James Willim Hoo, 71605 Rosario Ave NE, Seattle, WA 98059

4763066, Aug 9, 1988

Sep 23, 1986

6/910483

Paul K. K. Yeung - Bothell WA
Alan D. Howard - Edmonds WA
James W. Hoo - Seattle WA
James L. Pennock - Seattle WA

Huntron Instruments, Inc. - Lynnwood WA

G01R 19165
G01R 1910

324 73R

The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an electronic circuit, such as a pin connection of an integrated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspection and evaluation by an operator.

4965516, Oct 23, 1990

May 27, 1988

7/200011

Mahesh Parshotam - Edmonds WA
Alan D. Howard - Bothell WA
Robert D. Traulsen - Seattle WA
James L. Pennock - Seattle WA
James W. Hoo - Seattle WA
Michael M. Masten - Everett WA

Huntron Instruments, Inc. - Mill Creek WA

G01R 3128
G01R 1320

324158R

A semiconductor test instrument (12) provides an AC interrogating signal to an element under test, such as a single pin of an IC. Horizontal and vertical signals are developed and applied to a display (33) which produces an analog signature signal representative of the operating condition of the test element. The horizontal and vertical signals are converted to digital signals by an A-D converter (34) and stored in memory (39). An analog signature is also obtained from the same element as the test element but which is known to be good. The horizontal and vertical components of this signature are also converted into digital signals and stored in memory (42). The test and reference digital signals are then compared and those test digital signals which are different identified. The analog signatures corresponding to both the test and reference digital values are then reconstructed for display and superimposed, for viewing by an operator.