BackgroundCheck.run
Search For

James R Colburn, 60Pembroke Park, FL

James Colburn Phones & Addresses

Hallandale Beach, FL   

Wilkes Barre, PA   

Pittston, PA   

Scranton, PA   

Hallandale, FL   

Mentions for James R Colburn

Career records & work history

License Records

James G Colburn

Licenses:
License #: E041523 - Active
Category: Emergency medical services
Issued Date: Jun 15, 2010
Expiration Date: Jun 30, 2018
Type: Alameda City FD

James Colburn resumes & CV records

Resumes

James Colburn Photo 48

Owner, Fresh Start Recovery Homes, Llc

Position:
Owner at Fresh Start Recovery Homes Inc
Location:
Port Charlotte, Florida
Industry:
Real Estate
Work:
Fresh Start Recovery Homes Inc
Owner
James Colburn Photo 49

Cad Designer/Graphic Artist

Location:
Humble, Texas
Industry:
Design
Work:
Colburns Bar and Nightclub Aug 2009 - Feb 2013
Owner
Education:
San Jacinto College 1997 - 1998
Certificate of Technology, CAD/CADD Drafting and/or Design Technology/Technician
James Colburn Photo 50

James Colburn

Location:
United States
James Colburn Photo 51

James Colburn

Location:
United States
James Colburn Photo 52

James Colburn

Location:
United States
James Colburn Photo 53

James Colburn

Publications & IP owners

Us Patents

Method Of Making Count Probe With Removable Count Wafer

US Patent:
5432992, Jul 18, 1995
Filed:
Dec 23, 1993
Appl. No.:
8/173432
Inventors:
Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
Sangvorn Rutnarak - Long Grove IL
Assignee:
Abbott Laboratories - Abbott Park IL
International Classification:
B23P 1902
US Classification:
29525
Abstract:
A method of making a count probe comprises the following steps. A member is made having a conduit and an opening. A wafer is made including an aperture. The wafer is removably inserted into the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.

Mechanical Capture Of Count Wafer For Particle Analysis

US Patent:
5402062, Mar 28, 1995
Filed:
Dec 23, 1993
Appl. No.:
8/173735
Inventors:
Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
Sangvorn Rutnarak - Long Grove IL
Assignee:
Abbott Laboratories - Abbott Park IL
International Classification:
G01N 1506
G01N 2706
US Classification:
324 714
Abstract:
A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.

Method Of Making Stress Relieved Count Probe

US Patent:
5500992, Mar 26, 1996
Filed:
Mar 20, 1995
Appl. No.:
8/407790
Inventors:
Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
William R. Jones - Hialeah FL
Millard D. Longman - Coral Springs FL
Assignee:
Abbott Laboratories - Abbott Park IL
International Classification:
B23P 1902
US Classification:
29525
Abstract:
A method of making a count probe for counting particles comprises the following steps. A count wafer is formed along with a core member having an opening for accepting the count wafer. The count wafer is applied to the opening in the core member to form an interference fit between the count wafer and the core member. After application of the count wafer to the opening in the core member, the core member is annealed to relieve stress in the core member.

Isbn (Books And Publications)

Trading In Options On Futures

Author:
James T. Colburn
ISBN #:
0136385524

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.