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John P Elward, 88578 Snyder Ave, Berkeley Heights, NJ 07922
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578 Snyder Ave, Berkeley Hts, NJ 07922 908-4645616 908-4641482 908-4649361
Berkeley Heights, NJ
307 Filetown Rd, Nazareth, PA 18064 610-7463557
16 Cheswich Ct, Bedminster, NJ 07921 908-4649361
Blacksburg, VA
Gladstone, NJ
Cedar Grove, NJ
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Us Patents
Test Pads For Integrated Circuit Chips
US Patent:
4751458, Jun 14, 1988
Filed:
Sep 27, 1985
Appl. No.:
6/780714
Inventors:
John P. Elward - Berkeley Heights NJ
Assignee:
American Telephone and Telegraph Company, AT&T Bell Laboratories - Murray Hill NJ
International Classification:
G01R 3126
US Classification:
324158F
Abstract:
Integrated circuit chips included on a wafer typically include multiple internal test pads. During diagnostic testing of the wafer, a fine-point test probe is utilized to contact the pads. As feature sizes decrease, the task of consistently and reliably probing very-small-area internal test pads becomes increasingly difficult and time-consuming. In accordance with a feature of the present invention, each internal test pad on a chip is designed to include an interior opening. This provides a continuous interior edge which reliably limits sliding of an inserted tip while ensuring good electrical contact between the tip and the pad being probed.
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