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Joseph V Lento, 633 Loy Dr, Hampton, NH 03842

Known as:
Joseph P Lento Joeseph V Lento Jos V Lento Joe Lento
Related to:
Catherine C Flowers 91

Joseph Lento Phones & Addresses

Hampton, NH   

Kingston, NH   

10 Westgate Cir, Methuen, MA 01844    978-9755747   

Somerville, MA   

Wilmington, MA   

11 Saint Cyr Dr, Hampton, NH 03842   

Work

Position: Building and Grounds Cleaning and Maintenance Occupations

Education

Degree: JD - Juris Doctor School / High School: Temple University - James E. Beasley School of Law

Ranks

Licence: New Jersey - Active Date: 2008
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Mentions for Joseph V Lento

Career records & work history

Lawyers & Attorneys

Joseph Lento Photo 1

Joseph D. Lento - Lawyer

Licenses:
New Jersey - Active 2008
Pennsylvania - Suspended 2008
Experience:
Attorney & Counselor at Law at Law Office of Joseph C. Santaguida - 2008-present
Managing Attorney & Counselor at Law at Law Offices of Joseph D. Lento and Associates - 2008-present
Philadelphia Court of Common Pleas & Municipal Court at First Judicial District Of Pennsylvania - 2003-2008
Education:
Temple University - James E. Beasley School of LawDegree JD - Juris Doctor - Law
United States Marine Corps Officer Candidates School
Villanova UniversityDegree BA - Bachelor of Arts - Political Science
Specialties:
Criminal Defense - 40%
DUI / DWI - 35%
Family - 20%
Personal Injury - 5%
Languages:
English
Associations:
America’s DUI DWI Lawyers - Attorney Member
DUI Defense Lawyers - Attorney Member
DUI Litigation Attorney’s Network - Attorney Member
National Association of Criminal Defense Lawyers - Attorney Member
National College of DUI Defense - Attorney Member
Pennsylvania Association of Criminal Defense Attorneys - Attorney Member
Philadelphia Bar Association - Attorney Member
Philadelphia Bar Association, Criminal Justice Section - Attorney Member
Philadelphia Bar Association, Family Law Section - Attorney Member
Philadelphia Criminal Law American Inn of Court - Founding Member

Joseph Lento resumes & CV records

Resumes

Joseph Lento Photo 32

Engineering Manager R And D Lifescience Research

Location:
600 Expansion Blvd, Savannah, GA 31407
Industry:
Biotechnology
Work:
Milliporesigma
Engineering Manager R and D Lifescience Research The Gsi Group, Inc. Jan 1990 - May 2009
Engineering Manager Laser Trim Systems Teradyne Jun 1984 - Jan 1990
Multiple Engineering Positions
Education:
Northeastern University Jan 1, 1994 - 1998
University of Massachusetts Lowell Jan 1, 1980 - 1984
Bachelors, Bachelor of Science In Electrical Engineering, Engineering, Electronics Don Bosco High School Jan 1, 1976 - Dec 31, 1980
Skills:
R&D, Product Development, Engineering Management, Manufacturing, Semiconductors, Electronics, Product Management, Cross Functional Team Leadership, Engineering, Design of Experiments, Six Sigma, Process Engineering, Automation, Product Marketing, Integration, Program Management, Laser, Project Management, Business Development, Medical Devices, Team Leadership, Management, Robotics, Testing, Leadership, Design For Manufacturing, Embedded Systems, Continuous Improvement, Lean Manufacturing, Process Improvement, Root Cause Analysis, Thin Films, Product Launch, Quality Assurance, Quality Management, Instrumentation, Commercialization, Sensors, Product Lifecycle Management, Spc, Instrument Validation, Process Simulation, Manufacturing Engineering, Lifesciences, Iso, Technology Transfer, Failure Analysis, Optics, Quality System, Fmea
Joseph Lento Photo 33

Joseph Lento

Publications & IP owners

Us Patents

Method And System For High-Speed Precise Laser Trimming, Scan Lens System For Use Therein And Electrical Device Produced Thereby

US Patent:
7358157, Apr 15, 2008
Filed:
Oct 6, 2005
Appl. No.:
11/245282
Inventors:
Bo Gu - North Andover MA, US
Joseph V. Lento - Methuen MA, US
Jonathan S. Ehrmann - Sudbury MA, US
Bruce L. Couch - North Attleboro MA, US
Yun Fee Chu - Natick MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Group Corporation - Billerica MA
International Classification:
H01L 21/00
US Classification:
438463, 438460, 257E21347
Abstract:
A method, system and scan lens system are provided for high-speed, laser-based, precise laser trimming at least one electrical element. The method includes generating a pulsed laser output having one or more laser pulses at a repetition rate. Each laser pulse has a pulse energy, a laser wavelength within a range of laser wavelengths, and a pulse duration. The method further includes selectively irradiating the at least one electrical element with the one or more laser pulses focused into at least one spot having a non-uniform intensity profile along a direction and a spot diameter as small as about 6 microns to about 15 microns so as to cause the one or more laser pulses to selectively remove material from the at least one element and laser trim the at least one element while avoiding substantial microcracking within the at least one element. The wavelength is short enough to produce desired short-wavelength benefits of small spot size, tight tolerance and high absorption, but not so short so as to cause microcracking.

Method And System For High-Speed, Precise Micromachining An Array Of Devices

US Patent:
7407861, Aug 5, 2008
Filed:
May 18, 2005
Appl. No.:
11/131668
Inventors:
Bruce L. Couch - North Attleboro MA, US
Jonathan S. Ehrmann - Sudbury MA, US
Yun Fee Chu - Natick MA, US
Joseph V. Lento - Methuen MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Group Corporation - Billerica MA
International Classification:
H01L 21/20
H01L 21/301
US Classification:
438382, 438 13, 438 17, 438463, 21912167, 21912168, 257E21599
Abstract:
A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. The number of resistance measurements are limited by using non-measurement cuts, using non-sequential collinear cutting, using spot fan-out parallel cutting, and using a retrograde scanning technique for faster collinear cuts. Non-sequential cutting is also used to manage thermal effects and calibrated cuts are used for improved accuracy. Test voltage is controlled to avoid resistor damage.

Methods And Apparatus For Utilizing An Optical Reference

US Patent:
7538564, May 26, 2009
Filed:
Oct 18, 2006
Appl. No.:
11/582829
Inventors:
Jonathan S. Ehrmann - Sudbury MA, US
Patrick S. Duffy - N. Andover MA, US
Markus M. Weber - Malden MA, US
Gregg A. Metzger - Andover MA, US
Joseph V. Lento - Methuen MA, US
Pierre-Yves Mabboux - Billerica MA, US
Jens Zink - Lakeville MA, US
Yun Fee Chu - Natick MA, US
Assignee:
GSI Group Corporation - Bedford MA
International Classification:
G01R 31/302
G01R 31/28
US Classification:
324752, 3241581
Abstract:
A laser processing system implements a method for aligning a probe element (e. g. , a probe pin) with a device interface element (e. g. , a contact pad of a circuit substrate). First, the laser processing system generates an optical reference beam at one or more predetermined positions to calibrate a reference field. The laser processing system then detects a position of the probe element in the reference field. The laser processing system also determines a relative position of the device interface element in the reference field. Based on the position of the probe element and the device interface element, the laser processing system then initiates alignment of the probe element and the device interface element. In one application, alignment of the probe element and the device interface element further includes contacting the probe element to the device interface element to make an electrical connection.

Method And System For High-Speed Precise Laser Trimming And Scan Lens For Use Therein

US Patent:
7563695, Jul 21, 2009
Filed:
Jan 25, 2007
Appl. No.:
11/657810
Inventors:
Bo Gu - North Andover MA, US
Jonathan S. Ehrmann - Sudbury MA, US
Joseph V. Lento - Methuen MA, US
Bruce L. Couch - North Attleboro MA, US
Yun Fee Chu - Natick MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Group Corporation - Billerica MA
International Classification:
H01L 21/00
US Classification:
438463, 438460, 257E21347
Abstract:
A method, system and scan lens for use therein are provided for high-speed, laser-based, precise laser trimming at least one electrical element along a trim path. The method includes generating a pulsed laser output with a laser, the output having one or more laser pulses at a repetition rate. A fast rise/fall time, pulse-shaped q-switched laser or an ultra-fast laser may be used. Beam shaping optics may be used to generate a flat-top beam profile. Each laser pulse has a pulse energy, a laser wavelength within a range of laser wavelengths, and a pulse duration. The wavelength is short enough to produce desired short-wavelength benefits of small spot size, tight tolerance, high absorption and reduced or eliminated heat-affected zone (HAZ) along the trim path, but not so short so as to cause microcracking. In this way, resistance drift after the trimming process is reduced.

Method And System For High-Speed, Precise Micromachining An Array Of Devices

US Patent:
7666759, Feb 23, 2010
Filed:
May 2, 2006
Appl. No.:
11/415653
Inventors:
Bruce L. Couch - North Attleboro MA, US
Jonathan S. Ehrmann - Sudbury MA, US
Joseph V. Lento - Methuen MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Lumonics Corporation - Billerica MA
International Classification:
H01L 21/20
US Classification:
438463, 438460, 21912169, 257E21599
Abstract:
A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. The number of resistance measurements are limited by using non-measurement cuts, using non-sequential collinear cutting, using spot fan-out parallel cutting, and using a retrograde scanning technique for faster collinear cuts. Non-sequential cutting is also used to manage thermal effects and calibrated cuts are used for improved accuracy. Test voltage is controlled to avoid resistor damage.

Method And System For High-Speed, Precise Micromachining An Array Of Devices

US Patent:
7871903, Jan 18, 2011
Filed:
Dec 22, 2009
Appl. No.:
12/644832
Inventors:
Bruce L. Couch - North Attleboro MA, US
Jonathan S. Erhmann - Sudbury MA, US
Yun Fee Chu - Natick MA, US
Joseph V. Lento - Methuen MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Group Corporation - Bedford MA
International Classification:
H01L 21/20
US Classification:
438463, 438460, 21912169, 257E21599
Abstract:
A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. Beam scanning and deflection are both used to distribute beam spots to elements of an array of elements for selective processing. The deflection can be performed with a solid state deflector.

Method And System For High-Speed Precise Laser Trimming And Scan Lens For Use Therein

US Patent:
8329600, Dec 11, 2012
Filed:
Jul 8, 2009
Appl. No.:
12/499123
Inventors:
Bo Gu - Andover MA, US
Jonathan S. Ehrmann - Sudbury MA, US
Joseph V. Lento - Methuen MA, US
Bruce L. Couch - North Attleboro MA, US
Yun Fee Chu - Natick MA, US
Shepard D. Johnson - Andover MA, US
Assignee:
GSI Group Corporation - Bedford MA
International Classification:
H01L 21/26
US Classification:
438795, 438459, 438460, 438463, 438487, 438797, 21912167, 21912169, 21912172, 21912171, 257E21347
Abstract:
A method, system and scan lens for use therein are provided for high-speed, laser-based, precise laser trimming at least one electrical element along a trim path. The method includes generating a pulsed laser output with a laser, the output having one or more laser pulses at a repetition rate. A fast rise/fall time, pulse-shaped q-switched laser or an ultra-fast laser may be used. Beam shaping optics may be used to generate a flat-top beam profile. Each laser pulse has a pulse energy, a laser wavelength within a range of laser wavelengths, and a pulse duration. The wavelength is short enough to produce desired short-wavelength benefits of small spot size, tight tolerance, high absorption and reduced or eliminated heat-affected zone (HAZ) along the trim path, but not so short so as to cause microcracking. In this way, resistance drift after the trimming process is reduced.

Method And System For High-Speed, Precise Micromachining An Array Of Devices

US Patent:
2004000, Jan 15, 2004
Filed:
Mar 26, 2003
Appl. No.:
10/397541
Inventors:
Bruce Couch - North Attleboro MA, US
Jonathan Ehrmann - Sudbury MA, US
Yun Chu - Natick MA, US
Joseph Lento - Methuen MA, US
Shepard Johnson - Andover MA, US
International Classification:
H01L021/00
H01L021/20
B23K026/16
US Classification:
438/013000, 438/382000, 219/121680
Abstract:
A method and system for high-speed, precise micromachining an array of devices are disclosed wherein improved process throughput and accuracy, such as resistor trimming accuracy, are provided. The number of resistance measurements are limited by using non-measurement cuts, using non-sequential collinear cutting, using spot fan-out parallel cutting, and using a retrograde scanning technique for faster collinear cuts. Non-sequential cutting is also used to manage thermal effects and calibrated cuts are used for improved accuracy. Test voltage is controlled to avoid resistor damage.

Public records

Vehicle Records

Joseph Lento

Address:
11 Saint Cyr Dr, Hampton, NH 03842
VIN:
1G2ZG57BX94143877
Make:
PONTIAC
Model:
G6
Year:
2009

Possible Relatives

David Lento  Frank N Lento  James J Lento  John F Lento  Julius J Lento  Louis A Lento  Mary L Lento  Joseph J Johnson  Joseph D Stamps  Joseph N Stancil 

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