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Mark A Beiley, 581161 Dustin Ln, Chandler, AZ 85226

Mark Beiley Phones & Addresses

1161 Dustin Ln, Chandler, AZ 85226    480-7050129   

Parks, AZ   

Phoenix, AZ   

Burlington, VT   

Coronado, AZ   

Mountain View, CA   

1161 N Dustin Ln, Chandler, AZ 85226    623-3635941   

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Mark A Beiley

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Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Skills

Semiconductors • CMOS • .NET

Industries

Computer Software

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Mark Beiley resumes & CV records

Resumes

Mark Beiley Photo 5

Mark Beiley

Location:
Phoenix, Arizona Area
Industry:
Computer Software
Skills:
Semiconductors, CMOS, .NET

Publications & IP owners

Us Patents

Method And Apparatus To Produce A Random Bit Sequence

US Patent:
6362695, Mar 26, 2002
Filed:
Dec 21, 1999
Appl. No.:
09/468478
Inventors:
Mark A. Beiley - Chandler AZ
James E. Breisch - Chandler AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03B 2900
US Classification:
331 78
Abstract:
A circuit includes a first oscillator having transistors to produce a first signal with random variations resulting from device channel resistance of the transistors.

High Speed Readout Architecture For Analog Storage Arrays

US Patent:
6366320, Apr 2, 2002
Filed:
Dec 8, 1997
Appl. No.:
08/987131
Inventors:
Rajendran Nair - Chandler AZ
Mark A. Beiley - Chandler AZ
Morteza Afghahi - Tempe AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H04N 5335
US Classification:
348300, 348308
Abstract:
A semiconductor circuit having an analog storage array, a sense amplifier array in which each sense amp cell generates a differential signal pair in response to receiving first and second signals from the storage array. The circuit also includes an analog multiplexer through which a selected differential signal pair is driven into a signal processing pipe. In another embodiment, the sense amp cells each include an operational amplifier (opamp) pair configured as unity-gain closed loop amplifiers for driving the differential signal pair through the analog multiplexer. To improve settling time, the opamps are designed to provide an underdamped response while loaded with the analog transmission path through the analog mux. In yet another embodiment, each sense amp cell is activated one clock cycle before it is read. This allows speedy readout while transitioning from one cell to the next.

Reduced Leakage Trench Isolation

US Patent:
6410359, Jun 25, 2002
Filed:
Mar 26, 2001
Appl. No.:
09/817639
Inventors:
Kevin M. Connolly - Chandler AZ
Jung S. Kang - Chandler AZ
Berni W. Landau - Beaverton OR
James E. Breisch - Chandler AZ
Akira Kakizawa - Phoenix AZ
Mark A. Beiley - Chandler AZ
Cory E. Weber - Beaverton OR
Shaofeng Yu - Lake Oswego OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 2100
US Classification:
438 48
Abstract:
Leakage current may be reduced in trench isolated semiconductor devices by providing a buffer between the trench isolation and an active area. For example, with a trench isolated photodiode, a buffer of opposite conductivity type may be provided between the trench and the diffusion that forms the p-n junction of the photodiode.

Method And Apparatus For Self-Calibration And Fixed-Pattern Noise Removal In Imager Integrated Circuits

US Patent:
6433822, Aug 13, 2002
Filed:
Mar 31, 1998
Appl. No.:
09/052749
Inventors:
Lawrence T. Clark - Phoenix AZ
Mark A. Beiley - Chandler AZ
Eric J. Hoffman - Chandler AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H04N 5217
US Classification:
348241, 348308
Abstract:
An architecture for self-calibration and fixed-pattern noise removal in imager chips. The column-to-column fixed pattern noise and/or pixel-to-pixel fixed pattern noise is determined through a self-calibration operation. During operation of the imager chip, when a value of a pixel is read, the read value is compensated with the fixed-pattern noise corresponding to either the column fixed pattern noise corresponding to the column having the pixel from which the value was read or to the pixel fixed pattern noise corresponding to the pixel from which the value was read.

Imaging System Having A Sensor Array Reset Noise Reduction Mechanism

US Patent:
6438276, Aug 20, 2002
Filed:
Sep 11, 2000
Appl. No.:
09/659159
Inventors:
Jon M. Dhuse - Chandler AZ
Kevin M. Connolly - Chandler AZ
Mark A. Beiley - Chandler AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06K 920
US Classification:
382312
Abstract:
What is disclosed is an apparatus for reducing row reset noise in photodiode based complementary metal oxide (CMOS) sensors. The apparatus uses at least one reference pixel for each row of pixels in a sensor array. Also, a reset noise elimination unit is provided to adjust the values received from the pixels in a particular row by an adjustment value determined from the reset values received from the reference pixels. Additionally, a method of using the apparatus is disclosed. The method has a step of providing a first reset signal to a row of pixels including the reference pixels. The method also reads out a first set of values from this row after integration. The method continues with providing a second reset signal to the row and a second set of values is read from the row. An adjustment value is calculated from the difference of the values which are read out from the reference pixels.

Method And Apparatus For Increasing Retention Time In Image Sensors Having An Electronic Shutter

US Patent:
6522357, Feb 18, 2003
Filed:
Sep 30, 1997
Appl. No.:
08/939808
Inventors:
Mark A. Beiley - Chandler AZ
Eric J. Hoffman - Chandler AZ
Lawrence T. Clark - Phoenix AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H04N 314
US Classification:
348296, 348308, 348310, 2502081
Abstract:
In a pixel having an electronic shutter, a method of increasing the retention time of the electronic shutter is disclosed. A reset signal is employed to drive a diode node to a predetermined voltage immediately after integration is completed. A sample signal is employed to control a pass gate. The sample signal includes a state where the sample signal is a negative voltage.

Multi-Frequency Power Delivery System

US Patent:
6806569, Oct 19, 2004
Filed:
Sep 28, 2001
Appl. No.:
09/964811
Inventors:
James E. Breisch - Chandler AZ
Mark A. Beiley - Chandler AZ
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 2334
US Classification:
257728, 257691, 257723, 257727
Abstract:
A mechanism is provided for delivering power to an on-die component (such as a buffer circuit). This may include a package unit having a low frequency delivery path and a high frequency delivery path and a die having the on-die component and a capacitive device each coupled in parallel between a first node and a second node. The die may further include a low frequency reception path and a high frequency reception path. The low frequency reception path may couple to the low frequency delivery path on the package unit and to the first node. The high frequency reception path may couple to the high frequency delivery path on the package unit and to the first node. The high frequency reception path may include a damping resistor.

Method And Apparatus For Employing A Light Shield To Modulate Pixel Color Responsivity

US Patent:
6933168, Aug 23, 2005
Filed:
Mar 9, 2001
Appl. No.:
09/802464
Inventors:
Edward J. Bawolek - Chandler AZ, US
Lawrence T. Clark - Phoenix AZ, US
Mark A. Beiley - Chandler AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L021/00
US Classification:
438 70, 438 69, 257434, 257435, 257440
Abstract:
A method and apparatus for employing a light shield to modulate pixel color responsivity. The improved pixel includes a substrate having a photodiode with a light receiving area. A color filter array material of a first color is disposed above the substrate. The pixel has a first relative responsivity. A light shield is disposed above the substrate to modulate the pixel color responsivity. The light shield forms an aperture whose area is substantially equal to the light receiving area adjusted by a reduction factor. The reduction factor is the result of an arithmetic operation between the first relative responsivity and a second relative responsivity, associated with a second pixel of a second color.

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