BackgroundCheck.run
Search For

Hung Uy Pham, 60Jacksonville, FL

Known as:
Uy H Pham Hung Y Pham Hung U Pham Huong Thanh Phan Huong T Phan Hung Pham Uy Uyh Pham Pham Uy
Related to:
Trung Q Phan 40

Hung Pham Phones & Addresses

Jacksonville, FL   

Arcata, CA   

Colorado Springs, CO   

San Leandro, CA   

Mountain View, CA   

San Francisco, CA   

Oakland, CA   

Brentwood, CA   

Get Report
Control this profile

Mentions for Hung Uy Pham

Career records & work history

Lawyers & Attorneys

Hung Pham Photo 1

Hung Pham - Lawyer

Specialties:
Intellectual Property Law
ISLN:
922668852
Admitted:
2011
University:
Thomas M Cooley Law School; Lansing MI; Metropolitan St Coll; Denver CO
Hung Pham Photo 2

Hung Pham - Lawyer

Specialties:
Construction & Development, Construction & Development, Insurance
ISLN:
918950565
Admitted:
2003
University:
University of California, B.A., 1998
Law School:
University of California at Los Angeles School of Law, J.D., 2002

Medicine Doctors

Hung Pham Photo 3

Dr. Hung D Pham, Daly City CA - DDS (Doctor of Dental Surgery)

Specialties:
Pediatric Dentistry
Address:
1500 Southgate Ave Suite 210, Daly City, CA 94015
650-7560938 (Phone) 650-7561915 (Fax)
Languages:
English

Hung X. Pham

Specialties:
Family Medicine
Work:
Patient FirstPatient First Central Park
3031 Plank Rd, Fredericksburg, VA 22401
540-7365043 (phone) 540-7365044 (fax)
Site
Patient FirstPatient First Garrisonville Medical Center
60 Prosperity Ln, Stafford, VA 22556
540-6582811 (phone) 540-6582812 (fax)
Site
Education:
Medical School
A.T. Still University of Health Sciences/ Kirksville College of Osteopathic Medicine
Graduated: 1996
Procedures:
Destruction of Benign/Premalignant Skin Lesions, Electrocardiogram (EKG or ECG), Hearing Evaluation, Pulmonary Function Tests, Skin Tags Removal, Vaccine Administration
Conditions:
Abnormal Vaginal Bleeding, Acute Bronchitis, Acute Conjunctivitis, Acute Pharyngitis, Acute Sinusitis, Acute Upper Respiratory Tract Infections, Allergic Rhinitis, Contact Dermatitis, Fractures, Dislocations, Derangement, and Sprains, Gout, Otitis Media, Pneumonia, Skin and Subcutaneous Infections, Urinary Tract Infection (UT), Abdominal Hernia, Acne, Acute Renal Failure, Alopecia Areata, Anemia, Anorexia Nervosa, Anxiety Phobic Disorders, Atopic Dermatitis, Atrial Fibrillation and Atrial Flutter, Attention Deficit Disorder (ADD), Bell's Palsy, Benign Thyroid Diseases, Bronchial Asthma, Burns, Calculus of the Urinary System, Candidiasis of Vulva and Vagina, Cardiac Arrhythmia, Carpel Tunnel Syndrome, Chronic Fatigue Syndrome, Chronic Renal Disease, Chronic Sinusitis, Conduction Disorders, Constipation, Croup, Dehydration, Dermatitis, Diabetes Mellitus (DM), Disorders of Lipoid Metabolism, Diverticulitis, Epilepsy, Erectile Dysfunction (ED), Esophagitis, Gastritis and Duodenitis, Gastroesophageal Reflux Disease (GERD), Gastrointestinal Hemorrhage, Hearing Loss, Heart Failure, Hemorrhoids, Herpes Genitalis, Herpes Simplex, Herpes Zoster, Hypertension (HTN), Hypothyroidism, Infectious Liver Disease, Infectious Mononucleosis, Inflammatory Bowel Disease (IBD), Inguinal Hernia, Internal Derangement of Knee, Intervertebral Disc Degeneration, Irritable Bowel Syndrome (IBS), Labyrinthitis, Lyme Disease, Menopausal and Postmenopausal Disorders, Migraine Headache, Osteoarthritis, Overweight and Obesity, Phlebitis and Thrombophlebitis, Plantar Fascitis, Plantar Warts, Psoriasis, Restless Leg Syndrome, Rheumatoid Arthritis, Rosacea, Rotator Cuff Syndrome and Allied Disorders, Sciatica, Sexually Transmitted Diseases (STDs), Substance Abuse and/or Dependency, Sunburn, Systemic Lupus Erythematosus, Tension Headache, Tinea Pedis, Tinea Unguium, Urinary Incontinence, Varicose Veins, Vitamin D Deficiency
Languages:
English, Spanish
Description:
Dr. Pham graduated from the A.T. Still University of Health Sciences/ Kirksville College of Osteopathic Medicine in 1996. He works in Fredericksburg, VA and 1 other location and specializes in Family Medicine.

Hung Pham

Specialties:
Family Medicine
Work:
Lakeland Family Medicine Of Niles
4 Longmeadow Vlg Dr STE 2, Niles, MI 49120
269-6846000 (phone) 269-6841388 (fax)
Languages:
English
Description:
Dr. Pham works in Niles, MI and specializes in Family Medicine. Dr. Pham is affiliated with Lakeland Community Hospital.
Hung Pham Photo 4

Hung Hung Pham

Specialties:
Radiology
Diagnostic Radiology
Education:
University of Vermont (1998) Diagnostic Radiology
Hung Pham Photo 5

Hung Gia Pham

Specialties:
Internal Medicine
Radiology
Education:
University Of Medicine Of Ho Chi Minh City (1973)
Hung Pham Photo 6

Hung Duy Pham, Daly City CA

Specialties:
Dentist
Address:
1500 Southgate Ave, Daly City, CA 94015

License Records

Hung Bao Pham

Licenses:
License #: CPT.007214 - Expired
Issued Date: Nov 2, 2005
Expiration Date: Jun 30, 2006
Type: Certified Pharmacy Technician

Hung Van Pham

Licenses:
License #: PST.017492 - Active
Issued Date: Oct 14, 2004
Expiration Date: Dec 31, 2017
Type: Pharmacist

Hung Phi Pham

Address:
7153 Hillbeck Dr, Colorado Springs, CO 80922
Licenses:
License #: 500502 - Active
Issued Date: Jun 24, 1998
Renew Date: Apr 1, 2016
Expiration Date: Mar 31, 2018
Type: Nail Technician

Hung Van Pham

Phone:
469-3287922
Licenses:
License #: 1464567 - Expired
Category: Cosmetology Manicurist
Expiration Date: Sep 25, 2015

Hung T Pham

Licenses:
License #: E099210 - Expired
Category: Emergency medical services
Issued Date: Jun 20, 2013
Expiration Date: Jun 30, 2015
Type: Solano County EMS Agency

Hung Minh Pham

Licenses:
License #: 878 - Expired
Category: Nail Technology
Issued Date: Jan 1, 2000
Effective Date: Jan 1, 2008
Expiration Date: Dec 31, 2007
Type: Nail Technician

Hung Pham resumes & CV records

Resumes

Hung Pham Photo 26

Hung Pham - San Francisco, CA

Work:
Selix Formal Wear Jun 1998 to 2000
Store Manager President Tuxedo - San Leandro, CA Jan 1991 to Jun 1998 Mervyns Store - Millbrae, CA Jan 1990 to Dec 1990
Area Manager
Education:
San Francisco State University - San Francisco, CA Dec 1989
BS in Business Management City College of San Francisco - San Francisco, CA May 1984
AS in Computer Sciences
Hung Pham Photo 27

Hung Pham - Hayward, CA

Work:
AUTOMATIC CONTROLS ENGINEERING CORPORATION - Hayward, CA 1999 to Aug 2014
CIRCUIT INSTALLER IMAGE MAX CO 1991 to 1999
MICROFILM OPERATOR
Hung Pham Photo 28

Hung Pham - San Diego, CA

Work:
Ericsson Dec 2011 to 2000
Graduate Leadership Development Program - Account Manager - Cricket Communications Brocade Communications - San Jose, CA Apr 2010 to Dec 2011
University Development Program - OEM Account Manager - IBM & Oracle Honorable Discharged - United States Marine Corps Jun 2005 to Jun 2011
Force Reconnaissance - Platoon Sergeant Honorable Discharged - United States Marine Corps - San Francisco, CA Aug 2008 to Nov 2008
Group Merger & Acquisition - Banking Analyst Intern Honorable Discharged - United States Marine Corps Dec 2005 to Dec 2006
Operation Iraqi Freedom Tourneau Inc - San Jose, CA Nov 2002 to Oct 2004
Fine Timepiece Retail Sales Associate
Education:
University of San Francisco - Santiago de Chile, Regin Metropolitana May 2009
B.S. in Business Administration

Publications & IP owners

Us Patents

Wafer Metrology Apparatus And Method

US Patent:
6563586, May 13, 2003
Filed:
Jul 10, 2000
Appl. No.:
09/613176
Inventors:
Fred E. Stanke - Cupertino CA
Clinton B. Carlisle - Palo Alto CA
Hung Pham - San Jose CA
Edric Tong - Sunnyvale CA
Douglas E. Ruth - Sunnyvale CA
James M. Cahill - San Jose CA
Michael Weber - Sunnyvale CA
Elliot Burke - Santa Barbara CA
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G01N 2188
US Classification:
356445, 3562372
Abstract:
This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

Wafer Metrology Apparatus And Method

US Patent:
6919958, Jul 19, 2005
Filed:
Mar 26, 2003
Appl. No.:
10/397917
Inventors:
Fred E. Stanke - Cupertino CA, US
Clinton B. Carlisle - Palo Alto CA, US
Hung Van Pham - San Jose CA, US
Edric Tong - Sunnyvale CA, US
Douglas E. Ruth - Sunnyvale CA, US
Elliot Burke - Goleta CA, US
Adam E. Norton - Palo Alto CA, US
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G01N021/88
US Classification:
3562372
Abstract:
This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

Method And Apparatus For Analyzing Manufacturing Data

US Patent:
6965895, Nov 15, 2005
Filed:
Jul 12, 2002
Appl. No.:
10/194920
Inventors:
Shawn B. Smith - Palo Alto CA, US
Brian P. Grigsby - Austin TX, US
Hung J. Pham - Leander TX, US
Tony L. Davis - Austin TX, US
Manjunath S. Yedatore - Austin TX, US
Assignee:
Applied Materials, Inc. - Santa Clara CA
International Classification:
G06F017/30
US Classification:
707 10, 707 5, 707 6, 707101, 7071041, 706 25
Abstract:
A method for data mining information obtained in an integrated circuit fabrication factory (“fab”) that includes steps of: (a) gathering data from the fab from one or more of systems, tools, and databases that produce data in the fab or collect data from the fab; (b) formatting the data and storing the formatted data in a source database; (c) extracting portions of the data for use in data mining in accordance with a user specified configuration file; (d) data mining the extracted portions of data in response to a user specified analysis configuration file; (e) storing results of data mining in a results database; and (f) providing access to the results.

Multicolored Polymer Nanocomposites For Optical Memory Storage And Security Data Encryption

US Patent:
6974618, Dec 13, 2005
Filed:
Jan 16, 2004
Appl. No.:
10/758269
Inventors:
Eugenia Kumacheva - Toronto, CA
Hung H. Pham - Fremont CA, US
Ilya Gourevich - Toronto, CA
International Classification:
B32B003/02
US Classification:
428 641, 428 644, 428407, 43027014
Abstract:
An optical data storage device comprised of periodic nanostructured polymer-based material produced from core-shell particles containing one dye in the core and a second dye in the shell. The combinations of dyes can be UV-Vis-dyes or Vis-NIR or UV-NIR. It is shown that selective single-photon photobleaching of the two dyes leads to increase in density of data storage and allows one to employ single-photon photobleaching to achieve the same storage density as in two-photon-writing.

Apparatus For Imaging Metrology

US Patent:
7042580, May 9, 2006
Filed:
Mar 22, 2000
Appl. No.:
09/533613
Inventors:
Fred E. Stanke - Cupertino CA, US
Clinton B. Carlisle - Palo Alto CA, US
Hung Pham - San Jose CA, US
Edric Tong - Sunnyvale CA, US
Douglas E. Ruth - Sunnyvale CA, US
James M. Cahill - San Jose CA, US
Michael Weber - Sunnyvale CA, US
Elliot Burke - Santa Barbara CA, US
Assignee:
Tokyo Electron Limited - Tokyo
International Classification:
G01B 11/24
US Classification:
356601, 3562372, 356455, 356630
Abstract:
This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

Apparatus For Imaging Metrology

US Patent:
7177019, Feb 13, 2007
Filed:
Feb 1, 2005
Appl. No.:
11/048552
Inventors:
Fred E. Stanke - Cupertino CA, US
Douglas E. Ruth - Sunnyvale CA, US
James M. Cahill - San Jose CA, US
Michael Weber - Sunnyvale CA, US
Clinton B. Carlisle - Palo Alto CA, US
Hung Pham - San Jose CA, US
Edric Tong - Sunnyvale CA, US
Elliot Burke - Santa Barbara CA, US
Assignee:
Tokyo Electron Limited - Tokyo
International Classification:
G01B 11/24
US Classification:
3562372, 356601, 356630
Abstract:
This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

Anastomotic Seal Loading Tool

US Patent:
2008027, Nov 6, 2008
Filed:
May 1, 2008
Appl. No.:
12/113547
Inventors:
Albert K. Chin - Palo Alto CA, US
Arthur M. Lin - Fremont CA, US
Alfredo R. Cantu - Pleasanton CA, US
Hung Pham - San Jose CA, US
International Classification:
A61B 17/11
US Classification:
606153, 606155
Abstract:
Described herein are methods and devices for loading an anastomotic seal into a delivery lumen. A loading device can fold the seal into a configuration for insertion into the delivery lumen. For example, the loading device can fold the seal into a prolate spheroidal shape. The delivery lumen can then be inserted into the loading device and mated with the folded seal.

Using Magnetometer Data To Calculate Angular Rate Measurement Bias

US Patent:
2014007, Mar 13, 2014
Filed:
Sep 11, 2012
Appl. No.:
13/610719
Inventors:
Hung A. Pham - Oakland CA, US
Hengliang Zhang - Sunnyvale CA, US
Assignee:
APPLE INC. - Cupertino CA
International Classification:
G06F 15/00
G01C 19/00
US Classification:
702145
Abstract:
Implementations are disclosed for using magnetometer measurements to estimate bias for angular rate measurements provided by an angular rate sensor (e.g., a gyro sensor). In some implementations, a bias estimator running on a device is configured to determine if the device is rotating based on the magnetometer measurements. If the device is not rotating, a dynamic bias is calculated and added to a temperature compensated static bias to provide a total angular rate measurement bias. The total angular rate measurement bias can be provided to an attitude estimation system where it is used to update an attitude (orientation) of the device. In some implementations, the angular rate measurements are used to determine if the device is oscillating according to a threshold value. If the device is not rotating and the device is oscillating according to a threshold value, the static bias is updated in a calibration table.

Possible Relatives

Cynthia Pham  David H Pham  Davis T Pham  Dean D Pham  Dac T Pham  Dai V Pham  Daisy D Pham  Hung Lam  Hung H Le  Hung T Lee 

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.