Jason W Chan, 40Dumfries, VA

7061804, Jun 13, 2006

Nov 18, 2004

10/993034

Dexter Tamio Chun - San Diego CA, US
Ajit Patil - San Diego CA, US
Ian Huang - San Diego CA, US
Jason Chan - San Diego CA, US
Timothy Gold - Ramona CA, US

QUALCOMM Incorporated - San Diego CA

G11C 11/34

36518517, 3652385

Techniques for quickly and reliably accessing a memory device (e. g. , a NAND Flash memory) with adaptive interface timing are described. For memory access with adaptive interface timing, the NAND Flash memory is accessed at an initial memory access rate, which may be the rate predicted to achieve reliable memory access. Error correction coding (ECC), which is often employed for NAND Flash memory, is then used to ensure reliable access of the NAND Flash. For a read operation, one page of data is read at a time from the NAND Flash memory, and the ECC determines whether the page read from the NAND Flash memory contains any errors. If errors are encountered, then a slower memory access rate is selected, and the page with error is read again from the NAND Flash memory at the new rate. The techniques may be used to write data to the NAND Flash memory.

2019003, Jan 31, 2019

Jul 31, 2017

15/665198

- San Diego CA, US
Cody Wheeland - San Diego CA, US
Vincent Kemler - San Diego CA, US
Donald Bolden Hutson - San Diego CA, US
Jason Peter Chan - San Diego CA, US
Kevin Truong - San Diego CA, US

B60L 3/12
H04Q 9/00

Systems, methods, and apparatuses described herein relate to an embedded measurement (EM) system arranged on a robotic vehicle. The EM system includes a processor and at least one sensor operatively coupled to the processor. Each of the at least one sensor is embedded in a respective subsystem of the robotic vehicle to measure telemetry data thereof while the robotic vehicle is in transit.

2016016, Jun 16, 2016

Dec 10, 2014

14/566560

- San Diego CA, US
Glenn Stroz - San Diego CA, US
Lawrence King - Newmarket, CA
Jason Chan - San Diego CA, US
Shuangquan Wang - Cary NC, US

G01R 21/133

A method and apparatus for measuring power in an electronic device is provided. A voltage is sensed across a sense resistor and the current is then calculated by dividing the sensed voltage by the value of the sense resistor. The method incorporates a buffer for storing the sensed voltage and calculated current. In addition, the buffer permits the measurements to be taken while the electronic device is in a sleep state. The measurements that may be taken include voltage, current, and power.