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Michael S Stickney, 45Lihue, HI

Michael Stickney Phones & Addresses

Lihue, HI   

Honolulu, HI   

Los Angeles, CA   

Santa Monica, CA   

219 Willard St, Philadelphia, PA 19134    215-4236352    215-4265337   

Hopkinton, MA   

Vineyard Haven, MA   

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Michael S Stickney

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Work

Company: Pacific gas and electric company Feb 2012 Address: San Francisco Bay Area Position: Ecms engineer

Education

Degree: BS School / High School: University of Cincinnati 2004 to 2009 Specialities: Mechanical Engineering

Industries

Utilities

Mentions for Michael S Stickney

Michael Stickney resumes & CV records

Resumes

Michael Stickney Photo 41

Ecms Engineer With Pg&E

Position:
ECMS Engineer at Pacific Gas and Electric Company
Location:
San Francisco, California
Industry:
Utilities
Work:
Pacific Gas and Electric Company - San Francisco Bay Area since Feb 2012
ECMS Engineer
Duke Energy - Charlotte, North Carolina Area Jun 2009 - Feb 2012
Thermal Performance Engineer
Duke Energy Mar 2006 - Aug 2008
Engineering Co-op
Education:
University of Cincinnati 2004 - 2009
BS, Mechanical Engineering
Saint Ignatius High School 2000 - 2004

Publications & IP owners

Us Patents

Automated Evaluation Of Painted Surface Quality

US Patent:
5208766, May 4, 1993
Filed:
Nov 13, 1990
Appl. No.:
7/611597
Inventors:
David B. Chang - Tustin CA
Michael E. Stickney - El Toro CA
Assignee:
Hughes Aircraft Company - Los Angeles CA
International Classification:
G01N 2155
G06F 1520
US Classification:
364552
Abstract:
Human aesthetic evaluation of a finished painted surface, such as an automotive body, is automatically simulated by analyzing a distorted reflected test pattern from the finished surface. Fourier power spectra of the distorted test pattern are generated to form a parameterization of the reflected distorted test pattern. A correlation is statistically made to reference Fourier power spectra, each of which has been associated with a specific human aesthetic evaluation, such as wetness, dullness, softness, brightness, and the like. The Fourier power spectra of the distorted reflected image are automatically generated through a digitized two dimensional pixel map, which are mapped into functions of the edge direction and edge intensity of the pixels. The functions are then Fourier transformed into Fourier power spectra and correlated with reference reflected patterns. Alternatively, the Fourier power spectrum of the distorted reflected pattern is optically generated by use of collimated coherent light in a Fourier transform lens.

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