semiconductor power device comprises a trenched gate and a trenched field region. The trenched gate is disposed vertically within a trench in a semiconductor substrate. The trenched field region is disposed vertically within the trench and below the trenched gate. A lower portion of the trenched field region tapers to disperse an electric field.

Trench Devices Having Improved Breakdown Voltages And Method For Manufacturing Same

US Patent:
2014005, Feb 27, 2014
Filed:
Oct 8, 2012
Appl. No.:
13/646906
Inventors:
Chiao-Shun Chuang - Hsinchu, TW
Tony Huang - Plano TX, US
International Classification:
H01L 29/78
US Classification:
257330
Abstract:
In one embodiment, the present invention includes a semiconductor power device. The semiconductor power device comprises a trenched gate and a trenched field region. The trenched gate is disposed vertically within a trench in a semiconductor substrate. The trenched field, region is disposed vertically within the trench and below the trenched gate. A lower portion of the trenched field region tapers to dispose an electric field.

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