BackgroundCheck.run
Search For

Michael A Matusewic844 Shoal Creek Trl, Chesapeake, VA 23320

Known as:
Mike Matusewic

Michael Matusewic Phones & Addresses

844 Shoal Creek Trl, Chesapeake, VA 23320    715-5612944   

7277 Us Highway 2, Hurley, WI 54534   

5452 Island Lake Rd, Hurley, WI 54534   

5488 Island Lake Rd, Hurley, WI 54534   

2350 Valleyhigh Rd, Rochester, MN 55901   

Social networks

Michael A Matusewic

Linkedin

Get Report
Control this profile

Mentions for Michael A Matusewic

Michael Matusewic resumes & CV records

Resumes

Michael Matusewic Photo 12

Retired

Location:
Hurley, WI

Publications & IP owners

Us Patents

Silicon-On-Insulator Wafer Having Conductive Layer For Detection With Electrical Sensors

US Patent:
6238935, May 29, 2001
Filed:
Mar 1, 1999
Appl. No.:
9/260404
Inventors:
James L. Egley - Rochester MN
George M. Gut - Rochester MN
Daniel J. Koch - Rochester MN
Michael A. Matusewic - Rochester MN
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 2100
US Classification:
438 5
Abstract:
A method for fabricating a silicon-on-sapphire wafer for processing by silicon-wafer-processing equipment. A layer is deposited on a backside of a silicon-on-sapphire wafer, the layer having optical and electrical properties of silicon, wherein the silicon-on-sapphire wafer may be sensed by a sensor designed to sense a presence of a silicon wafer.

Method For Fabricating A Silicon-On-Sapphire Wafer

US Patent:
5877094, Mar 2, 1999
Filed:
Apr 7, 1994
Appl. No.:
8/224451
Inventors:
James L. Egley - Rochester MN
George M. Gut - Rochester MN
Daniel J. Koch - Rochester MN
Michael A. Matusewic - Rochester MN
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
H01L 2176
US Classification:
438763
Abstract:
A method for fabricating a silicon-on-sapphire wafer for processing by silicon-wafer-processing equipment. A layer is deposited on a backside of a silicon-on-sapphire wafer, the layer having optical and electrical properties of silicon, wherein the silicon-on-sapphire wafer may be sensed by a sensor designed to sense a presence of a silicon wafer.

Possible Relatives

Michael C Last  Michael C Johnson  Michael F Stamps  Michael Stan  Michael W Stanaland  Michael Stanard  Michael Stanbery  Michael Stanbro  Michael L Stanbrough  Michael R Stancel 

NOTICE: You may not use BackgroundCheck or the information it provides to make decisions about employment, credit, housing or any other purpose that would require Fair Credit Reporting Act (FCRA) compliance. BackgroundCheck is not a Consumer Reporting Agency (CRA) as defined by the FCRA and does not provide consumer reports.