Michelle L Martin, 45314 Winston Cir, Canton, GA 30114

2022029, Sep 15, 2022

Mar 15, 2021

17/202163

- San Jose CA, US
Alan D. BENNETT - Edinburgh, GB
Liam PARKER - Edinburgh, GB
Yuval SHOHET - Acton MA, US
Michelle MARTIN - Westford MA, US

G06F 3/06
G06F 11/10

The present disclosure generally relates to improving programming to data storage devices, such as solid state drives (SSDs). A first memory device has a first XOR element and a second memory device has a second XOR element. The ratio of the first XOR element to the capacity of the first memory device is substantially smaller than the ratio of the second XOR element to the capacity of the second memory device. A read verify operation to find program failures is executed on either a wordline to wordline basis, an erase block to erase block basis, or both a wordline to wordline basis and an erase block to erase block basis. Because the program failures are found and fixed prior to programming to the second memory device, the second XOR element may be decreased substantially.