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James W Sharier, 55Georgetown, TX

Known as:
James William Sharier James R Sharier James J Sharier Jennifer K Sharier James Sharrer
Related to:
Angela M Riley 62 Martin Riley 58 Diana Riley 83 Diana M Garcia 56 Megan L Riley 31 Nathaniel L Harper 58

James Sharier Phones & Addresses

Georgetown, TX   

1723 Steeds Xing, Pflugerville, TX 78660    512-2521923   

2416 Drifting Leaf Dr, Cedar Park, TX 78613    512-2197158   

1915 Wells Branch Pkwy, Austin, TX 78728   

Ochelata, OK   

Travis, TX   

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James W Sharier

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Skills

Java • Flex • CSS • Mobile Applications • Database Design • Object Oriented Design • ActionScript • Unit Testing • HTML • Hibernate • J2EE • SQL • UML • User Interface Design • User Experience • XML • Eclipse • JUnit • Java Enterprise Edition • Objective-C • REST

Industries

Computer Software
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James Sharier resumes & CV records

Resumes

James Sharier Photo 13

James Sharier

Location:
Austin, Texas Area
Industry:
Computer Software
Skills:
Java, Flex, CSS, Mobile Applications, Database Design, Object Oriented Design, ActionScript, Unit Testing, HTML, Hibernate, J2EE, SQL, UML, User Interface Design, User Experience, XML, Eclipse, JUnit, Java Enterprise Edition, Objective-C, REST

Publications & IP owners

Us Patents

Statistical Process Control System With Normalized Control Charting

US Patent:
6424876, Jul 23, 2002
Filed:
Jul 22, 1999
Appl. No.:
09/359988
Inventors:
Brian K. Cusson - Austin TX
James Sharier - Pflugerville TX
Justin Giguere - Austin TX
Anatasia Oshelski - Austin TX
Assignee:
Advanced Micro Devices, Inc. - Austin TX
International Classification:
G06F 1900
US Classification:
700108, 700 51, 702183
Abstract:
A method for monitoring the performance of a manufacturing entity is provided. Metrology data indicating an output parameter of the manufacturing entity is retrieved. The output parameter has an associated target value. The metrology data is normalized based on the target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. A manufacturing system includes a metrology tool, a first database, and a processor. The metrology tool is adapted to measure an output parameter of a manufacturing entity to generate metrology data. The output parameter has an associated target value. The first database is adapted to receive the metrology data. The processor is adapted to retrieve the metrology data from the database, normalize the metrology data based on the target value to generate normalized performance data points, and determine a performance rule violation based on the normalized performance data.

Possible Relatives

Jonathan D Sharier  Mark A Sharier  James V Johnson  James C Stamps  James E Stanage  James I Stanaland  James E Stanard  James B Stanaway  James P Stanberry  James F Stanbrough 

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