John Federici resumes & CV records
Resumes
John Federici
John Federici
John Federici
John Federici
John J Federici Deceased18 Chicjon Ln, East Hanover, NJ 07936
John Federici Phones & Addresses
18 Chicjon Ln, East Hanover, NJ 07936 973-2280190
63 Roseland Ave, Caldwell, NJ 07006 973-2280190
63 Roseland Ave #49, Caldwell, NJ 07006 973-2280190
Mentions for John J Federici
Publications & IP owners
Us Patents
Terahertz Imaging System And Method
US Patent:
6815683, Nov 9, 2004
Filed:
May 23, 2003
Appl. No.:
10/444577
Inventors:
John Federici - Westfield NJ
Robert Barat - Franklin Park NJ
Dale E. Gary - Berkely Heights NJ
Robert Barat - Franklin Park NJ
Dale E. Gary - Berkely Heights NJ
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01N 2100
US Classification:
2503411, 250330, 250340
Abstract:
THz imaging apparatus and methods are provided for rapidly and effectively examining a region of interest to determine the presence of specified compositions. The apparatus includes means for generating electromagnetic radiation of a desired terahertz frequency suitable for the examination, and for rendering the radiation incident at the region of interest. Detector means are provided at a plurality of points in a plane spaced from the region of interest, for detecting the terahertz radiation reflected from or transmitted through the region. Means are provided for converting the detected terahertz radiation to an image of the region of interest from which the presence of the specified compositions are determinable.
Terahertz Imaging For Near Field Objects
US Patent:
7105820, Sep 12, 2006
Filed:
Jan 18, 2005
Appl. No.:
11/037507
Inventors:
John F. Federici - Westfield NJ, US
Dale E. Gary - Berkeley Heights NJ, US
Dale E. Gary - Berkeley Heights NJ, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01J 5/02
US Classification:
25033902
Abstract:
Near field imaging using a THz imaging system is realized by utilizing an interferometric imaging detector array that includes detector elements disposed on a surface curved, physically or artificially, to match substantially the curvature of the wave front for received THz signals. Generally, the near field is an environment wherein the distance to an object of interest is on the order of 10–100 times larger than the physical size of the THz imaging array. Typical distances from the object or target to the imaging array is anticipated to be in the 0. 5 m–50 m range. Curvature of the detector array corrects a distortion problem in prior THz imaging systems that utilized planar interferometric imaging arrays based on a planar wave front assumption for received THz signals.
Non-Linear Terahertz Spectroscopy For Defect Density Identification In High K Dielectric Films
US Patent:
7459687, Dec 2, 2008
Filed:
Apr 6, 2007
Appl. No.:
11/697357
Inventors:
John Francis Federici - Westfield NJ, US
Haim Grebel - Livingston NJ, US
Hakan Altan - New York NY, US
Haim Grebel - Livingston NJ, US
Hakan Altan - New York NY, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01J 5/02
US Classification:
2503418
Abstract:
Methods to infer the density of defects in high κ dielectric films in a non-contact, non-invasive and non-destructive manner. THz radiation is employed to measure the change in electrical conductivity of the films before and after illumination with visible light, where the visible light photoionizes the defects thereby changing the electrical conductivity and changing the transmission (or reflection) of THz radiation from the films. The disclosed techniques can be employed to make measurements as soon as wafers are fabricated. The technology is applicable to wafers of any size.
Methods And Apparatus For The Non-Destructive Detection Of Variations In A Sample
US Patent:
7906975, Mar 15, 2011
Filed:
Dec 27, 2007
Appl. No.:
11/965045
Inventors:
John Francis Federici - Westfield NJ, US
Rose M. Federici - Westfield NJ, US
Rose M. Federici - Westfield NJ, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01N 21/88
G01N 21/17
G01N 21/17
US Classification:
324639, 2503411
Abstract:
Non-invasive THz spectroscopic apparatus and methods are provided for detecting and/or identifying constituents such as variations in a structural entity where chemical or biological entities can reside. Position dependent scattering of THz radiation is employed to image voids and defects in the internal structure of samples, enabling the determination of contamination, spoilage or readiness of products such as wine in sealed containers.
Methods Of Rapid Phase Modulation Of Thz Radiation For High Speed Thz Imaging, Spectroscopy, And Communications Devices And Systems
US Patent:
7915587, Mar 29, 2011
Filed:
May 4, 2009
Appl. No.:
12/435148
Inventors:
John Francis Federici - Westfield NJ, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G21K 1/00
US Classification:
2503411
Abstract:
Rapid, voltage controlled phase modulation of continuous wave THz radiation is demonstrated. By transmitting an infrared laser beam through a phase modulator, the phase of the THz radiation which is generated by the photomixing of two infrared beams can be directly modulated through a 2π phase shift. The 100 kHz modulation rate that is demonstrated is approximately three orders of magnitude faster than what can be achieved by mechanical scanning.
Methods And Apparatus For Rapid Scanning Continuous Wave Terahertz Spectroscopy And Imaging
US Patent:
7986413, Jul 26, 2011
Filed:
Jan 14, 2009
Appl. No.:
12/353742
Inventors:
John Francis Federici - Westfield NJ, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01B 9/02
G01J 3/45
G01J 3/45
US Classification:
356456, 356485
Abstract:
Methods and apparatus are provided employing rapid scanning continuous wave terahertz spectroscopy and imaging for the non-destructive evaluation of materials such as animal hides and natural cork, and explosive detection, concealed weapon detection, and drug detection. A system employing an aperiodic detector array and implementing phase modulation at 100 kHz significantly reduces the imaging time and enables interferometric images of a THz point source to be obtained at several frequencies between 0. 3 and 0. 95 THz.
Methods And Apparatus For The Non-Destructive Detection Of Variations In A Sample
US Patent:
8237452, Aug 7, 2012
Filed:
Feb 10, 2011
Appl. No.:
13/024406
Inventors:
John Francis Federici - Westfield NJ, US
Rose M. Federici - Westfield NJ, US
Rose M. Federici - Westfield NJ, US
Assignee:
New Jersey Institute of Technology - Newark NJ
International Classification:
G01R 27/04
G01J 5/02
G01J 5/02
US Classification:
324639, 2503411
Abstract:
Non-invasive THz spectroscopic apparatus and methods are provided for detecting and/or identifying constituents such as variations in a structural entity where chemical or biological entities can reside. Position dependent scattering of THz radiation is employed to image voids and defects in the internal structure of samples, enabling the determination of contamination, spoilage or readiness of products such as wine in sealed containers.
Non-Contact Rf Strain Sensor
US Patent:
2007018, Aug 16, 2007
Filed:
Feb 14, 2007
Appl. No.:
11/674835
Inventors:
James Zunino - Boonton Twp NJ, US
John Federici - Westfield NJ, US
Hee Lim - Edison NJ, US
John Federici - Westfield NJ, US
Hee Lim - Edison NJ, US
International Classification:
G01N 3/20
US Classification:
073849000
Abstract:
A passive, non-contact radio frequency (RF) strain sensor changes resonant frequency as it is deformed. The sensor's resonant frequency can be determined by monitoring the signals transmitted and/or reflected therefrom upon illumination of the sensor by a known RF signal source. The sensor can be implemented using thin film techniques on a flexible thin substrate that can be attached to the surface of a structural member of interest.
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