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John J Majeski Deceased2201 Springhouse Ln, Chester, PA 19014

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2201 Springhouse Ln, Aston, PA 19014   

109 Forrestview Rd, Brookhaven, PA 19015   

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Owner, Jm Consulting

Position:
CIO Consultant, VP Enterprise Architecture, VP Product Marketing at Neoware
Location:
Greater Philadelphia Area
Industry:
Information Technology and Services
Work:
Neoware since Dec 2001
CIO Consultant, VP Enterprise Architecture, VP Product Marketing
ACTIV-e Solutions Dec 2001 - Dec 2002
CTO
Valley Forge Military Academy & College Jun 1998 - Dec 2001
CIO
WEGX 1985 - 1991
Engineer
Education:
Temple University
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John Majeski

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John Majeski

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John Majeski

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John Majeski

Publications & IP owners

Wikipedia

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Alexander John Majeski

Alexander John Majeski, AIA, (born August 29, 1920), was an American ...

Us Patents

Apparatus For Optically Detecting Contamination In Particles Of Low Optical-Loss Material

US Patent:
5256886, Oct 26, 1993
Filed:
Apr 10, 1992
Appl. No.:
7/863961
Inventors:
William E. Wolf - Chesapeake MD
Robert H. Livermore - Horten, NO
David D. Dreyfuss - Kettering OH
John J. Majeski - Aston PA
Eugene F. Palecki - Wilmington DE
Thomas W. Simpson - Boothwyn PA
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G01N 1506
US Classification:
250574
Abstract:
An apparatus for optically detecting light-absorbing contamination in at least one particle of low optical-loss material comprises an optical integrating chamber for containing the particles. A laser for emitting a laser beam to illuminate the particles is mounted in the plane of rotation of a rotating mirror such that the laser beam scans in a fan scan. A scanning assembly is mounted in optical alignment with the laser for reflecting the laser beam and for causing the laser beam to scan the particles in the optical integrating chamber. A focusing assembly is mounted in optical alignment with the laser for focusing the scanning laser beam onto the particles in the chamber, the focusing assembly operating in conjunction with the scanning assembly so that light from the laser beam is reflected from the particles and is repeatedly scattered onto the interior walls of the integrating chamber. A light sensing assembly is mounted on the integrating chamber for receiving the repeatedly scattered light from the interior walls of the integrating chamber and for generating a signal indicative of the intensity of the repeatedly scattered light. A decrease in the intensity of the repeatedly scattered light is a function of the presence of light-absorbing contamination in the material.

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