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Michael J Andres, 7618797 Harbor Dr, Garrison, MN 56450

Known as:
Mike J Andres
Related to:
Jack A Armstrong 25 Robert A Armstrong

Michael Andres Phones & Addresses

18797 Harbor Dr, Garrison, MN 56450   

Sturgeon Lake, MN   

1801 86Th St, Minneapolis, MN 55449    763-7846528   

Blaine, MN   

Oak Island, NC   

1801 86Th Ln NE, Minneapolis, MN 55449   

Work

Position: Sales Occupations

Education

Degree: High school graduate or higher
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Michael Andres resumes & CV records

Resumes

Michael Andres Photo 39

Senior Project Manager Bei Kfw

Position:
Senior Project Manager at KfW
Location:
Frankfurt am Main und Umgebung, Deutschland
Industry:
Banking
Work:
KfW - Frankfurt
Senior Project Manager KfW German financial cooperation - Georgia, Armenia, Azerbaijan Aug 2008 - Aug 2011
Director Sector Coordination Energy / Transport KfW - Frankfurt und Umgebung, Deutschland Aug 2008 - Aug 2011
Senior Risk Manager KfW IPEX Bank - Frankfurt Sep 2000 - Apr 2006
Senior Project Manager
Education:
DVFA, ACIIA 2005 - 2005
Certified International Investment Analyst (CIIA) Universities of Rotterdam, Gent, Linköping, Stockholm 1999 - 2000
Master-Degree in Law and Economics (EMLE) Humboldt-Universität zu Berlin 1993 - 1999
Diploma, Economics
Languages:
Englisch
Russisch
Michael Andres Photo 40

Michael Andres

Michael Andres Photo 41

Michael Andres

Skills:
Microsoft Excel
Michael Andres Photo 42

Michael Andres

Michael Andres Photo 43

Michael Andres

Location:
United States

Publications & IP owners

Us Patents

High Isolation Contactor With Test Pin And Housing For Integrated Circuit Testing

US Patent:
2020031, Oct 1, 2020
Filed:
Jun 15, 2020
Appl. No.:
16/901789
Inventors:
- Minneapolis MN, US
Michael Andres - Inver Grove Heights MN, US
International Classification:
H01R 12/70
H01R 12/82
G01R 1/04
G01R 31/28
H01R 13/24
Abstract:
A test socket () for a testing an integrated circuit () with controlled impedance while maintaining the structural integrity of the test pins (). The pin () can have a sidewall with a thick portion and a thinner portion () along the length of the pin. The pin can have projections () which provide a standoff from the slot (). The sidewalls themselves can have projections or lands () which extend into the slot and provide stability for the pin ().

High Isolation Contactor With Test Pin And Housing For Integrated Circuit Testing

US Patent:
2019009, Mar 28, 2019
Filed:
Sep 25, 2018
Appl. No.:
16/140853
Inventors:
- Minneapolis MN, US
Michael Andres - Inver Grove Heights MN, US
International Classification:
H01R 12/70
H01R 12/82
H01R 13/24
G01R 1/04
G01R 31/28
Abstract:
A test socket () for a testing an integrated circuit () with controlled impedance while maintaining the structural integrity of the test pins (). The pin () can have a sidewall with a thick portion and a thinner portion () along the length of the pin. The pin can have projections () which provide a standoff from the slot (). The sidewalls themselves can have projections or lands () which extend into the slot and provide stability for the pin ().

Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings

US Patent:
2019000, Jan 3, 2019
Filed:
Sep 4, 2018
Appl. No.:
16/120958
Inventors:
- Minneapolis MN, US
Dan Campion - Chanhassen MN, US
Michael Andres - Inver Grove Heights MN, US
Steve Rott - St. Cloud MN, US
Jeffrey Sherry - Savage MN, US
Brian Halvorson - St. Paul MN, US
Brian Eshult - St. Paul MN, US
International Classification:
G01R 1/073
G01R 31/28
G01R 3/00
G01R 1/067
Abstract:
The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.

Low Resistance Low Wear Test Pin For Test Contactor

US Patent:
2018006, Mar 8, 2018
Filed:
Oct 27, 2017
Appl. No.:
15/795829
Inventors:
- Minneapolis MN, US
Michael Andres - Inver Grove Heights MN, US
International Classification:
G01R 1/067
G01R 31/28
H05K 3/00
Abstract:
A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.

Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings

US Patent:
2017005, Mar 2, 2017
Filed:
Aug 24, 2016
Appl. No.:
15/245899
Inventors:
- Minneapolis MN, US
Dan Campion - Chanhassen MN, US
Michael Andres - Inver Grove Heights MN, US
Steve Rott - St. Cloud MN, US
Jeffrey Sherry - Savage MN, US
Brian Halvorson - St. Paul MN, US
Brian Eshult - St. Paul MN, US
International Classification:
G01R 1/073
G01R 31/28
Abstract:
The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.

Low Resistance Low Wear Test Pin For Test Contactor

US Patent:
2017002, Jan 26, 2017
Filed:
Feb 28, 2016
Appl. No.:
15/055611
Inventors:
- Minneapolis MN, US
Michael Andres - Inver Grove Heights MN, US
International Classification:
G01R 1/067
G01R 31/28
Abstract:
A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.

On-Center Electrically Conductive Pins For Integrated Testing

US Patent:
2016037, Dec 22, 2016
Filed:
Aug 29, 2016
Appl. No.:
15/249605
Inventors:
- Minneapolis MN, US
John Nelson - Brooklyn Park MN, US
Sarosh Patel - Sunnyvale CA, US
Michael Andres - Inver Grove Heights MN, US
International Classification:
G01R 1/04
G01R 1/073
G01R 31/28
Abstract:
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper () and lower () section and a hinge () in between which allow flex of both upper and lower contact () which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins by use of a modified hinge

Testing Apparatus And Method For Microcircuit And Wafer Level Ic Testing

US Patent:
2015001, Jan 15, 2015
Filed:
Jul 10, 2014
Appl. No.:
14/328460
Inventors:
- Minneapolis MN, US
Dan Campion - Chanhassen MN, US
Michael Andres - Inver Grove Heights MN, US
Steve Rott - St. Cloud MN, US
Jeffrey Sherry - Savage MN, US
Brian Halvorson - St. Paul MN, US
Brian Eshult - St. Paul MN, US
International Classification:
G01R 31/28
G01R 3/00
US Classification:
32475025, 29428, 29830
Abstract:
The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.

Possible Relatives

Cynthia A Andres  Dawn E Andres  Dean J Andres  Deborah Andres  Dana M Andres  Debra S Andres  Dennis J Andres  Michael C Last  Michael C Johnson  Michael F Stamps 

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