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Joseph N Landry, 50Fate, TX

Known as:
Landry N Joseph Landry A Joseph Landry J Joseph
Related to:
Sabria Joseph

Joseph Landry Phones & Addresses

Fate, TX   

Alexandria, LA   

Grand Prairie, TX   

Ewa Beach, HI   

Parker, CO   

Chesapeake, VA   

San Antonio, TX   

Arlington, TN   

4602 Parliament Dr APT 203, Alexandria, LA 71303    318-4486417   

Work

Position: Service Occupations

Education

Degree: High school graduate or higher
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Mentions for Joseph N Landry

Career records & work history

License Records

Joseph B. Landry

Licenses:
License #: PST.010791 - Active
Issued Date: Jan 29, 1976
Expiration Date: Dec 31, 2017
Type: Pharmacist

Joseph Landry resumes & CV records

Resumes

Joseph Landry Photo 50

Joseph Landry

Location:
United States
Joseph Landry Photo 51

Joseph Landry

Location:
United States
Joseph Landry Photo 52

Joseph Landry - Idaho Springs, CO

Work:
FIRSTBANK - Evergreen, CO Aug 2011 to Jun 2014
Lead Teller, Trainer, Customer Service, Cross Sell Landry's BP Station - Wauwatosa, WI Jan 2007 to Jun 2011
Cashier, Inventory Management, Customer Service Area Rental & Sales Co. - New Berlin, WI May 2007 to Sep 2007
Tent & Party Setup Crew Leader
Education:
Ashford University Apr 2014
Masters in Business Administration University of Wisconsin-Whitewater - Whitewater, WI Dec 2010
Bachelor of Business Administration in Finance

Publications & IP owners

Us Patents

Remote Material Identification Process Performance Prediction Tool

US Patent:
8515716, Aug 20, 2013
Filed:
Aug 6, 2010
Appl. No.:
12/851844
Inventors:
Paul M. Ingram - Dallas TX, US
Joseph C. Landry - Dallas TX, US
John J. Coogan - Bedford TX, US
Paul D. Shocklee - Plano TX, US
Assignee:
Raytheon Company - Waltham MA
International Classification:
G06G 7/48
G06F 7/60
G06F 17/10
US Classification:
703 6, 703 2
Abstract:
In accordance with the present disclosure, a computer implemented system and method predicts the performance for a remote material identification process under real conditions and uncertainties. The method and system transforms data representing measured reflectance values for candidate materials based on environmental conditions, and uncertainties regarding the environmental conditions and/or calibration of sensors measuring radiance values into the performance predictions for a material identification process operating under those conditions and uncertainties. The performance predictions can be communicated to a designer of, for example, a multi-angle material identification system for use in selecting and setting up the system, or communicated to a consumer of images captured by the material identification system for use in interpreting results of application of the material identification process to real imagery acquired with remote sensors.

Remote Identification Of Non-Lambertian Materials

US Patent:
8532958, Sep 10, 2013
Filed:
Aug 6, 2010
Appl. No.:
12/851991
Inventors:
Paul M. Ingram - Dallas TX, US
Joseph C. Landry - Dallas TX, US
John J. Coogan - Bedford TX, US
Paul D. Shocklee - Plano TX, US
Assignee:
Raytheon Company - Waltham MA
International Classification:
G06F 17/18
US Classification:
702181, 252582
Abstract:
In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.

In-Scene Determination Of Aerosol Parameters From Imagery

US Patent:
8558884, Oct 15, 2013
Filed:
May 4, 2011
Appl. No.:
13/100878
Inventors:
Joseph C. Landry - Dallas TX, US
Assignee:
Raytheon Company - Waltham MA
International Classification:
H04N 7/18
US Classification:
348135
Abstract:
A computer implemented method and apparatus estimate background reflectance, aerosol type and visibility within a multispectral imagery using the measured spectral radiance of one or more calibration targets of known reflectance and the measured radiance of the background of the target. The computer implemented method and apparatus uses predefined aerosol types, characterized by a plurality of known parameters, and the known reflectance of the one or more calibration targets, to select an aerosol that best matches the measured radiances.

Remote Identification Of Non-Lambertian Materials

US Patent:
2014001, Jan 9, 2014
Filed:
Jun 25, 2013
Appl. No.:
13/926394
Inventors:
Joseph C. Landry - Dallas TX, US
John J. Coogan - Bedford TX, US
Paul D. Shocklee - Plano TX, US
International Classification:
G06F 17/18
US Classification:
702181
Abstract:
In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.

Determining Minimum Region For Finding Planar Surfaces

US Patent:
2023003, Feb 9, 2023
Filed:
Jul 27, 2021
Appl. No.:
17/443713
Inventors:
- Waltham MA, US
Jody D. Verret - Rockwall TX, US
Joseph C. Landry - Dallas TX, US
International Classification:
G06T 17/05
G06T 7/11
Abstract:
Systems, devices, methods, and computer-readable media for determining planarity in a 3D data set are provided. A method can include receiving or retrieving three-dimensional (3D) data of a geographical region, dividing the 3D data into first contiguous regions of specified first geographical dimensions, determining, for each first contiguous region of the first contiguous regions, respective measures of variation, identifying, based on the respective measures of variation, a search radius, dividing the 3D data into respective second contiguous or overlapping regions with dimensions the size of the identified search radius, and determining, based on the identified search radius, a planarity of each of the respective second contiguous or overlapping regions.

Possible Relatives

Derrick M Landry  Diana M Landry  Donna L Landry  Elizabeth A Landry  Enid K Landry  Heidi L Landry  Jane B Landry  Joseph J Johnson  Joseph D Stamps  Joseph N Stancil 

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