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Li Lin, 39Philadelphia, PA

Known as:
Lin Li
Related to:
Jianfeng F Lin Cheng Lin

Li Lin Phones & Addresses

Philadelphia, PA   

Greenbush, ME   

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Career records & work history

Medicine Doctors

Li Wei Lin

Specialties:
Ophthalmology
Work:
Lexington Eye Associates Inc
21 Worthen Rd STE 3, Lexington, MA 02421
781-8621620 (phone) 781-8639416 (fax)
Site
Education:
Medical School
Boston University School of Medicine
Graduated: 2002
Procedures:
Lens and Cataract Procedures, Ophthalmological Exam
Conditions:
Keratitis, Acute Conjunctivitis, Cataract, Diabetic Retinopathy, Glaucoma, Macular Degeneration, Primary Angle-Closure Glaucoma, Retinal Detachments
Languages:
English, French, Spanish
Description:
Dr. Lin graduated from the Boston University School of Medicine in 2002. She works in Lexington, MA and specializes in Ophthalmology. Dr. Lin is affiliated with Emerson Hospital, Mount Auburn Hospital and Winchester Hospital.

Li Lin

Specialties:
Allergy & Immunology
Work:
The Center For Asthma & Allergy
222 Schanck Rd STE 203, Freehold, NJ 07728
732-4319901 (phone) 732-2949794 (fax)
Languages:
English
Description:
Dr. Lin works in Freehold, NJ and specializes in Allergy & Immunology. Dr. Lin is affiliated with John F Kennedy Medical Center - Johnson Rehabilitation Center and Robert Wood Johnson University Hospital.
Li Lin Photo 1

Li Lin

Li Lin Photo 2

Li K Lin

Specialties:
Internal Medicine
Infectious Disease
Ophthalmology
Education:
Temple University Physicians (1999)

License Records

Li Hsiang Lin

Licenses:
License #: 28488 - Active
Issued Date: Aug 6, 2010
Renew Date: Dec 1, 2015
Expiration Date: Nov 30, 2017
Type: Certified Public Accountant

Li Zhen Lin

Licenses:
License #: 1261002001
Category: Esthetician License

Li Lin

Licenses:
License #: 305730
Category: Nurse Practitioner - Adult Health
Issued Date: Jun 30, 2011
Type: NURSE PRACTITIONER IN ADULT HEALTH

Li W Lin

Address:
Philadelphia, PA 19120
Licenses:
License #: PI112754 - Expired
Category: Pharmacy
Type: Pharmacy Intern

Li Juan Lin

Address:
Philadelphia, PA 19149
Licenses:
License #: 010267 - Expired
Category: Cosmetology
Type: Nail Technician Temp Auth to Practice

Li Rong Lin

Address:
Philadelphia, PA 19149
Licenses:
License #: CL185099 - Active
Category: Cosmetology
Type: Nail Technician

Li Rong Lin

Address:
Philadelphia, PA 19107
Licenses:
License #: 008323 - Expired
Category: Cosmetology
Type: Nail Technician Temp Auth to Practice

Li Lin resumes & CV records

Resumes

Li Lin Photo 34

Li Lin - Los Angeles County, CA

Work:
Shanghai Business Review May 2010 to May 2011
Researcher & Admin travel Magazine 2011 to Jan 2011
Admin yihua trade company - wenzhou Jul 2008 to Apr 2009
Sales
Education:
University of La Verne Jan 2015
MBA Wenzhou University Jun 2010
Bachelor's in biology
Skills:
Bilingual
Li Lin Photo 35

Li Lin - St. Louis, MO

Work:
Washington University School of Medicine 2011 to 2012
Research Assistant Maternal and Children Health Hospital - Chaoyang, CN 1999 to 2003
Pediatrician
Education:
Washington University School of Medicine Aug 2012
M.S. in Biostatistics Peking Union Medical College Jul 1999
Master of Science in Epidemiology
Skills:
UNIX, SAS, R, Biostatistical, Bioinformatic, Genitic,

Publications & IP owners

Us Patents

Test Apparatus And Method Of Measuring Mar Resistance Of Film Or Coating

US Patent:
6520004, Feb 18, 2003
Filed:
Aug 3, 2000
Appl. No.:
09/601664
Inventors:
Li Lin - Wallingford PA
Assignee:
E. I. du Pont de Nemours and Company - Wilmington DE
International Classification:
G01N 346
US Classification:
73 81, 73 7
Abstract:
This invention concerns a test apparatus and procedure used for quantitative and qualitative characterization of scratch and mar behavior of films or coatings, more particularly automotive coatings. The apparatus includes a micro-indentor that penetrates and scratches the coating to be characterized together with interrelated components for measuring the force applied, the length and depth of the indentor penetration, the geometry of the disturbed coating surface as well as a system for measuring, analyzing and comparing test results.

Mechanical Property Measurement Of Thin Films By Micro Plane-Strain Compression

US Patent:
7395722, Jul 8, 2008
Filed:
Nov 21, 2006
Appl. No.:
11/602522
Inventors:
Li Lin - Wallingford PA, US
Assignee:
E.I. du Pont de Nemours and Company - Wilmington DE
International Classification:
G01D 1/16
US Classification:
73789, 73790, 73791, 73795
Abstract:
This invention is directed to the measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width. This invention is further directed to the measurement of stress-strain relationships in thin films at controlled temperatures and at high strain rates above 100% per second.

Method For Measuring Sandability Of Coating And The Use Thereof

US Patent:
8434377, May 7, 2013
Filed:
Jun 30, 2008
Appl. No.:
12/663918
Inventors:
Li Lin - Wallingford PA, US
James Lamonte Adams - Glenside PA, US
Assignee:
U.S. Coatings IP Co. LLC - Wilmington DE
International Classification:
G01N 33/00
G01N 3/56
US Classification:
73866, 73 7
Abstract:
The present invention is directed to a method for measuring sandability of a coating or an article. This invention is particularly directed to a method for measuring sandability of a coating or an article quantitatively by measuring weight loss of said coating or article after being sanded. This invention is also directed to a system for measuring sandability of a coating or an article using said method.

Device For Producing Standardized Assay Areas On Organic Coatings

US Patent:
2013006, Mar 14, 2013
Filed:
Jun 29, 2010
Appl. No.:
13/698999
Inventors:
Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US
International Classification:
B23B 39/08
US Classification:
408 8
Abstract:
The present disclosure is directed to a device for producing standardized assay areas on conductive substrates coated with organic coating layers. The device can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

Portable Device For Producing Standardized Assay Areas On Organic Coatings

US Patent:
2013006, Mar 14, 2013
Filed:
Jun 29, 2010
Appl. No.:
13/699006
Inventors:
Li Lin - Wallingford PA, US
Shi Hua Zhang - Wilmington DE, US
Assignee:
E I DuPont De Nemours and Company - Wilmington DE
International Classification:
B23B 39/04
US Classification:
408 8
Abstract:
The present disclosure is directed to a portable device for producing standardized assay areas on conductive substrates coated with organic coating layers. The present disclosure is directed to a process for producing standardized assay areas using the portable device. The portable device and the process can be used to produce assay areas for corrosion evaluation tests at an accelerated rate. The portable device and the process are particularly useful for producing standardized assay areas on large or immobile structures or objects.

Process For Producing Standardized Assay Areas On Organic Coatings

US Patent:
2013006, Mar 14, 2013
Filed:
Jun 29, 2010
Appl. No.:
13/699002
Inventors:
Shi Hua Zhang - Wilmington DE, US
Li Lin - Wallingford PA, US
Assignee:
E I Du Pont de Nemours and Company - Wilmington DE
International Classification:
B23B 47/28
US Classification:
408 1 R
Abstract:
The present disclosure is directed to a process for producing standardized assay areas on conductive substrates coated with organic coating layers. The process can be used to produce standardized assay areas for corrosion evaluation tests at an accelerated rate.

Film Testing

US Patent:
5517860, May 21, 1996
Filed:
Feb 3, 1995
Appl. No.:
8/382815
Inventors:
Li Lin - Wallingford PA
Melvin H. Johnson - Chadds Ford PA
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G01D 116
US Classification:
73789
Abstract:
Measurement of stress-strain relationships in thin films using substantially flat, parallel test surfaces with minimal width.

Method, System And Apparatus For Capacitive Sensing

US Patent:
2015014, May 28, 2015
Filed:
Nov 26, 2013
Appl. No.:
14/090333
Inventors:
Li LIN - WIlmington DE, US
International Classification:
G01B 7/14
G01R 27/26
US Classification:
324662
Abstract:
A system for obtaining incremental and absolute displacement measurements using systems of electrodes that interact to form variable capacitors and systems that facilitate implementation of the method along with exemplary embodiments of these systems. The capacitors created by the disclosed method have known physical properties and corresponding known mathematical relationships. These laws are exploited in such a way by our method as to overcome inadequacies in existing systems and create superior systems. These superior systems improve upon the existing art by including economically and reliably made sensors based on the area varying principle which eliminate dead zone issues and increase accuracy through a reduction of the influence of gap variations on capacitive systems through the use of compensatory geometrical arrangements of multiple capacitive systems.

Isbn (Books And Publications)

Wei Ji Yu Zhuan Ji: Wto Shi Ye Zhong De Zhongguo Gao Deng Jiao Yu

Author:
Li Lin
ISBN #:
7561523211

Possible Relatives

David Lin  De D Lin  Deanna M Lin  Damien Lin  Deborah Lin  Dan K Lin  Debra L Lin  Li Jun  Li Y Meng  Li L Lee 

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