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Joon B Chun, 373400 Malone Dr UNIT 216, Atlanta, GA 30341

Joon Chun Phones & Addresses

3400 Malone Dr UNIT 216, Atlanta, GA 30341   

Chamblee, GA   

Arlington, VA   

Stamford, CT   

Brunswick, ME   

Marietta, GA   

Norcross, GA   

Mentions for Joon B Chun

Joon Chun resumes & CV records

Resumes

Joon Chun Photo 30

Banking Analyst At Rbs Global Banking & Markets

Location:
United States
Industry:
Research
Joon Chun Photo 31

Joon Chun

Location:
Atlanta, GA
Industry:
Information Technology And Services
Education:
Georgia Institute of Technology 2016 - 2018
Bachelors, Computer Science
Georgia Perimeter College 2014 - 2016
Associates, Computer Science
University of Washington 2011 - 2012
Skills:
Java, Mathematica
Languages:
English
Joon Chun Photo 32

Joon B Chun

Location:
3400 Malone Dr, Atlanta, GA 30341
Industry:
Retail
Work:
IBM 2012 - 2012
Consultant
Italia Furniture - Atlanta, GA Jan 2007 - Mar 2012
Head of Operations & Development
RBS Global Banking & Markets - Stamford, CT Jun 2011 - Oct 2011
Banking Analyst
Maine Center for Economic Policy - Augusta, ME Jun 2009 - Aug 2009
Analyst Intern
Education:
Bowdoin College 2007 - 2011
BA, Economics, History
The Lovett School 2002 - 2006
Skills:
Analysis, Data Analysis, Valuation, Research, Economics, Strategic Planning, Marketing Strategy, Sales, Business Strategy, Marketing, Oracle Sql Developer, Hyperion Planning, Hyperion Epm, Oracle Pl/Sql Development, Microsoft Office, Powerpoint, Project Management, Cross Functional Team Building, New Business Development, Building New Business, Hyperion Enterprise, Oracle Enterprise Manager, Essbase, Relational Databases, Business Analysis, Requirements Analysis, Functional Design, Agile Methodologies, Requirements Gathering, Sql, Itil Process, Saas, Sales Operations, Retail, Product Development
Interests:
E Commerce
Economics
Arts and Culture
Food
History
Children
Education
Music
Consumer Goods
Sales and Marketing
Rowing
Fashion
Point of Sale
Consumer Internet
Saas
Economic Empowerment
Analytics
Cycling
Cloud Computing
Crm
Small and Medium Businesses
Languages:
Korean
English
Joon Chun Photo 33

Joon Chun

Joon Chun Photo 34

Joon Chun

Publications & IP owners

Us Patents

Guard Band Utilization In Multi-Carrier Mode For Wireless Networks

US Patent:
8311564, Nov 13, 2012
Filed:
Oct 8, 2009
Appl. No.:
12/575625
Inventors:
Joon Hwa Chun - Rockville MD, US
Shashikant Maheshwari - Irving TX, US
Zexian Li - Espoo, FI
Assignee:
Nokia Siemens Networks Oy - Espoo
International Classification:
H04B 7/00
US Classification:
455509, 375260
Abstract:
Various example embodiments are disclosed herein. According to an example embodiment, an apparatus may include a processor which may be configured to: permute subcarriers of a regular band, including subcarriers assigned to mobile station(s) operating in a single carrier mode and subcarriers assigned to mobile station(s) operating in a multiple carrier mode, to generate a first permuted regular band of subcarriers; and permute subcarriers of the first permuted regular band that are assigned to mobile station(s) operating in multiple carrier mode with subcarriers of an adjacent guard band.

Method And Apparatus For Radio Frequency Identification (Rfid) Tag Bearing Estimation

US Patent:
2019003, Jan 31, 2019
Filed:
Jul 27, 2017
Appl. No.:
15/661469
Inventors:
- Lincolnshire IL, US
Guy P. Roberts - Potomac MD, US
Joon Hwa Chun - Rockville MD, US
International Classification:
G06K 7/10
Abstract:
A method of radio frequency identification (RFID) tag bearing estimation comprises: at an RFID tag reader having a plurality of antenna elements, emitting a primary transmit beam; receiving a response signal from an RFID tag via the antenna elements; generating a first set of signal measurements corresponding to a first set of receive beam characteristics, based on a first partition of the response signal; generating a second set of signal measurements corresponding to a second set of receive beam characteristics, based on a second partition of the response signal; and combining the first and second sets of signal measurements, for selection of an estimated tag bearing for the RFID tag from the first and second receive beam characteristics.

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