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Jeffrey Matthew Biser, 431139 Highland Ave, Bethlehem, PA 18018

Jeffrey Biser Phones & Addresses

Bethlehem, PA   

5827 Chestnut Hill Rd, Coopersburg, PA 18036    610-9653270   

114 Summit Ave, Ithaca, NY 14850   

5827 Chestnut Hill Rd, Coopersburg, PA 18036   

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Jeffrey Matthew Biser

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Work

Company: National plastics Aug 2013 to Sep 2014 Position: Development engineer

Education

Degree: Doctorates, Doctor of Philosophy School / High School: Lehigh University 2003 to 2013 Specialities: Materials Science, Engineering, Philosophy

Skills

Materials Science • Clean Rooms • Nanofabrication • Thin Film Coating • Thin Film Characterization • Focused Ion Beam • Atomic Force Microscopy • Scanning Electron Microscopy • Vacuum Deposition • Vacuum Pumps • Engineering Mathematics • Mechanical Drawings • Electronics • Mems • Metal Fabrication • Woodworking • Automotive Repair • Sputtering • Photolithography • Thin Films • Microfabrication • Optical Microscopy • Mechanical Testing • Electron Microscopy • Nanomaterials

Languages

English • German • French • Italian • Spanish

Interests

Science and Technology

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Industries

Research

Mentions for Jeffrey Matthew Biser

Jeffrey Biser resumes & CV records

Resumes

Jeffrey Biser Photo 7

Automation Engineer

Location:
5827 Chestnut Hill Rd, Coopersburg, PA 18036
Industry:
Research
Work:
National Plastics Aug 2013 - Sep 2014
Development Engineer
Pq Energy Services Aug 2013 - Sep 2014
Automation Engineer
Lehigh University Jun 2003 - May 2013
Graduate Assistant
Education:
Lehigh University 2003 - 2013
Doctorates, Doctor of Philosophy, Materials Science, Engineering, Philosophy
Cornell University 1999 - 2003
Bachelors, Bachelor of Science, Materials Science, Engineering
Skills:
Materials Science, Clean Rooms, Nanofabrication, Thin Film Coating, Thin Film Characterization, Focused Ion Beam, Atomic Force Microscopy, Scanning Electron Microscopy, Vacuum Deposition, Vacuum Pumps, Engineering Mathematics, Mechanical Drawings, Electronics, Mems, Metal Fabrication, Woodworking, Automotive Repair, Sputtering, Photolithography, Thin Films, Microfabrication, Optical Microscopy, Mechanical Testing, Electron Microscopy, Nanomaterials
Interests:
Science and Technology
Languages:
English
German
French
Italian
Spanish

Publications & IP owners

Us Patents

Abbreviated Epitaxial Growth Mode (Agm) Method For Reducing Cost And Improving Quality Of Leds And Lasers

US Patent:
2011014, Jun 23, 2011
Filed:
Dec 17, 2010
Appl. No.:
12/972418
Inventors:
Nelson Tansu - Bethlehem PA, US
Helen M. Chan - Bethlehem PA, US
Richard P. Vinci - Easton PA, US
Jeffrey Biser - Coopersburg PA, US
Assignee:
LEHIGH UNIVERSITY - Bethlehem PA
International Classification:
H01L 33/04
US Classification:
257 13, 438 46, 257E33008
Abstract:
The use of an abbreviated GaN growth mode on nano-patterned AGOG sapphire substrates, which utilizes a process of using 15 nm low temperature GaN buffer and bypassing etch-back and recovery processes during epitaxy, enables the growth of high-quality GaN template on nano-patterned AGOG sapphire. The GaN template grown on nano-patterned AGOG sapphire by employing abbreviated growth mode has two orders of magnitude lower threading dislocation density than that of conventional GaN template grown on planar sapphire. The use of abbreviated growth mode also leads to significant reduction in cost of the epitaxy. The growths and characteristics of InGaN quantum wells (QWs) light emitting diodes (LEDs) on both templates were compared. The InGaN QWs LEDs grown on the nano-patterned AGOG sapphire demonstrated at least a 24% enhancement of output power enhancement over that of LEDs grown on conventional GaN templates.

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