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John O Botelho, 67626 Birch St APT 1, Fall River, MA 02724

Known as:
John M Botelho Joao O Botelho John Votelho John M Elho John O'Botelho

John Botelho Phones & Addresses

626 Birch St APT 1, Fall River, MA 02724    508-6769952   

Haileyville, OK   

Mt Prospect, IL   

Crestview, FL   

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Mentions for John O Botelho

Career records & work history

License Records

John L Botelho

Address:
Fall River, MA
Licenses:
License #: 1954 - Active
Issued Date: Jun 23, 2010
Expiration Date: Mar 28, 2018
Type: Sheet Metal Journeyperson

John L Botelho

Address:
Fall River, MA
Licenses:
License #: 1838 - Active
Issued Date: Sep 14, 2004
Expiration Date: May 1, 2018
Type: Apprentice Gas Fitter

John Q Botelho

Address:
Fall River, MA 02720
Licenses:
License #: 16178 - Expired
Expiration Date: Dec 31, 1991
Type: Master Barber License

John Botelho resumes & CV records

Resumes

John Botelho Photo 43

Commission Sales Associate

Industry:
Retail
Work:
Indep Sales Rep
Commission Sales Associate
John Botelho Photo 44

Product Test Engineer

Location:
Fall River, MA
Industry:
Electrical/Electronic Manufacturing
Work:
Paricon Technologies
Product Test Engineer
John Botelho Photo 45

John Botelho

John Botelho Photo 46

John Botelho

John Botelho Photo 47

John Botelho

John Botelho Photo 48

John Botelho

John Botelho Photo 49

John Botelho

John Botelho Photo 50

John Botelho - East Providence, RI

Work:
North Star Electric Aug 1997 to 2000
Electrician Walco Electric Jul 1996 to Jul 1997
Electrician, Service tech General Cable Jan 1993 to Jan 1996
Plant Electrician Duff Electric Inc - Providence, RI Nov 1988 to Nov 1992
Electrician J.J. McNamara & Sons - East Providence, RI Sep 1987 to Nov 1988
Electrician Electrician Oct 1984 to Sep 1987
Education:
Community College of RI - West Warwick, RI 1979
College Prep

Publications & IP owners

Us Patents

Micro Kelvin Probes And Micro Kelvin Probe Methodology

US Patent:
7397255, Jul 8, 2008
Filed:
Jun 21, 2006
Appl. No.:
11/425490
Inventors:
John Sousa Botelho - Fall River MA, US
Assignee:
Paricon Technology Corporation - Fall River MA
International Classification:
G01R 31/02
US Classification:
324755, 324719, 324765
Abstract:
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop across the DUT. There is a printed circuit board (PCB) carrying two pairs of contacts, with a trace leading to each contact. Anisotropic conductive elastomer (ACE) material as an electrical interposer is placed in electrical contact with each of the PCB contacts. The DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts. The ammeter is connected to one trace leading to one contact of each pair of PCB contacts to flow current through the DUT, and the voltmeter is connected to the other trace leading to the other contact of each pair of PCB contacts, so that voltmeter can measure the voltage drop across the DUT without an effect caused by the interposer.

Micro Kelvin Probes And Micro Kelvin Probe Methodology With Concentric Pad Structures

US Patent:
7408367, Aug 5, 2008
Filed:
Jun 11, 2007
Appl. No.:
11/760917
Inventors:
Roger E. Weiss - Foxboro MA, US
John Sousa Botelho - Fall River MA, US
Assignee:
Paricon Technologies Corporation - Fall River MA
International Classification:
G01R 31/02
US Classification:
324755, 324719, 324765
Abstract:
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop across the DUT. There is a printed circuit board (PCB) carrying two pairs of contacts, with a trace leading to each contact. Anisotropic conductive elastomer (ACE) material as an electrical interposer is placed in electrical contact with each of the PCB contacts. The DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts. The ammeter is connected to one trace leading to one contact of each pair of PCB contacts to flow current through the DUT, and the voltmeter is connected to the other trace leading to the other contact of each pair of PCB contacts, so that voltmeter can measure the voltage drop across the DUT without an effect caused by the interposer. In a further embodiment, the PCB contacts are arranged in concentric circles to provide a contact surface area that is relatively constant and more tolerant of misalignment with the DUT contacts.

Possible Relatives

Cynthia E Botelho  David T Botelho  Debra U Botelho  Daniel D Botelho  Derek P Botelho  Eduardo Botelho  Elaine E Botelho  John M Johnson  John Stamps  John R Stan 

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